These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

195 related articles for article (PubMed ID: 19044420)

  • 1. Advanced interferometric profile measurements through refractive media.
    Koev ST; Ghodssi R
    Rev Sci Instrum; 2008 Sep; 79(9):093702. PubMed ID: 19044420
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Separation algorithm for a 2D refractive index distribution and thickness profile of a phase object by laser diode-based multiwavelength interferometry.
    Lee K; Ryu SY; Kwak YK; Kim S; Lee YW
    Rev Sci Instrum; 2009 May; 80(5):053114. PubMed ID: 19485499
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Prism-pair interferometry by homodyne interferometers with a common light source for high-accuracy measurement of the absolute refractive index of glasses.
    Hori Y; Hirai A; Minoshima K
    Appl Opt; 2011 Mar; 50(8):1190-6. PubMed ID: 21394191
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Measurement of the absorption of concentrated dyes and their use for quantitative imaging of surface topography.
    Model MA; Khitrin AK; Blank JL
    J Microsc; 2008 Jul; 231(Pt 1):156-67. PubMed ID: 18638199
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Evaluation of reflection interference contrast microscope images of living cells.
    Beck K; Bereiter-Hahn J
    Microsc Acta; 1981 Mar; 84(2):153-78. PubMed ID: 7231204
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Determination of local refractive index variations in thin films by heterodyne interferometric scanning near-field optical microscopy.
    Diziain S; Merolla JM; Spajer M; Benvenuti G; Dabirian A; Kuzminykh Y; Hoffmann P; Bernal MP
    Rev Sci Instrum; 2009 Sep; 80(9):093706. PubMed ID: 19791943
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Surface and thickness measurement of a transparent film using wavelength scanning interferometry.
    Gao F; Muhamedsalih H; Jiang X
    Opt Express; 2012 Sep; 20(19):21450-6. PubMed ID: 23037266
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Focusing Effects in Interferometric Analysis of Graded-index Optical Fibers.
    Stone J; Burrus CA
    Appl Opt; 1975 Jan; 14(1):151-5. PubMed ID: 20134845
    [TBL] [Abstract][Full Text] [Related]  

  • 9. High-precision diode-laser-based temperature measurement for air refractive index compensation.
    Hieta T; Merimaa M; Vainio M; Seppä J; Lassila A
    Appl Opt; 2011 Nov; 50(31):5990-8. PubMed ID: 22086025
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry.
    Okada K; Sakuta H; Ose T; Tsujiuchi J
    Appl Opt; 1990 Aug; 29(22):3280-5. PubMed ID: 20567410
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Optical refractometry based on Fresnel diffraction from a phase wedge.
    Tavassoly MT; Saber A
    Opt Lett; 2010 Nov; 35(21):3679-81. PubMed ID: 21042389
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Measurement of two dimensional refractive index profiles of channel waveguides using an interferometric technique.
    Oven R
    Appl Opt; 2009 Oct; 48(30):5704-12. PubMed ID: 19844304
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Thickness and refractive index measurements using multiple beam interference fringes (FECO).
    Tadmor R; Chen N; Israelachvili JN
    J Colloid Interface Sci; 2003 Aug; 264(2):548-53. PubMed ID: 16256677
    [TBL] [Abstract][Full Text] [Related]  

  • 14. An exact surface-integral approach for accurate interferometric microscopy of single nanoparticles.
    Little DJ; Hawkins SC; Kane DM
    Opt Express; 2015 Mar; 23(5):6228-38. PubMed ID: 25836844
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Interference enhancement in spectral domain interferometric measurements on transparent plate.
    Zhang K; Tao L; Cheng W; Liu J; Chen Z
    Appl Opt; 2014 Sep; 53(26):5906-11. PubMed ID: 25321670
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Combining multiple-subaperture and two-wavelength techniques to extend the measurement limits of an optical surface profiler.
    Cochran ER; Creath K
    Appl Opt; 1988 May; 27(10):1960-6. PubMed ID: 20531690
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Continuously recording refractive index spectrograph for transparent and opaque insulators and semiconductors.
    Enke K; Tolksdorf W
    Rev Sci Instrum; 1978 Dec; 49(12):1625. PubMed ID: 18699018
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Fizeau interferometry for measuring refractive index and thickness of nearly transparent films.
    Buckman AB; Kuo C
    Appl Opt; 1978 Nov; 17(22):3636-40. PubMed ID: 20204044
    [TBL] [Abstract][Full Text] [Related]  

  • 19. High precision refractometry based on Fresnel diffraction from phase plates.
    Tavassoly MT; Naraghi RR; Nahal A; Hassani K
    Opt Lett; 2012 May; 37(9):1493-5. PubMed ID: 22555715
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Rotation angle measurement based on white-light interferometry with a standard optical flat.
    Yun HG; Kim SH; Jeong HS; Kim KH
    Appl Opt; 2012 Feb; 51(6):720-5. PubMed ID: 22358161
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 10.