246 related articles for article (PubMed ID: 18468184)
1. Cross-sectional STEM observation of nanoparticle-attached silicon wafer: specimen prepared by focused ion-beam.
Yonezawa T; Yamanoi Y; Nishihara H
J Nanosci Nanotechnol; 2008 Mar; 8(3):1518-22. PubMed ID: 18468184
[TBL] [Abstract][Full Text] [Related]
2. Detailed structural examinations of covalently immobilized gold nanoparticles onto hydrogen-terminated silicon surfaces.
Yamanoi Y; Shirahata N; Yonezawa T; Terasaki N; Yamamoto N; Matsui Y; Nishio K; Masuda H; Ikuhara Y; Nishihara H
Chemistry; 2005 Dec; 12(1):314-23. PubMed ID: 16208724
[TBL] [Abstract][Full Text] [Related]
3. Cross-sectional Specimen Preparation and Observation of a Plasma Sprayed Coating Using a Focused Ion Beam/Transmission Electron Microscopy System.
Yaguchi T; Kamino T; Sasaki M; Barbezat G; Urao R
Microsc Microanal; 2000 May; 6(3):218-223. PubMed ID: 10790490
[TBL] [Abstract][Full Text] [Related]
4. Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy.
Biskupek J; Kaiser U; Falk F
J Electron Microsc (Tokyo); 2008 Jun; 57(3):83-9. PubMed ID: 18504308
[TBL] [Abstract][Full Text] [Related]
5. Combining Ar ion milling with FIB lift-out techniques to prepare high quality site-specific TEM samples.
Huang Z
J Microsc; 2004 Sep; 215(Pt 3):219-23. PubMed ID: 15312185
[TBL] [Abstract][Full Text] [Related]
6. Control of the average spacing between aligned gold nanoparticles by varying the FIB dose.
Rezaee A; Aliganga AK; Pavelka LC; Mittler S
Phys Chem Chem Phys; 2010 Apr; 12(16):4104-11. PubMed ID: 20379501
[TBL] [Abstract][Full Text] [Related]
7. Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam.
Inkson BJ; Dehm G; Wagner T
J Microsc; 2004 Jun; 214(Pt 3):252-60. PubMed ID: 15157193
[TBL] [Abstract][Full Text] [Related]
8. Magnetic imaging of cyanide-bridged co-ordination nanoparticles grafted on FIB-patterned Si substrates.
Ghirri A; Candini A; Evangelisti M; Gazzadi GC; Volatron F; Fleury B; Catala L; David C; Mallah T; Affronte M
Small; 2008 Dec; 4(12):2240-6. PubMed ID: 19016497
[TBL] [Abstract][Full Text] [Related]
9. Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites.
Gasser P; Klotz UE; Khalid FA; Beffort O
Microsc Microanal; 2004 Apr; 10(2):311-6. PubMed ID: 15306057
[TBL] [Abstract][Full Text] [Related]
10. Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel.
Yaguchi T; Matsumoto H; Kamino T; Ishitani T; Urao R
Microsc Microanal; 2001 May; 7(3):287-291. PubMed ID: 12597819
[TBL] [Abstract][Full Text] [Related]
11. Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique.
Choi PP; Kwon YS; Kim JS; Al-Kassab T
J Electron Microsc (Tokyo); 2007 Apr; 56(2):43-9. PubMed ID: 17928320
[TBL] [Abstract][Full Text] [Related]
12. Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling.
Volkert CA; Busch S; Heiland B; Dehm G
J Microsc; 2004 Jun; 214(Pt 3):208-12. PubMed ID: 15157188
[TBL] [Abstract][Full Text] [Related]
13. Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders.
Choi PP; Al-Kassab T; Kwon YS; Kim JS; Kirchheim R
Microsc Microanal; 2007 Oct; 13(5):347-53. PubMed ID: 17900385
[TBL] [Abstract][Full Text] [Related]
14. FIB-induced damage in silicon.
Rubanov S; Munroe PR
J Microsc; 2004 Jun; 214(Pt 3):213-21. PubMed ID: 15157189
[TBL] [Abstract][Full Text] [Related]
15. The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics.
Stevens-Kalceff MA; Levick KJ
Microsc Res Tech; 2007 Mar; 70(3):195-204. PubMed ID: 17279517
[TBL] [Abstract][Full Text] [Related]
16. Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process.
Urbánek M; Uhlír V; Bábor P; Kolíbalová E; Hrncír T; Spousta J; Sikola T
Nanotechnology; 2010 Apr; 21(14):145304. PubMed ID: 20215654
[TBL] [Abstract][Full Text] [Related]
17. Cross-sectional sample preparation by focused ion beam: a review of ion-sample interaction.
Ishitani T; Yaguchi T
Microsc Res Tech; 1996 Nov; 35(4):320-33. PubMed ID: 8987026
[TBL] [Abstract][Full Text] [Related]
18. An angled nano-tunnel fabricated on poly(methyl methacrylate) by a focused ion beam.
Her EK; Chung HS; Moon MW; Oh KH
Nanotechnology; 2009 Jul; 20(28):285301. PubMed ID: 19546496
[TBL] [Abstract][Full Text] [Related]
19. Chemically bound gold nanoparticle arrays on silicon: assembly, properties and SERS study of protein interactions.
Kaminska A; Inya-Agha O; Forster RJ; Keyes TE
Phys Chem Chem Phys; 2008 Jul; 10(28):4172-80. PubMed ID: 18612522
[TBL] [Abstract][Full Text] [Related]
20. Electron and ion imaging of gland cells using the FIB/SEM system.
Drobne D; Milani M; Zrimec A; Leser V; Berden Zrimec M
J Microsc; 2005 Jul; 219(Pt 1):29-35. PubMed ID: 15998363
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
