These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
168 related articles for article (PubMed ID: 19417434)
1. An in situ investigation of electromigration in Cu nanowires. Huang Q; Lilley CM; Divan R Nanotechnology; 2009 Feb; 20(7):075706. PubMed ID: 19417434 [TBL] [Abstract][Full Text] [Related]
2. Preferred diffusion paths for copper electromigration by in situ transmission electron microscopy. Oh YH; Kim SI; Kim M; Lee SY; Kim YW Ultramicroscopy; 2017 Oct; 181():160-164. PubMed ID: 28578299 [TBL] [Abstract][Full Text] [Related]
3. Electromigration and morphological changes in Ag nanostructures. Chatterjee A; Bai T; Edler F; Tegenkamp C; Weide-Zaage K; Pfnür H J Phys Condens Matter; 2018 Feb; 30(8):084002. PubMed ID: 29336347 [TBL] [Abstract][Full Text] [Related]
4. Probing the local temperature by in situ electron microscopy on a heated Si(3)N(4) membrane. Reguer A; Bedu F; Nitsche S; Chaudanson D; Detailleur B; Dallaporta H Ultramicroscopy; 2009 Dec; 110(1):61-6. PubMed ID: 19828252 [TBL] [Abstract][Full Text] [Related]
5. Electromigration and potentiometry measurements of single-crystalline Ag nanowires under UHV conditions. Kaspers MR; Bernhart AM; Meyer Zu Heringdorf FJ; Dumpich G; Möller R J Phys Condens Matter; 2009 Jul; 21(26):265601. PubMed ID: 21828474 [TBL] [Abstract][Full Text] [Related]
6. In situ visualisation of electromigration in Pt nanobridges at elevated temperatures. Kozlova T; Zandbergen HW Ultramicroscopy; 2015 Nov; 158():74-80. PubMed ID: 26202895 [TBL] [Abstract][Full Text] [Related]
7. The electromigration effect revisited: non-uniform local tensile stress-driven diffusion. Lin SK; Liu YC; Chiu SJ; Liu YT; Lee HY Sci Rep; 2017 Jun; 7(1):3082. PubMed ID: 28596543 [TBL] [Abstract][Full Text] [Related]
8. In situ transmission electron microscopy imaging of electromigration in platinum nanowires. Rudneva M; Gao B; Prins F; Xu Q; van der Zant HS; Zandbergen HW Microsc Microanal; 2013 Aug; 19 Suppl 5():43-8. PubMed ID: 23920172 [TBL] [Abstract][Full Text] [Related]
9. Raman and photoluminescence properties of highly Cu doped ZnO nanowires fabricated by vapor-liquid-solid process. Zhu H; Iqbal J; Xu H; Yu D J Chem Phys; 2008 Sep; 129(12):124713. PubMed ID: 19045054 [TBL] [Abstract][Full Text] [Related]
10. Gold-catalyzed low-temperature growth of cadmium oxide nanowires by vapor transport. Kuo TJ; Huang MH J Phys Chem B; 2006 Jul; 110(28):13717-21. PubMed ID: 16836315 [TBL] [Abstract][Full Text] [Related]
11. In situ TEM and STEM studies of reversible electromigration in thin palladium-platinum bridges. Kozlova T; Rudneva M; Zandbergen HW Nanotechnology; 2013 Dec; 24(50):505708. PubMed ID: 24270041 [TBL] [Abstract][Full Text] [Related]
12. True nanocable assemblies with insulating BN nanotube sheaths and conducting Cu nanowire cores. Zhou Z; Zhao J; Chen Z; Gao X; Lu JP; von Ragué Schleyer P; Yang CK J Phys Chem B; 2006 Feb; 110(6):2529-32. PubMed ID: 16471851 [TBL] [Abstract][Full Text] [Related]
14. The In-Situ Observation of Grain Rotation and Microstructure Evolution Induced by Electromigration in Sn-3.0Ag-0.5Cu Solder Joints. Fu X; Liu M; Xu K; Chen S; Shi Y; Fu Z; Huang Y; Chen H; Yao R Materials (Basel); 2020 Dec; 13(23):. PubMed ID: 33276575 [TBL] [Abstract][Full Text] [Related]
15. Current imaging and electromigration-induced splitting of GaN nanowires as revealed by conductive atomic force microscopy. Li C; Bando Y; Golberg D ACS Nano; 2010 Apr; 4(4):2422-8. PubMed ID: 20235513 [TBL] [Abstract][Full Text] [Related]
16. Verification of unzipping models of electromigration in gold nanocontacts by in situ high-resolution transmission electron microscopy. Kizuka T; Kodama S; Matsuda T Nanotechnology; 2010 Dec; 21(49):495706. PubMed ID: 21079293 [TBL] [Abstract][Full Text] [Related]
17. Aqueous electromigration of single-walled carbon nanotubes and co-electromigration with copper ions. Raja PMV; Esquenazi GL; Wright KD; Gowenlock CE; Brinson BE; Alexander S; Jones DR; Gangoli VS; Barron AR Nanoscale; 2018 Nov; 10(41):19628-19637. PubMed ID: 30325388 [TBL] [Abstract][Full Text] [Related]
18. Self-assembled nanostructures on VSe2 surfaces induced by Cu deposition. Spiecker E; Hollensteiner S; Jäger W; Haselier H; Schroeder H Microsc Microanal; 2005 Oct; 11(5):456-71. PubMed ID: 17481326 [TBL] [Abstract][Full Text] [Related]
19. In-situ transmission electron microscopy observation of electromigration in Au thin wires. Murakami Y; Arita M; Hamada K; Takahashi Y J Nanosci Nanotechnol; 2012 Nov; 12(11):8741-5. PubMed ID: 23421277 [TBL] [Abstract][Full Text] [Related]
20. The Effect of Grain Orientation of β-Sn on Copper Pillar Solder Joints during Electromigration. Xu K; Fu X; Wang X; Fu Z; Yang X; Chen S; Shi Y; Huang Y; Chen H Materials (Basel); 2021 Dec; 15(1):. PubMed ID: 35009255 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]