These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

41 related articles for article (PubMed ID: 19830942)

  • 1. Preliminary results from the first monochromated and aberration corrected 200-kV field-emission scanning transmission electron microscope.
    Walther T; Stegmann H
    Microsc Microanal; 2006 Dec; 12(6):498-505. PubMed ID: 19830942
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Progress toward an aberration-corrected low energy electron microscope for DNA sequencing and surface analysis.
    Mankos M; Shadman K; N'diaye AT; Schmid AK; Persson HH; Davis RW
    J Vac Sci Technol B Nanotechnol Microelectron; 2012 Nov; 30(6):6F402. PubMed ID: 23847748
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy.
    Ribet SM; Zeltmann SE; Bustillo KC; Dhall R; Denes P; Minor AM; Dos Reis R; Dravid VP; Ophus C
    Microsc Microanal; 2023 Dec; 29(6):1950-1960. PubMed ID: 37851063
    [TBL] [Abstract][Full Text] [Related]  

  • 4. A monochromatic, aberration-corrected, dual-beam low energy electron microscope.
    Mankos M; Shadman K
    Ultramicroscopy; 2013 Jul; 130():13-28. PubMed ID: 23582636
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Cost and Capability Compromises in STEM Instrumentation for Low-Voltage Imaging.
    Quigley F; McBean P; O'Donovan P; Peters JJP; Jones L
    Microsc Microanal; 2022 Mar; ():1-7. PubMed ID: 35354509
    [TBL] [Abstract][Full Text] [Related]  

  • 6. A Novel Monochromator with Offset Cylindrical Lenses and Its Application to a Low-Voltage Scanning Electron Microscope.
    Ogawa T; Yamazawa Y; Kawai S; Mouri A; Katane J; Park IY; Takai Y; Agemura T
    Microsc Microanal; 2022 Feb; ():1-13. PubMed ID: 35164889
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV.
    Sagawa R; Yasuhara A; Hashiguchi H; Naganuma T; Tanba S; Ishikawa T; Riedel T; Hartel P; Linck M; Uhlemann S; Müller H; Sawada H
    Ultramicroscopy; 2022 Mar; 233():113440. PubMed ID: 34920279
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Aberration Correction for Large-Angle Illumination Scanning Transmission Electron Microscopy by Using Iterative Electron Ptychography Algorithms.
    Ma Y; Shi J; Guzman R; Li A; Zhou W
    Microsc Microanal; 2024 Apr; 30(2):226-235. PubMed ID: 38578297
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials
    Tanaka N
    Sci Technol Adv Mater; 2008 Jan; 9(1):014111. PubMed ID: 27877937
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Nanofabrication by advanced electron microscopy using intense and focused beam
    Furuya K
    Sci Technol Adv Mater; 2008 Jan; 9(1):014110. PubMed ID: 27877936
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Chromatically Corrected Multicolor Multiphoton Microscopy.
    Blanc H; Kaddour G; David NB; Supatto W; Livet J; Beaurepaire E; Mahou P
    ACS Photonics; 2023 Dec; 10(12):4104-4111. PubMed ID: 38145164
    [TBL] [Abstract][Full Text] [Related]  

  • 12. A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron Microscope.
    Quigley F; Downing C; McGuinness C; Jones L
    Microsc Microanal; 2023 Sep; 29(5):1610-1617. PubMed ID: 37490647
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Mitigating challenges in aberration-corrected electron-beam lithography on electron-opaque substrates.
    Camino FE; Tiwale N; Hwang S; Du X; Yang JC
    Nanotechnology; 2023 Nov; 35(6):. PubMed ID: 37918028
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Material structure, properties, and dynamics through scanning transmission electron microscopy.
    Pennycook SJ; Li C; Li M; Tang C; Okunishi E; Varela M; Kim YM; Jang JH
    J Anal Sci Technol; 2018; 9(1):11. PubMed ID: 31258949
    [TBL] [Abstract][Full Text] [Related]  

  • 15. X-ray Spectrometry in the Era of Aberration-Corrected Electron Optical Beam Lines.
    Zaluzec NJ
    Microsc Microanal; 2022 May; ():1-7. PubMed ID: 35535554
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Faceting-roughening transition of a Cu grain boundary under electron-beam irradiation at 300 keV.
    Lee SB; Han HN
    Sci Rep; 2021 Jul; 11(1):15563. PubMed ID: 34330998
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy.
    Axelrod JJ; Petrov PN; Zhang JT; Remis J; Buijsse B; Glaeser RM; Mȕller H
    bioRxiv; 2023 Feb; ():. PubMed ID: 36824829
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy.
    Axelrod JJ; Petrov PN; Zhang JT; Remis J; Buijsse B; Glaeser RM; Mȕller H
    Ultramicroscopy; 2023 Jul; 249():113730. PubMed ID: 37011498
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Square condenser apertures for square cameras in low-dose transmission electron microscopy.
    Brown HG; Smith D; Wardle BC; Hanssen E
    Nat Methods; 2024 Apr; 21(4):566-568. PubMed ID: 38459386
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Measurement of Diffusion and Segregation in Semiconductor Quantum Dots and Quantum Wells by Transmission Electron Microscopy: A Guide.
    Walther T
    Nanomaterials (Basel); 2019 Jun; 9(6):. PubMed ID: 31181748
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 3.