These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

514 related articles for article (PubMed ID: 19405662)

  • 1. Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography.
    Xu M; Fujita D; Onishi K
    Rev Sci Instrum; 2009 Apr; 80(4):043703. PubMed ID: 19405662
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Tip characterization method using multi-feature characterizer for CD-AFM.
    Orji NG; Itoh H; Wang C; Dixson RG; Walecki PS; Schmidt SW; Irmer B
    Ultramicroscopy; 2016 Mar; 162():25-34. PubMed ID: 26720439
    [TBL] [Abstract][Full Text] [Related]  

  • 3. High-resolution noncontact atomic force microscopy.
    Pérez R; García R; Schwarz U
    Nanotechnology; 2009 Jul; 20(26):260201. PubMed ID: 19531843
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Using defined structures on very thin foils for characterizing AFM tips.
    Machleidt T; Franke KH; Romanus H; Cimalla V; Niebelschütz M; Spiess L; Ambacher O
    Ultramicroscopy; 2007 Oct; 107(10-11):1086-90. PubMed ID: 17587498
    [TBL] [Abstract][Full Text] [Related]  

  • 5. A simple method for AFM tip characterization by polystyrene spheres.
    Zeng ZG; Zhu GD; Guo Z; Zhang L; Yan XJ; Du QG; Liu R
    Ultramicroscopy; 2008 Aug; 108(9):975-80. PubMed ID: 18514419
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Structure and stability of semiconductor tip apexes for atomic force microscopy.
    Pou P; Ghasemi SA; Jelinek P; Lenosky T; Goedecker S; Perez R
    Nanotechnology; 2009 Jul; 20(26):264015. PubMed ID: 19509446
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Different interactions between the two sides of purple membrane with atomic force microscope tip.
    Zhong S; Li H; Chen XY; Cao EH; Jin G; Hu KS
    Langmuir; 2007 Apr; 23(8):4486-93. PubMed ID: 17358085
    [TBL] [Abstract][Full Text] [Related]  

  • 8. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study.
    Campbellová A; Ondráček M; Pou P; Pérez R; Klapetek P; Jelínek P
    Nanotechnology; 2011 Jul; 22(29):295710. PubMed ID: 21685559
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy.
    Han C; Chung CC
    Rev Sci Instrum; 2011 May; 82(5):053709. PubMed ID: 21639509
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Blind estimation of general tip shape in AFM imaging.
    Tian F; Qian X; Villarrubia JS
    Ultramicroscopy; 2008 Dec; 109(1):44-53. PubMed ID: 18835101
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Characterizing atomic force microscopy tip shape in use.
    Wang C; Itoh H; Sun J; Hu J; Shen D; Ichimura S
    J Nanosci Nanotechnol; 2009 Feb; 9(2):803-8. PubMed ID: 19441396
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes.
    Dobson PS; Weaver JM; Holder MN; Unwin PR; Macpherson JV
    Anal Chem; 2005 Jan; 77(2):424-34. PubMed ID: 15649037
    [TBL] [Abstract][Full Text] [Related]  

  • 13. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface.
    Naitoh Y; Kinoshita Y; Jun Li Y; Kageshima M; Sugawara Y
    Nanotechnology; 2009 Jul; 20(26):264011. PubMed ID: 19509444
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Low-temperature and high magnetic field dynamic scanning capacitance microscope.
    Baumgartner A; Suddards ME; Mellor CJ
    Rev Sci Instrum; 2009 Jan; 80(1):013704. PubMed ID: 19191438
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Improving accuracy of sample surface topography by atomic force microscopy.
    Xu M; Fujita D; Onishi K; Miyazawa K
    J Nanosci Nanotechnol; 2009 Oct; 9(10):6003-7. PubMed ID: 19908487
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Method for characterizing nanoscale wear of atomic force microscope tips.
    Liu J; Notbohm JK; Carpick RW; Turner KT
    ACS Nano; 2010 Jul; 4(7):3763-72. PubMed ID: 20575565
    [TBL] [Abstract][Full Text] [Related]  

  • 17. An integrated instrumental setup for the combination of atomic force microscopy with optical spectroscopy.
    Owen RJ; Heyes CD; Knebel D; Röcker C; Nienhaus GU
    Biopolymers; 2006 Jul; 82(4):410-4. PubMed ID: 16302196
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Contact mechanics and tip shape in AFM-based nanomechanical measurements.
    Kopycinska-Müller M; Geiss RH; Hurley DC
    Ultramicroscopy; 2006 Apr; 106(6):466-74. PubMed ID: 16448755
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Atomic force microscopy (AFM).
    Trache A; Meininger GA
    Curr Protoc Microbiol; 2008 Feb; Chapter 2():Unit 2C.2. PubMed ID: 18770536
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Assessing the structure and function of single biomolecules with scanning transmission electron and atomic force microscopes.
    Müller SA; Müller DJ; Engel A
    Micron; 2011 Feb; 42(2):186-95. PubMed ID: 21087869
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 26.