These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

103 related articles for article (PubMed ID: 19687555)

  • 21. All-metal AFM probes fabricated from microstructurally tailored Cu-Hf thin films.
    Luber EJ; Olsen BC; Ophus C; Radmilovic V; Mitlin D
    Nanotechnology; 2009 Aug; 20(34):345703. PubMed ID: 19652276
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy.
    Schürmann G; Noell W; Staufer U; de Rooij NF; Eckert R; Freyland JM; Heinzelmann H
    Appl Opt; 2001 Oct; 40(28):5040-5. PubMed ID: 18364783
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Wear characteristics of diamond-coated atomic force microscope probe.
    Chung KH; Kim DE
    Ultramicroscopy; 2007 Dec; 108(1):1-10. PubMed ID: 17367934
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Thermochemical hole burning on a triethylammonium bis-7,7,8,8-tetracyanoquinodimethane charge-transfer complex using single-walled carbon nanotube scanning tunneling microscopy tips.
    Peng H; Chen Z; Tong L; Yu X; Ran C; Liu Z
    J Phys Chem B; 2005 Mar; 109(8):3526-30. PubMed ID: 16851389
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Quantitative electrostatic force microscopy with sharp silicon tips.
    Fumagalli L; Edwards MA; Gomila G
    Nanotechnology; 2014 Dec; 25(49):495701. PubMed ID: 25407683
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Batch Fabrication of Wear-Resistant and Conductive Probe with PtSi Tip.
    Liu M; Zhu Y; Zhao J; Wang L; Yang J; Yang F
    Micromachines (Basel); 2021 Oct; 12(11):. PubMed ID: 34832738
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Coaxial probes for scanning near-field microscopy.
    Leinhos T; Rudow O; Stopka M; Vollkopf A; Oesterschulze E
    J Microsc; 1999; 194(Pt 2-3):349-52. PubMed ID: 11388265
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Charge-based scanning probe readback of nanometer-scale ferroelectric domain patterns at megahertz rates.
    Forrester MG; Ahner JW; Bedillion MD; Bedoya C; Bolten DG; Chang KC; de Gersem G; Hu S; Johns EC; Nassirou M; Palmer J; Roelofs A; Siegert M; Tamaru S; Vaithyanathan V; Zavaliche F; Zhao T; Zhao Y
    Nanotechnology; 2009 Jun; 20(22):225501. PubMed ID: 19436094
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Fabrication of various tip-size AFM probes for evaluating single-molecular retraction force between actin and anti-actin.
    Okada T; Yamamoto Y; Sano M; Muramatsu H
    Ultramicroscopy; 2009 Sep; 109(10):1299-303. PubMed ID: 19560867
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Effect of tip shape on capacitance determination accuracy in scanning capacitance microscopy.
    Lányi S
    Ultramicroscopy; 2005 Jun; 103(3):221-8. PubMed ID: 15850709
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Nanodomain manipulation for ultrahigh density ferroelectric data storage.
    Cho Y; Hashimoto S; Odagawa N; Tanaka K; Hiranaga Y
    Nanotechnology; 2006 Apr; 17(7):S137-41. PubMed ID: 21727404
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy.
    Kim S; Kim J; Berg M; de Lozanne A
    Rev Sci Instrum; 2008 Oct; 79(10):103702. PubMed ID: 19044714
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Nanostar probes for tip-enhanced spectroscopy.
    Kim W; Kim N; Park JW; Kim ZH
    Nanoscale; 2016 Jan; 8(2):987-94. PubMed ID: 26662059
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Conductive nichrome probe tips: fabrication, characterization and application as nanotools.
    Peng Y; Cullis T; Möbus G; Xu X; Inkson B
    Nanotechnology; 2009 Sep; 20(39):395708. PubMed ID: 19724111
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Sharp-Tip Silver Nanowires Mounted on Cantilevers for High-Aspect-Ratio High-Resolution Imaging.
    Ma X; Zhu Y; Kim S; Liu Q; Byrley P; Wei Y; Zhang J; Jiang K; Fan S; Yan R; Liu M
    Nano Lett; 2016 Nov; 16(11):6896-6902. PubMed ID: 27739683
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Focused ion beam-nanomachined probes for improved electric force microscopy.
    Menozzi C; Carlo Gazzadi G; Alessandrini A; Facci P
    Ultramicroscopy; 2005 Oct; 104(3-4):220-5. PubMed ID: 15927397
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Small single-crystal silicon cantilevers formed by crystal facets for atomic force microscopy.
    Nakagawa K; Hashiguchi G; Kawakatsu H
    Rev Sci Instrum; 2009 Sep; 80(9):095104. PubMed ID: 19791961
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Intermittent contact scanning nonlinear dielectric microscopy.
    Hiranaga Y; Cho Y
    Rev Sci Instrum; 2010 Feb; 81(2):023705. PubMed ID: 20192500
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Multifunctional probe array for nano patterning and imaging.
    Wang X; Liu C
    Nano Lett; 2005 Oct; 5(10):1867-72. PubMed ID: 16218700
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Failure mechanisms of silicon-based atom-probe tips.
    Kölling S; Vandervorst W
    Ultramicroscopy; 2009 Apr; 109(5):486-91. PubMed ID: 19162397
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 6.