These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

124 related articles for article (PubMed ID: 20020719)

  • 1. Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory study.
    Sjövall P; Rading D; Ray S; Yang L; Shard AG
    J Phys Chem B; 2010 Jan; 114(2):769-74. PubMed ID: 20020719
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.
    Shard AG; Havelund R; Seah MP; Spencer SJ; Gilmore IS; Winograd N; Mao D; Miyayama T; Niehuis E; Rading D; Moellers R
    Anal Chem; 2012 Sep; 84(18):7865-73. PubMed ID: 22897795
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.
    Shard AG; Green FM; Brewer PJ; Seah MP; Gilmore IS
    J Phys Chem B; 2008 Mar; 112(9):2596-605. PubMed ID: 18254619
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.
    Havelund R; Licciardello A; Bailey J; Tuccitto N; Sapuppo D; Gilmore IS; Sharp JS; Lee JL; Mouhib T; Delcorte A
    Anal Chem; 2013 May; 85(10):5064-70. PubMed ID: 23590425
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions.
    Lee JL; Ninomiya S; Matsuo J; Gilmore IS; Seah MP; Shard AG
    Anal Chem; 2010 Jan; 82(1):98-105. PubMed ID: 19957960
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Depth profiling of organic films with X-ray photoelectron spectroscopy using C60+ and Ar+ co-sputtering.
    Yu BY; Chen YY; Wang WB; Hsu MF; Tsai SP; Lin WC; Lin YC; Jou JH; Chu CW; Shyue JJ
    Anal Chem; 2008 May; 80(9):3412-5. PubMed ID: 18355087
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ions.
    Seah MP; Spencer SJ; Shard AG
    J Phys Chem B; 2013 Oct; 117(39):11885-92. PubMed ID: 24010582
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Cluster ion beam profiling of organics by secondary ion mass spectrometry--does sodium affect the molecular ion intensity at interfaces?
    Green FM; Gilmore IS; Seah MP
    Rapid Commun Mass Spectrom; 2008 Dec; 22(24):4178-82. PubMed ID: 19039819
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.
    Zappalà G; Motta V; Tuccitto N; Vitale S; Torrisi A; Licciardello A
    Rapid Commun Mass Spectrom; 2015 Dec; 29(23):2204-10. PubMed ID: 26522311
    [TBL] [Abstract][Full Text] [Related]  

  • 10. The role of the auxiliary atomic ion beam in C60(+)-Ar+ co-sputtering.
    Lin WC; Liu CP; Kuo CH; Chang HY; Chang CJ; Hsieh TH; Lee SH; You YW; Kao WL; Yen GJ; Huang CC; Shyue JJ
    Analyst; 2011 Mar; 136(5):941-6. PubMed ID: 21152650
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.
    Shard AG; Havelund R; Spencer SJ; Gilmore IS; Alexander MR; Angerer TB; Aoyagi S; Barnes JP; Benayad A; Bernasik A; Ceccone G; Counsell JD; Deeks C; Fletcher JS; Graham DJ; Heuser C; Lee TG; Marie C; Marzec MM; Mishra G; Rading D; Renault O; Scurr DJ; Shon HK; Spampinato V; Tian H; Wang F; Winograd N; Wu K; Wucher A; Zhou Y; Zhu Z; Cristaudo V; Poleunis C
    J Phys Chem B; 2015 Aug; 119(33):10784-97. PubMed ID: 26204428
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Effect of cosputtering and sample rotation on improving C60(+) depth profiling of materials.
    Liao HY; Tsai MH; Chang HY; You YW; Huang CC; Shyue JJ
    Anal Chem; 2012 Nov; 84(21):9318-23. PubMed ID: 23016993
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Quantification problems in depth profiling of pwr steels using Ar+ ion sputtering and XPS analysis.
    Ignatova VA; Van Den Berghe S; Van Dyck S; Popok VN
    Microsc Microanal; 2006 Oct; 12(5):432-7. PubMed ID: 16984670
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60(+)-Ar(+) cosputtering.
    Liao HY; Tsai MH; Kao WL; Kuo DY; Shyue JJ
    Anal Chim Acta; 2014 Dec; 852():129-36. PubMed ID: 25441889
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Simulation of sputter-induced roughness for depth profiling of thin film structures.
    Wöhner T; Ecke G; Rössler H; Hofmann S
    Anal Bioanal Chem; 1995 Oct; 353(3-4):447-9. PubMed ID: 15048516
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams.
    Mouhib T; Poleunis C; Wehbe N; Michels JJ; Galagan Y; Houssiau L; Bertrand P; Delcorte A
    Analyst; 2013 Nov; 138(22):6801-10. PubMed ID: 24058924
    [TBL] [Abstract][Full Text] [Related]  

  • 17. X-ray photoelectron spectrometry depth profiling of organic thin films using C60 sputtering.
    Chen YY; Yu BY; Wang WB; Hsu MF; Lin WC; Lin YC; Jou JH; Shyue JJ
    Anal Chem; 2008 Jan; 80(2):501-5. PubMed ID: 18081326
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.
    Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J
    Rapid Commun Mass Spectrom; 2009 Jun; 23(11):1601-6. PubMed ID: 19399762
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Molecular depth profiling with cluster ion beams.
    Cheng J; Wucher A; Winograd N
    J Phys Chem B; 2006 Apr; 110(16):8329-36. PubMed ID: 16623517
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Quantitative depth profiling in glow discharge spectroscopies - A new deconvolution technique to separate effects of an uneven erosion crater shape.
    Prässler F; Hoffmann V; Schumann J; Wetzig K
    Anal Bioanal Chem; 1996 Jul; 355(7-8):840-6. PubMed ID: 15045276
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.