These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
280 related articles for article (PubMed ID: 18681705)
1. An integrated approach to piezoactuator positioning in high-speed atomic force microscope imaging. Yan Y; Wu Y; Zou Q; Su C Rev Sci Instrum; 2008 Jul; 79(7):073704. PubMed ID: 18681705 [TBL] [Abstract][Full Text] [Related]
2. A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging. Wu Y; Shi J; Su C; Zou Q Rev Sci Instrum; 2009 Apr; 80(4):043709. PubMed ID: 19405668 [TBL] [Abstract][Full Text] [Related]
3. A control approach to high-speed probe-based nanofabrication. Yan Y; Zou Q; Lin Z Nanotechnology; 2009 Apr; 20(17):175301. PubMed ID: 19420589 [TBL] [Abstract][Full Text] [Related]
4. Control of tip-to-sample distance in atomic force microscopy: a dual-actuator tip-motion control scheme. Jeong Y; Jayanth GR; Menq CH Rev Sci Instrum; 2007 Sep; 78(9):093706. PubMed ID: 17902954 [TBL] [Abstract][Full Text] [Related]
5. Development, analysis and control of a high-speed laser-free atomic force microscope. Bashash S; Saeidpourazar R; Jalili N Rev Sci Instrum; 2010 Feb; 81(2):023707. PubMed ID: 20192502 [TBL] [Abstract][Full Text] [Related]
6. High-speed force load in force measurement in liquid using scanning probe microscope. Zhang Y; Zou Q Rev Sci Instrum; 2012 Jan; 83(1):013707. PubMed ID: 22299962 [TBL] [Abstract][Full Text] [Related]
7. Modeling scanning probe microscope lateral dynamics using the probe-surface interaction signal. Okorafor M; Clayton GM Rev Sci Instrum; 2011 Mar; 82(3):033707. PubMed ID: 21456751 [TBL] [Abstract][Full Text] [Related]
8. Iterative control approach to high-speed force-distance curve measurement using AFM: time-dependent response of PDMS example. Kim KS; Lin Z; Shrotriya P; Sundararajan S; Zou Q Ultramicroscopy; 2008 Aug; 108(9):911-20. PubMed ID: 18467033 [TBL] [Abstract][Full Text] [Related]
9. High-speed atomic force microscope imaging: adaptive multiloop mode. Ren J; Zou Q; Li B; Lin Z Phys Rev E Stat Nonlin Soft Matter Phys; 2014 Jul; 90(1):012405. PubMed ID: 25122313 [TBL] [Abstract][Full Text] [Related]
10. High-speed adaptive contact-mode atomic force microscopy imaging with near-minimum-force. Ren J; Zou Q Rev Sci Instrum; 2014 Jul; 85(7):073706. PubMed ID: 25085145 [TBL] [Abstract][Full Text] [Related]
11. Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning range. Zhou Y; Shang G; Cai W; Yao JE Rev Sci Instrum; 2010 May; 81(5):053708. PubMed ID: 20515146 [TBL] [Abstract][Full Text] [Related]
12. High-speed atomic force microscopy for large scan sizes using small cantilevers. Braunsmann C; Schäffer TE Nanotechnology; 2010 Jun; 21(22):225705. PubMed ID: 20453273 [TBL] [Abstract][Full Text] [Related]
13. Large-range high-speed dynamic-mode atomic force microscope imaging: adaptive tapping towards minimal force. Chen J; Zou Q Nanotechnology; 2023 Aug; 34(45):. PubMed ID: 37207634 [TBL] [Abstract][Full Text] [Related]
15. Research on three dimensional machining effects using atomic force microscope. Mao YT; Kuo KC; Tseng CE; Huang JY; Lai YC; Yen JY; Lee CK; Chuang WL Rev Sci Instrum; 2009 Jun; 80(6):065105. PubMed ID: 19566224 [TBL] [Abstract][Full Text] [Related]
17. Quantitative scanning probe microscope topographies by charge linearization of the vertical actuator. Fleming AJ Rev Sci Instrum; 2010 Oct; 81(10):103701. PubMed ID: 21034092 [TBL] [Abstract][Full Text] [Related]
18. Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy. Han C; Chung CC Rev Sci Instrum; 2011 May; 82(5):053709. PubMed ID: 21639509 [TBL] [Abstract][Full Text] [Related]
19. Adaptive-scanning, near-minimum-deformation atomic force microscope imaging of soft sample in liquid: Live mammalian cell example. Ren J; Zou Q Ultramicroscopy; 2018 Mar; 186():150-157. PubMed ID: 29335224 [TBL] [Abstract][Full Text] [Related]
20. High-resolution noncontact atomic force microscopy. Pérez R; García R; Schwarz U Nanotechnology; 2009 Jul; 20(26):260201. PubMed ID: 19531843 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]