These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
4. Sensitivity analysis of thin-film thickness measurement by vertical scanning white-light interferometry. Dong JT; Lu RS Appl Opt; 2012 Aug; 51(23):5668-75. PubMed ID: 22885580 [TBL] [Abstract][Full Text] [Related]
5. Surface and thickness measurement of a transparent film using wavelength scanning interferometry. Gao F; Muhamedsalih H; Jiang X Opt Express; 2012 Sep; 20(19):21450-6. PubMed ID: 23037266 [TBL] [Abstract][Full Text] [Related]
6. Application of white-light scanning interferometer on transparent thin-film measurement. Li MC; Wan DS; Lee CC Appl Opt; 2012 Dec; 51(36):8579-86. PubMed ID: 23262597 [TBL] [Abstract][Full Text] [Related]
7. Dispersive white-light interferometry for absolute distance measurement with dielectric multilayer systems on the target. Schnell U; Dändliker R; Gray S Opt Lett; 1996 Apr; 21(7):528-30. PubMed ID: 19865461 [TBL] [Abstract][Full Text] [Related]
8. Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry. Kim SW; Kim GH Appl Opt; 1999 Oct; 38(28):5968-73. PubMed ID: 18324116 [TBL] [Abstract][Full Text] [Related]
9. Simultaneous film thickness and refractive index measurement using a constrained fitting method in a white light spectral interferometer. Yuan L; Guo T; Tang D; Liu H; Guo X Opt Express; 2022 Jan; 30(1):349-363. PubMed ID: 35201213 [TBL] [Abstract][Full Text] [Related]
10. Spectrally resolved white-light phase-shifting interference microscopy for thickness-profile measurements of transparent thin film layers on patterned substrates. Debnath SK; Kothiyal MP; Schmit J; Hariharan P Opt Express; 2006 May; 14(11):4662-7. PubMed ID: 19516621 [TBL] [Abstract][Full Text] [Related]
11. S-transform application in phase extraction of spectrally resolved interferometry measuring step height. Luo W; He Y; Tang Y; Cheng X Appl Opt; 2022 Jan; 61(3):737-743. PubMed ID: 35200778 [TBL] [Abstract][Full Text] [Related]
12. Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film. Hlubina P; Ciprian D; Lunácek J; Lesnák M Opt Express; 2006 Aug; 14(17):7678-85. PubMed ID: 19529136 [TBL] [Abstract][Full Text] [Related]
13. Methods To Determine the Silicone Oil Layer Thickness in Sprayed-On Siliconized Syringes. Loosli V; Germershaus O; Steinberg H; Dreher S; Grauschopf U; Funke S PDA J Pharm Sci Technol; 2018; 72(3):278-297. PubMed ID: 29343617 [TBL] [Abstract][Full Text] [Related]
14. High-speed Fizeau interferometry for film topography measurement during spray film interaction. Schumacher L; Seel K; Reddemann MA; Kneer R Rev Sci Instrum; 2018 Nov; 89(11):113703. PubMed ID: 30501274 [TBL] [Abstract][Full Text] [Related]
15. Spectrally resolved white-light interferometry for measurement of ocular dispersion. Hammer DX; Welch AJ; Noojin GD; Thomas RJ; Stolarski DJ; Rockwell BA J Opt Soc Am A Opt Image Sci Vis; 1999 Sep; 16(9):2092-102. PubMed ID: 10474890 [TBL] [Abstract][Full Text] [Related]
16. Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate. Debnath SK; Kim SW; Kothiyal MP; Hariharan P Appl Opt; 2010 Dec; 49(34):6624-9. PubMed ID: 21124540 [TBL] [Abstract][Full Text] [Related]
17. Fast measurement of the thickness and group refractive index distribution of solid plates by line-field dispersive interferometry. Zhang J; Xiong S; Zhang R; Zhou S; Jia X; Shi L; Liu B; Mi Q; Wu G Opt Express; 2022 Aug; 30(18):33274-33287. PubMed ID: 36242371 [TBL] [Abstract][Full Text] [Related]
18. Optimizing multiple beam interferometry in the surface forces apparatus: Novel optics, reflection mode modeling, metal layer thicknesses, birefringence, and rotation of anisotropic layers. Schwenzfeier KA; Erbe A; Bilotto P; Lengauer M; Merola C; Cheng HW; Mears LLE; Valtiner M Rev Sci Instrum; 2019 Apr; 90(4):043908. PubMed ID: 31043001 [TBL] [Abstract][Full Text] [Related]
19. Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser. Joo KN; Kim SW Opt Lett; 2007 Mar; 32(6):647-9. PubMed ID: 17308589 [TBL] [Abstract][Full Text] [Related]
20. Dispersion-model-free determination of optical constants: application to materials for organic thin film devices. Flämmich M; Danz N; Michaelis D; Bräuer A; Gather MC; Kremer JH; Meerholz K Appl Opt; 2009 Mar; 48(8):1507-13. PubMed ID: 19277083 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]