These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

120 related articles for article (PubMed ID: 18830313)

  • 1. Estimation of the thickness and the optical parameters of several stacked thin films using optimization.
    Andrade R; Birgin EG; Chambouleyron I; Martínez JM; Ventura SD
    Appl Opt; 2008 Oct; 47(28):5208-20. PubMed ID: 18830313
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Analysis of thickness influence on refractive index and absorption coefficient of zinc selenide thin films.
    Georgescu G; Petris A
    Opt Express; 2019 Nov; 27(24):34803-34823. PubMed ID: 31878662
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Derivation of optical constants of metals from thin-film measurements at oblique incidence.
    Nestell JE; Christy RW
    Appl Opt; 1972 Mar; 11(3):643-51. PubMed ID: 20111561
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Determination of the optical constants (n and k) of inhomogeneous thin films with linear index profiles.
    Al-Kuhaili MF; Khawaja EE; Durrani SM
    Appl Opt; 2006 Jul; 45(19):4591-7. PubMed ID: 16799670
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Computational method for determining n and k for a thin film from the measured reflectance, transmittance, and film thickness.
    Bennett JM; Booty MJ
    Appl Opt; 1966 Jan; 5(1):41-3. PubMed ID: 20048783
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Refractive indices of reactive magnetooptical thin films.
    Challener WA; Grove SL
    Appl Opt; 1990 Jul; 29(20):3040-5. PubMed ID: 20567373
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Determination of the fundamental absorption and optical bandgap of dielectric thin films from single optical transmittance measurements.
    Tejada A; Montañez L; Torres C; Llontop P; Flores L; De Zela F; Winnacker A; Guerra JA
    Appl Opt; 2019 Dec; 58(35):9585-9594. PubMed ID: 31873557
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Determination of optical parameters and thickness of weakly absorbing thin films from reflectance and transmittance spectra.
    Kutavichus VP; Filippov VV; Huzouski VH
    Appl Opt; 2006 Jul; 45(19):4547-53. PubMed ID: 16799663
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Correlation between optical path modulations and transmittance spectra of a-Si:H thin films.
    Akaoğlu B; Atílgan S; Katírcíoğlu B
    Appl Opt; 2000 Apr; 39(10):1611-6. PubMed ID: 18345059
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Determination of the refractive index and thickness of a thin film embedded in a given stratified medium.
    Chabrier G; Goudonnet JP; Vernier P
    Appl Opt; 1989 Jul; 28(14):2907-10. PubMed ID: 20555620
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Structural, morphological and optical properties of ZnSe quantum dot thin films.
    Zedan IT; Azab AA; El-Menyawy EM
    Spectrochim Acta A Mol Biomol Spectrosc; 2016 Feb; 154():171-176. PubMed ID: 26523684
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Closed equation for the normal incidence reflectance of thin films on absorbing substrates.
    Vargas WE; Castro D
    Appl Opt; 2007 Feb; 46(4):502-5. PubMed ID: 17230242
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Optical measurement of the refractive index, layer thickness, and volume changes of thin films.
    Holtslag AH; Scholte PM
    Appl Opt; 1989 Dec; 28(23):5095-104. PubMed ID: 20556006
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements.
    Peng C; Liang R; Erwin JK; Bletscher W; Nagata K; Mansuripur M
    Appl Opt; 2001 Oct; 40(28):5088-99. PubMed ID: 18364789
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Optical characterization of dielectric and semiconductor thin films by use of transmission data.
    Cisneros JI
    Appl Opt; 1998 Aug; 37(22):5262-70. PubMed ID: 18286005
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Exploitation of multiple incidences spectrometric measurements for thin film reverse engineering.
    Gao L; Lemarchand F; Lequime M
    Opt Express; 2012 Jul; 20(14):15734-51. PubMed ID: 22772265
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Simultaneous determination of thickness and optical constants of polymer thin film by analyzing transmittance.
    Jung C; Rhee BK
    Appl Opt; 2002 Jul; 41(19):3861-5. PubMed ID: 12099593
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Thickness dispersion of surface plasmon of Ag nano-thin films: determination by ellipsometry iterated with transmittance method.
    Gong J; Dai R; Wang Z; Zhang Z
    Sci Rep; 2015 Mar; 5():9279. PubMed ID: 25797217
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Optical constants of thin silicon films near the silicon L(2,3) absorption edge.
    Seely JF; Hunter WR; Rife JC; Kowalski MP
    Appl Opt; 1992 Dec; 31(34):7367-70. PubMed ID: 20802608
    [TBL] [Abstract][Full Text] [Related]  

  • 20. [Determination of optical parameters in thin films by transmittance spectra].
    Wang K; Jia HZ; Xia GZ
    Guang Pu Xue Yu Guang Pu Fen Xi; 2008 Nov; 28(11):2713-6. PubMed ID: 19271525
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.