These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
13. Application of atomic force microscopy to the study of natural and model soil particles. Cheng S; Bryant R; Doerr SH; Rhodri Williams P; Wright CJ J Microsc; 2008 Sep; 231(3):384-94. PubMed ID: 18754993 [TBL] [Abstract][Full Text] [Related]
14. Simple methods for the direct assembly, functionalization, and patterning of acid-terminated monolayers on Si111. Perring M; Dutta S; Arafat S; Mitchell M; Kenis PJ; Bowden NB Langmuir; 2005 Nov; 21(23):10537-44. PubMed ID: 16262318 [TBL] [Abstract][Full Text] [Related]
15. Electrochemical functionalization of carbon surfaces by aromatic azide or alkyne molecules: a versatile platform for click chemistry. Evrard D; Lambert F; Policar C; Balland V; Limoges B Chemistry; 2008; 14(30):9286-91. PubMed ID: 18780382 [TBL] [Abstract][Full Text] [Related]
16. Nanografting of alkanethiols by tapping mode atomic force microscopy. Liang J; Scoles G Langmuir; 2007 May; 23(11):6142-7. PubMed ID: 17455963 [TBL] [Abstract][Full Text] [Related]
17. Catalytic probe lithography: catalyst-functionalized scanning probes as nanopens for nanofabrication on self-assembled monolayers. Péter M; Li XM; Huskens J; Reinhoudt DN J Am Chem Soc; 2004 Sep; 126(37):11684-90. PubMed ID: 15366916 [TBL] [Abstract][Full Text] [Related]
18. Photochemical covalent attachment of alkene-derived monolayers onto hydroxyl-terminated silica. ter Maat J; Regeling R; Yang M; Mullings MN; Bent SF; Zuilhof H Langmuir; 2009 Oct; 25(19):11592-7. PubMed ID: 19583192 [TBL] [Abstract][Full Text] [Related]
19. Measurement of polyamide and polystyrene adhesion with coated-tip atomic force microscopy. Thio BJ; Meredith JC J Colloid Interface Sci; 2007 Oct; 314(1):52-62. PubMed ID: 17583720 [TBL] [Abstract][Full Text] [Related]
20. Sub-10-nm patterning of oligo(ethylene glycol) monolayers on silicon surfaces via local oxidation using a conductive atomic force microscope. Qin G; Cai C Nanotechnology; 2009 Sep; 20(35):355306. PubMed ID: 19671957 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]