189 related articles for article (PubMed ID: 19794551)
21. Optical study of Mn-doped Bi4Ti3O,12 thin films by spectroscopic ellipsometry.
Hwang SY; Kim TJ; Yoon JJ; Cha YH; Kim YD; Seong TG; Kang LS; Nahm S
J Nanosci Nanotechnol; 2011 Jan; 11(1):884-8. PubMed ID: 21446567
[TBL] [Abstract][Full Text] [Related]
22. Optical constants and Drude analysis of sputtered zirconium nitride films.
Veszelei M; Andersson K; Ribbing CG; Järrendahl K; Arwin H
Appl Opt; 1994 Apr; 33(10):1993-2001. PubMed ID: 20885535
[TBL] [Abstract][Full Text] [Related]
23. A New Method for Determining the Optical Constants of Highly Transparent Solids.
Li X; Wang C; Zhao J; Liu L
Appl Spectrosc; 2017 Jan; 71(1):70-77. PubMed ID: 27371643
[TBL] [Abstract][Full Text] [Related]
24. Application of white-light scanning interferometer on transparent thin-film measurement.
Li MC; Wan DS; Lee CC
Appl Opt; 2012 Dec; 51(36):8579-86. PubMed ID: 23262597
[TBL] [Abstract][Full Text] [Related]
25. Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.
Azzam RM; Elshazly-Zaghloul M; Bashara NM
Appl Opt; 1975 Jul; 14(7):1652-63. PubMed ID: 20154886
[TBL] [Abstract][Full Text] [Related]
26. Two-dimensional thickness measurements based on internal reflection ellipsometry.
Otsuki S; Tamada K; Wakida S
Appl Opt; 2005 Mar; 44(8):1410-5. PubMed ID: 15796239
[TBL] [Abstract][Full Text] [Related]
27. Determination of the optical functions of transparent glasses by using spectroscopic ellipsometry.
Jellison GE; Sales BC
Appl Opt; 1991 Oct; 30(30):4310-5. PubMed ID: 20717201
[TBL] [Abstract][Full Text] [Related]
28. Metasurface array for single-shot spectroscopic ellipsometry.
Wen S; Xue X; Wang S; Ni Y; Sun L; Yang Y
Light Sci Appl; 2024 Apr; 13(1):88. PubMed ID: 38600108
[TBL] [Abstract][Full Text] [Related]
29. A simple approach to analyze layer-dependent optical properties of few-layer transition metal dichalcogenide thin films.
Alkabsh A; Samassekou H; Mazumdar D
Nanotechnology; 2019 Jan; 30(3):03LT02. PubMed ID: 30418937
[TBL] [Abstract][Full Text] [Related]
30. Determination of the optical constants (n and k) of inhomogeneous thin films with linear index profiles.
Al-Kuhaili MF; Khawaja EE; Durrani SM
Appl Opt; 2006 Jul; 45(19):4591-7. PubMed ID: 16799670
[TBL] [Abstract][Full Text] [Related]
31. Spectroscopic ellipsometry of slightly inhomogeneous nonabsorbing thin films with arbitrary refractive-index profiles: theoretical study.
Tikhonravov AV; Trubetskov MK; Krasilnikova AV
Appl Opt; 1998 Sep; 37(25):5902-11. PubMed ID: 18286084
[TBL] [Abstract][Full Text] [Related]
32. Spectroscopic ellipsometry of anisotropic materials: application to the optical constants of HgI2.
En Naciri A; Johann L; Kleim R; Sieskind M; Amann M
Appl Opt; 1999 Feb; 38(4):647-54. PubMed ID: 18305658
[TBL] [Abstract][Full Text] [Related]
33. Optical Properties of Thin Films on Transparent Surfaces by Ellipsometry; Internal Reflection for Film Covered Surfaces Near the Critical Angle.
Passaglia E; Stromberg RR
J Res Natl Bur Stand A Phys Chem; 1964; 68A(6):601-610. PubMed ID: 31834744
[TBL] [Abstract][Full Text] [Related]
34. Novel combined measurement system to characterize film structures by spectral interferometry and ellipsometry.
Yun YH; Joo KN
Opt Express; 2018 Dec; 26(26):34396-34411. PubMed ID: 30650862
[TBL] [Abstract][Full Text] [Related]
35. Dispersion-model-free determination of optical constants: application to materials for organic thin film devices.
Flämmich M; Danz N; Michaelis D; Bräuer A; Gather MC; Kremer JH; Meerholz K
Appl Opt; 2009 Mar; 48(8):1507-13. PubMed ID: 19277083
[TBL] [Abstract][Full Text] [Related]
36. Model-blind characterization of thin-film optical constants with momentum-resolved reflectometry.
DeCrescent RA; Brown SJ; Schlitz RA; Chabinyc ML; Schuller JA
Opt Express; 2016 Dec; 24(25):28842-28857. PubMed ID: 27958527
[TBL] [Abstract][Full Text] [Related]
37. Simultaneous determination of thickness and optical constants of polymer thin film by analyzing transmittance.
Jung C; Rhee BK
Appl Opt; 2002 Jul; 41(19):3861-5. PubMed ID: 12099593
[TBL] [Abstract][Full Text] [Related]
38. Measurement of the dielectric constant of thin films by terahertz time-domain spectroscopic ellipsometry.
Matsumoto N; Hosokura T; Nagashima T; Hangyo M
Opt Lett; 2011 Jan; 36(2):265-7. PubMed ID: 21263521
[TBL] [Abstract][Full Text] [Related]
39. Characterization of a multilayer highly reflecting mirror by spectroscopic phase-modulated ellipsometry.
Bhattacharyya D; Sahoo NK; Thakur S; Das NC
Appl Opt; 2001 Apr; 40(10):1707-14. PubMed ID: 18357168
[TBL] [Abstract][Full Text] [Related]
40. Correlation between optical path modulations and transmittance spectra of a-Si:H thin films.
Akaoğlu B; Atílgan S; Katírcíoğlu B
Appl Opt; 2000 Apr; 39(10):1611-6. PubMed ID: 18345059
[TBL] [Abstract][Full Text] [Related]
[Previous] [Next] [New Search]
