365 related articles for article (PubMed ID: 19191438)
1. Low-temperature and high magnetic field dynamic scanning capacitance microscope.
Baumgartner A; Suddards ME; Mellor CJ
Rev Sci Instrum; 2009 Jan; 80(1):013704. PubMed ID: 19191438
[TBL] [Abstract][Full Text] [Related]
2. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy.
Albers BJ; Liebmann M; Schwendemann TC; Baykara MZ; Heyde M; Salmeron M; Altman EI; Schwarz UD
Rev Sci Instrum; 2008 Mar; 79(3):033704. PubMed ID: 18377012
[TBL] [Abstract][Full Text] [Related]
3. A diamond-based scanning probe spin sensor operating at low temperature in ultra-high vacuum.
Schaefer-Nolte E; Reinhard F; Ternes M; Wrachtrup J; Kern K
Rev Sci Instrum; 2014 Jan; 85(1):013701. PubMed ID: 24517769
[TBL] [Abstract][Full Text] [Related]
4. A near-field scanning microwave microscope based on a superconducting resonator for low power measurements.
de Graaf SE; Danilov AV; Adamyan A; Kubatkin SE
Rev Sci Instrum; 2013 Feb; 84(2):023706. PubMed ID: 23464217
[TBL] [Abstract][Full Text] [Related]
5. Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy.
Akiyama T; de Rooij NF; Staufer U; Detterbeck M; Braendlin D; Waldmeier S; Scheidiger M
Rev Sci Instrum; 2010 Jun; 81(6):063706. PubMed ID: 20590245
[TBL] [Abstract][Full Text] [Related]
6. Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography.
Xu M; Fujita D; Onishi K
Rev Sci Instrum; 2009 Apr; 80(4):043703. PubMed ID: 19405662
[TBL] [Abstract][Full Text] [Related]
7. High-resolution noncontact atomic force microscopy.
Pérez R; García R; Schwarz U
Nanotechnology; 2009 Jul; 20(26):260201. PubMed ID: 19531843
[TBL] [Abstract][Full Text] [Related]
8. Detecting the magnetic response of iron oxide capped organosilane nanostructures using magnetic sample modulation and atomic force microscopy.
Li JR; Lewandowski BR; Xu S; Garno JC
Anal Chem; 2009 Jun; 81(12):4792-802. PubMed ID: 19453164
[TBL] [Abstract][Full Text] [Related]
9. Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator.
An T; Nishio T; Eguchi T; Ono M; Nomura A; Akiyama K; Hasegawa Y
Rev Sci Instrum; 2008 Mar; 79(3):033703. PubMed ID: 18377011
[TBL] [Abstract][Full Text] [Related]
10. Calibrated nanoscale capacitance measurements using a scanning microwave microscope.
Huber HP; Moertelmaier M; Wallis TM; Chiang CJ; Hochleitner M; Imtiaz A; Oh YJ; Schilcher K; Dieudonne M; Smoliner J; Hinterdorfer P; Rosner SJ; Tanbakuchi H; Kabos P; Kienberger F
Rev Sci Instrum; 2010 Nov; 81(11):113701. PubMed ID: 21133472
[TBL] [Abstract][Full Text] [Related]
11. Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force.
Lin SM
Ultramicroscopy; 2007; 107(2-3):245-53. PubMed ID: 16982149
[TBL] [Abstract][Full Text] [Related]
12. Vibration amplitude of a tip-loaded quartz tuning fork during shear force microscopy scanning.
Sandoz P; Friedt JM; Carry E
Rev Sci Instrum; 2008 Aug; 79(8):086102. PubMed ID: 19044383
[TBL] [Abstract][Full Text] [Related]
13. Quantitative current measurements using scanning magnetoresistance microscopy.
Takezaki T; Sueoka K
Ultramicroscopy; 2008 Aug; 108(9):970-4. PubMed ID: 18599218
[TBL] [Abstract][Full Text] [Related]
14. Angled long tip to tuning fork probes for atomic force microscopy in various environments.
Higuchi S; Kuramochi H; Kubo O; Masuda S; Shingaya Y; Aono M; Nakayama T
Rev Sci Instrum; 2011 Apr; 82(4):043701. PubMed ID: 21529007
[TBL] [Abstract][Full Text] [Related]
15. Invited review article: A 10 mK scanning probe microscopy facility.
Song YJ; Otte AF; Shvarts V; Zhao Z; Kuk Y; Blankenship SR; Band A; Hess FM; Stroscio JA
Rev Sci Instrum; 2010 Dec; 81(12):121101. PubMed ID: 21198007
[TBL] [Abstract][Full Text] [Related]
16. Contact mechanics and tip shape in AFM-based nanomechanical measurements.
Kopycinska-Müller M; Geiss RH; Hurley DC
Ultramicroscopy; 2006 Apr; 106(6):466-74. PubMed ID: 16448755
[TBL] [Abstract][Full Text] [Related]
17. Oscillation-induced static deflection in scanning force microscopy.
Heim LO; Johannsmann D
Rev Sci Instrum; 2007 Jan; 78(1):013902. PubMed ID: 17503928
[TBL] [Abstract][Full Text] [Related]
18. Development of eddy current microscopy for high resolution electrical conductivity imaging using atomic force microscopy.
Nalladega V; Sathish S; Jata KV; Blodgett MP
Rev Sci Instrum; 2008 Jul; 79(7):073705. PubMed ID: 18681706
[TBL] [Abstract][Full Text] [Related]
19. The qPlus sensor, a powerful core for the atomic force microscope.
Giessibl FJ
Rev Sci Instrum; 2019 Jan; 90(1):011101. PubMed ID: 30709191
[TBL] [Abstract][Full Text] [Related]
20. A low-temperature high resolution scanning tunneling microscope with a three-dimensional magnetic vector field operating in ultrahigh vacuum.
Mashoff T; Pratzer M; Morgenstern M
Rev Sci Instrum; 2009 May; 80(5):053702. PubMed ID: 19485511
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]