320 related articles for article (PubMed ID: 18617330)
1. Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
D'Alfonso AJ; Cosgriff EC; Findlay SD; Behan G; Kirkland AI; Nellist PD; Allen LJ
Ultramicroscopy; 2008 Nov; 108(12):1567-78. PubMed ID: 18617330
[TBL] [Abstract][Full Text] [Related]
2. Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
Nellist PD; Cosgriff EC; Behan G; Kirkland AI
Microsc Microanal; 2008 Feb; 14(1):82-8. PubMed ID: 18096098
[TBL] [Abstract][Full Text] [Related]
3. Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
Cosgriff EC; D'Alfonso AJ; Allen LJ; Findlay SD; Kirkland AI; Nellist PD
Ultramicroscopy; 2008 Nov; 108(12):1558-66. PubMed ID: 18639381
[TBL] [Abstract][Full Text] [Related]
4. Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM.
Xin HL; Muller DA
J Electron Microsc (Tokyo); 2009 Jun; 58(3):157-65. PubMed ID: 19164489
[TBL] [Abstract][Full Text] [Related]
5. Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy.
Zhang X; Takeguchi M; Hashimoto A; Mitsuishi K; Wang P; Nellist PD; Kirkland AI; Tezuka M; Shimojo M
J Electron Microsc (Tokyo); 2012 Jun; 61(3):159-69. PubMed ID: 22460388
[TBL] [Abstract][Full Text] [Related]
6. Three-dimensional imaging in aberration-corrected electron microscopes.
Xin HL; Muller DA
Microsc Microanal; 2010 Aug; 16(4):445-55. PubMed ID: 20566002
[TBL] [Abstract][Full Text] [Related]
7. Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
Wang P; Behan G; Kirkland AI; Nellist PD; Cosgriff EC; D'Alfonso AJ; Morgan AJ; Allen LJ; Hashimoto A; Takeguchi M; Mitsuishi K; Shimojo M
Ultramicroscopy; 2011 Jun; 111(7):877-86. PubMed ID: 21093152
[TBL] [Abstract][Full Text] [Related]
8. Prospects for 3D, nanometer-resolution imaging by confocal STEM.
Einspahr JJ; Voyles PM
Ultramicroscopy; 2006; 106(11-12):1041-52. PubMed ID: 16916585
[TBL] [Abstract][Full Text] [Related]
9. Three-dimensional optical sectioning by scanning confocal electron microscopy with a stage-scanning system.
Hashimoto A; Shimojo M; Mitsuishi K; Takeguchi M
Microsc Microanal; 2010 Jun; 16(3):233-8. PubMed ID: 20350339
[TBL] [Abstract][Full Text] [Related]
10. Contrast in atomically resolved EF-SCEM imaging.
Wang P; D'Alfonso AJ; Hashimoto A; Morgan AJ; Takeguchi M; Mitsuishi K; Shimojo M; Kirkland AI; Allen LJ; Nellist PD
Ultramicroscopy; 2013 Nov; 134():185-92. PubMed ID: 23896032
[TBL] [Abstract][Full Text] [Related]
11. Improvement of depth resolution of ADF-SCEM by deconvolution: effects of electron energy loss and chromatic aberration on depth resolution.
Zhang X; Takeguchi M; Hashimoto A; Mitsuishi K; Tezuka M; Shimojo M
Microsc Microanal; 2012 Jun; 18(3):603-11. PubMed ID: 22494464
[TBL] [Abstract][Full Text] [Related]
12. Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy.
D'Alfonso AJ; Findlay SD; Oxley MP; Pennycook SJ; van Benthem K; Allen LJ
Ultramicroscopy; 2007 Dec; 108(1):17-28. PubMed ID: 17395376
[TBL] [Abstract][Full Text] [Related]
13. Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopy.
Mitsuishi K; Iakoubovskii K; Takeguchi M; Shimojo M; Hashimoto A; Furuya K
Ultramicroscopy; 2008 Aug; 108(9):981-8. PubMed ID: 18519159
[TBL] [Abstract][Full Text] [Related]
14. Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. point spread function analysis.
Mitsuishi K; Hashimoto A; Takeguchi M; Shimojo M; Ishizuka K
Ultramicroscopy; 2012 Jan; 112(1):53-60. PubMed ID: 22088508
[TBL] [Abstract][Full Text] [Related]
15. The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois.
Wen J; Mabon J; Lei C; Burdin S; Sammann E; Petrov I; Shah AB; Chobpattana V; Zhang J; Ran K; Zuo JM; Mishina S; Aoki T
Microsc Microanal; 2010 Apr; 16(2):183-93. PubMed ID: 20187990
[TBL] [Abstract][Full Text] [Related]
16. Sub-ångstrom resolution using aberration corrected electron optics.
Batson PE; Dellby N; Krivanek OL
Nature; 2002 Aug; 418(6898):617-20. PubMed ID: 12167855
[TBL] [Abstract][Full Text] [Related]
17. Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction.
Zheng CL; Etheridge J
Ultramicroscopy; 2013 Feb; 125():49-58. PubMed ID: 23274685
[TBL] [Abstract][Full Text] [Related]
18. Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction.
Lentzen M
Microsc Microanal; 2006 Jun; 12(3):191-205. PubMed ID: 17481356
[TBL] [Abstract][Full Text] [Related]
19. Seeing atoms with aberration-corrected sub-Angström electron microscopy.
O'Keefe MA
Ultramicroscopy; 2008 Feb; 108(3):196-209. PubMed ID: 18054170
[TBL] [Abstract][Full Text] [Related]
20. Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems.
Liu J
J Electron Microsc (Tokyo); 2005 Jun; 54(3):251-78. PubMed ID: 16123072
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]