235 related articles for article (PubMed ID: 19636120)
1. A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy.
Das S; Sreeram PA; Raychaudhuri AK
Nanotechnology; 2007 Jan; 18(3):035501. PubMed ID: 19636120
[TBL] [Abstract][Full Text] [Related]
2. Probing the probe: AFM tip-profiling via nanotemplates to determine Hamaker constants from phase-distance curves.
Rodriguez RD; Lacaze E; Jupille J
Ultramicroscopy; 2012 Oct; 121():25-30. PubMed ID: 22922181
[TBL] [Abstract][Full Text] [Related]
3. A dynamic model of the jump-to phenomenon during AFM analysis.
Bowen J; Cheneler D
Langmuir; 2012 Dec; 28(50):17273-86. PubMed ID: 23157559
[TBL] [Abstract][Full Text] [Related]
4. Tuning the instability in static mode atomic force spectroscopy as obtained in an AFM by applying an electric field between the tip and the substrate.
Biswas S; Raychaudhuri AK; Sreeram PA; Dietzel D
Ultramicroscopy; 2012 Nov; 122():19-25. PubMed ID: 22960002
[TBL] [Abstract][Full Text] [Related]
5. Hamaker constants in integrated circuit metalization.
Eichenlaub S; Chan C; Beaudoin SP
J Colloid Interface Sci; 2002 Apr; 248(2):389-97. PubMed ID: 16290543
[TBL] [Abstract][Full Text] [Related]
6. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
Yeh MK; Tai NH; Chen BY
Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
[TBL] [Abstract][Full Text] [Related]
7. Superlubricity using repulsive van der Waals forces.
Feiler AA; Bergström L; Rutland MW
Langmuir; 2008 Mar; 24(6):2274-6. PubMed ID: 18278966
[TBL] [Abstract][Full Text] [Related]
8. Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy.
Wang F; Wang Y; Zhou F; Zhao X
Ultramicroscopy; 2010 May; 110(6):592-5. PubMed ID: 20202755
[TBL] [Abstract][Full Text] [Related]
9. An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact.
Tourek CJ; Sundararajan S
Rev Sci Instrum; 2010 Jul; 81(7):073711. PubMed ID: 20687735
[TBL] [Abstract][Full Text] [Related]
10. Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies.
Fukuma T; Onishi K; Kobayashi N; Matsuki A; Asakawa H
Nanotechnology; 2012 Apr; 23(13):135706. PubMed ID: 22421199
[TBL] [Abstract][Full Text] [Related]
11. Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers.
Slattery AD; Blanch AJ; Quinton JS; Gibson CT
Nanotechnology; 2013 Jan; 24(1):015710. PubMed ID: 23220746
[TBL] [Abstract][Full Text] [Related]
12. Electrostatic interaction forces in aqueous salt solutions of variable concentration and valency.
Ebeling D; van den Ende D; Mugele F
Nanotechnology; 2011 Jul; 22(30):305706. PubMed ID: 21719972
[TBL] [Abstract][Full Text] [Related]
13. The effect of intrinsic instability of cantilever on static mode atomic force spectroscopy.
Das S; Raychaudhuri AK; Sreeram PA; Dietzel D
Nanotechnology; 2010 Jan; 21(4):045706. PubMed ID: 20009210
[TBL] [Abstract][Full Text] [Related]
14. Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force.
Lin SM
Ultramicroscopy; 2007; 107(2-3):245-53. PubMed ID: 16982149
[TBL] [Abstract][Full Text] [Related]
15. Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition.
Kinoshita Y; Naitoh Y; Li YJ; Sugawara Y
Rev Sci Instrum; 2011 Nov; 82(11):113707. PubMed ID: 22128984
[TBL] [Abstract][Full Text] [Related]
16. A force-matching method for quantitative hardness measurements by atomic force microscopy with diamond-tipped sapphire cantilevers.
Sansoz F; Gang T
Ultramicroscopy; 2010 Dec; 111(1):11-9. PubMed ID: 21111262
[TBL] [Abstract][Full Text] [Related]
17. A method to quantitatively measure the elastic modulus of materials in nanometer scale using atomic force microscopy.
Tang B; Ngan AH; Pethica JB
Nanotechnology; 2008 Dec; 19(49):495713. PubMed ID: 21730693
[TBL] [Abstract][Full Text] [Related]
18. Dynamic spring constants for higher flexural modes of cantilever plates with applications to atomic force microscopy.
Hähner G
Ultramicroscopy; 2010 Jun; 110(7):801-6. PubMed ID: 20188476
[TBL] [Abstract][Full Text] [Related]
19. Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI.
Cumpson PJ; Hedley J
Nanotechnology; 2003 Dec; 14(12):1279-88. PubMed ID: 21444981
[TBL] [Abstract][Full Text] [Related]
20. Constant tip-surface distance with atomic force microscopy via quality factor feedback.
Fan L; Potter D; Sulchek T
Rev Sci Instrum; 2012 Feb; 83(2):023706. PubMed ID: 22380098
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
