230 related articles for article (PubMed ID: 20057851)
1. The rapid and precise determination of the optical thickness of thin coatings in a vacuum.
van Heel AC; van Vonno W
Appl Opt; 1967 May; 6(5):793-7. PubMed ID: 20057851
[TBL] [Abstract][Full Text] [Related]
2. Determination of (n,k) for absorbing thin films using reflectance measurements.
Siqueiros JM; Regalado LE; Machorro R
Appl Opt; 1988 Oct; 27(20):4260-4. PubMed ID: 20539554
[TBL] [Abstract][Full Text] [Related]
3. Optical factors in the photoemission of thin films.
Ramberg EG
Appl Opt; 1967 Dec; 6(12):2163-70. PubMed ID: 20062380
[TBL] [Abstract][Full Text] [Related]
4. Measurement of the refractive index and thickness for infrared optical films deposited on rough substrates.
Saito M; Nakamura S; Miyagi M
Appl Opt; 1992 Oct; 31(28):6139-44. PubMed ID: 20733820
[TBL] [Abstract][Full Text] [Related]
5. Measuring the refractive index and thickness of thin transparent films: method.
Daneu V; Sanchez A
Appl Opt; 1974 Jan; 13(1):122-8. PubMed ID: 20125932
[TBL] [Abstract][Full Text] [Related]
6. Determination of the optical constants (n, k) of thin dielectric films.
Khawaja EE; Bouamrane F
Appl Opt; 1993 Mar; 32(7):1168-72. PubMed ID: 20820248
[TBL] [Abstract][Full Text] [Related]
7. Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,R(m)) technique.
Hjortsberg A
Appl Opt; 1981 Apr; 20(7):1254-63. PubMed ID: 20309294
[TBL] [Abstract][Full Text] [Related]
8. Optical analysis of absorbing thin films: application to ternary chalcopyrite semiconductors.
Hernández-Rojas JL; Lucĺa ML; Mátil I; González-Díaz G; Santamaría J; Sánchez-Quesada F
Appl Opt; 1992 Apr; 31(10):1606-11. PubMed ID: 20720795
[TBL] [Abstract][Full Text] [Related]
9. Determination of 2-D thickness distributions of low absorbing thin films by new laser interferometry.
Mishima T; Kao KC
Appl Opt; 1982 Aug; 21(16):2894-6. PubMed ID: 20396145
[TBL] [Abstract][Full Text] [Related]
10. Derivation of optical constants of metals from thin-film measurements at oblique incidence.
Nestell JE; Christy RW
Appl Opt; 1972 Mar; 11(3):643-51. PubMed ID: 20111561
[TBL] [Abstract][Full Text] [Related]
11. Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements.
Cao J; Yanagihara M; Yamamoto M; Goto Y; Namioka T
Appl Opt; 1994 Apr; 33(10):2013-7. PubMed ID: 20885537
[TBL] [Abstract][Full Text] [Related]
12. Determination of the optical constants of MgF(2) and ZnS from spectrophotometric measurements and the classical oscillator method.
Siqueiros JM; Machorro R; Regalado LE
Appl Opt; 1988 Jun; 27(12):2549-53. PubMed ID: 20531790
[TBL] [Abstract][Full Text] [Related]
13. Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry.
Jellison GE; Boatner LA; Lowndes DH; McKee RA; Godbole M
Appl Opt; 1994 Sep; 33(25):6053-8. PubMed ID: 20936019
[TBL] [Abstract][Full Text] [Related]
14. Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials.
Chindaudom P; Vedam K
Appl Opt; 1994 May; 33(13):2664-71. PubMed ID: 20885622
[TBL] [Abstract][Full Text] [Related]
15. Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry.
Gustin KM
Appl Opt; 1987 Sep; 26(18):3796-802. PubMed ID: 20490143
[TBL] [Abstract][Full Text] [Related]
16. Influence of film thickness on the optical transmission through subwavelength single slits in metallic thin films.
Ferri FA; Rivera VA; Osorio SP; Silva OB; Zanatta AR; Borges BH; Weiner J; Marega E
Appl Opt; 2011 Nov; 50(31):G11-6. PubMed ID: 22086033
[TBL] [Abstract][Full Text] [Related]
17. Transmission ellipsometry on transparent unbacked or embedded thin films with application to soap films in air.
Azzam RM
Appl Opt; 1991 Jul; 30(19):2801-6. PubMed ID: 20700278
[TBL] [Abstract][Full Text] [Related]
18. Simultaneous determination of optical constants, thickness, and surface roughness of thin film from spectrophotometric measurements.
Guo C; Kong M; Gao W; Li B
Opt Lett; 2013 Jan; 38(1):40-2. PubMed ID: 23282831
[TBL] [Abstract][Full Text] [Related]
19. Optical methods for thickness measurements on thin metal films.
Pokrowsky P
Appl Opt; 1991 Aug; 30(22):3228-32. PubMed ID: 20706379
[TBL] [Abstract][Full Text] [Related]
20. Optical interference method for the approximate determination of refractive index and thickness of a transparent layer.
Goodman AM
Appl Opt; 1978 Sep; 17(17):2779-87. PubMed ID: 20203866
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
