These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

128 related articles for article (PubMed ID: 19516529)

  • 21. Coherent and incoherent effects on the imaging and scattering process in transmission electron microscopy and off-axis electron holography.
    Koch W; Lubk A; Grossmann F; Lichte H; Schmidt R
    Ultramicroscopy; 2010 Oct; 110(11):1397-403. PubMed ID: 20673613
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM.
    Xin HL; Muller DA
    J Electron Microsc (Tokyo); 2009 Jun; 58(3):157-65. PubMed ID: 19164489
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Optimal experimental design of STEM measurement of atom column positions.
    Van Aert S; den Dekker AJ; Van Dyck D; van den Bos A
    Ultramicroscopy; 2002 Apr; 90(4):273-89. PubMed ID: 11942646
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography.
    Béché A; Rouvière JL; Barnes JP; Cooper D
    Ultramicroscopy; 2013 Aug; 131():10-23. PubMed ID: 23673283
    [TBL] [Abstract][Full Text] [Related]  

  • 25. 3D reconstruction of atomic structures from high angle annular dark field (HAADF) STEM images and its application on zeolite silicalite-1.
    Willhammar T; Mayoral A; Zou X
    Dalton Trans; 2014 Oct; 43(37):14158-63. PubMed ID: 25137058
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline material.
    Lazar S; Etheridge J; Dwyer C; Freitag B; Botton GA
    Acta Crystallogr A; 2011 Sep; 67(Pt 5):487-90. PubMed ID: 21844654
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.
    De Backer A; Martinez GT; MacArthur KE; Jones L; Béché A; Nellist PD; Van Aert S
    Ultramicroscopy; 2015 Apr; 151():56-61. PubMed ID: 25511931
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
    Nellist PD; Cosgriff EC; Behan G; Kirkland AI
    Microsc Microanal; 2008 Feb; 14(1):82-8. PubMed ID: 18096098
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems.
    Lu K; Sourty E; Loos J
    J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S39-44. PubMed ID: 20601352
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Single atomic layer detection of Ca and defect characterization of Bi-2212 with EELS in HA-ADF STEM.
    Zhu Y; Niewczas M; Couillard M; Botton GA
    Ultramicroscopy; 2006; 106(11-12):1076-81. PubMed ID: 16872745
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Coherent total internal reflection dark-field microscopy: label-free imaging beyond the diffraction limit.
    von Olshausen P; Rohrbach A
    Opt Lett; 2013 Oct; 38(20):4066-9. PubMed ID: 24321924
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Three-dimensional optical sectioning by scanning confocal electron microscopy with a stage-scanning system.
    Hashimoto A; Shimojo M; Mitsuishi K; Takeguchi M
    Microsc Microanal; 2010 Jun; 16(3):233-8. PubMed ID: 20350339
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Quantitative annular dark-field imaging of single-layer graphene.
    Yamashita S; Koshiya S; Ishizuka K; Kimoto K
    Microscopy (Oxf); 2015 Apr; 64(2):143-50. PubMed ID: 25637649
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?
    den Dekker AJ; Gonnissen J; De Backer A; Sijbers J; Van Aert S
    Ultramicroscopy; 2013 Nov; 134():34-43. PubMed ID: 23820594
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Subtleties in ADF imaging and spatially resolved EELS: A case study of low-angle twist boundaries in SrTiO3.
    Fitting L; Thiel S; Schmehl A; Mannhart J; Muller DA
    Ultramicroscopy; 2006; 106(11-12):1053-61. PubMed ID: 16867311
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Improved wavefront correction for coherent image restoration.
    Zelenka C; Koch R
    Opt Express; 2017 Aug; 25(16):18797-18816. PubMed ID: 29041073
    [TBL] [Abstract][Full Text] [Related]  

  • 37. High-angle annular dark field scanning transmission electron microscopy on carbon-based functional polymer systems.
    Sourty E; van Bavel S; Lu K; Guerra R; Bar G; Loos J
    Microsc Microanal; 2009 Jun; 15(3):251-8. PubMed ID: 19460182
    [TBL] [Abstract][Full Text] [Related]  

  • 38. On Compton scattering as a source of background in coherent diffraction imaging experiments.
    Bikondoa O; Carbone D
    J Synchrotron Radiat; 2021 Mar; 28(Pt 2):538-549. PubMed ID: 33650567
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Annular dark field transmission electron microscopy for protein structure determination.
    Koeck PJB
    Ultramicroscopy; 2016 Feb; 161():98-104. PubMed ID: 26656466
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
    E H; Macarthur KE; Pennycook TJ; Okunishi E; D'Alfonso AJ; Lugg NR; Allen LJ; Nellist PD
    Ultramicroscopy; 2013 Oct; 133():109-19. PubMed ID: 23969066
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 7.