109 related articles for article (PubMed ID: 20069686)
1. Atomic/molecular depth profiling of nanometric-metallized polymer thin films by secondary ion mass spectrometry.
Téllez H; Vadillo JM; Laserna JJ
Rapid Commun Mass Spectrom; 2010 Feb; 24(4):463-8. PubMed ID: 20069686
[TBL] [Abstract][Full Text] [Related]
2. Energy-resolved depth profiling of metal-polymer interfaces using dynamic quadrupole secondary ion mass spectrometry.
Téllez H; Vadillo JM; Laserna JJ
Rapid Commun Mass Spectrom; 2009 Aug; 23(15):2357-62. PubMed ID: 19575403
[TBL] [Abstract][Full Text] [Related]
3. Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry.
Wagner MS
Anal Chem; 2005 Feb; 77(3):911-22. PubMed ID: 15679361
[TBL] [Abstract][Full Text] [Related]
4. Effects of metal nanoparticles on the secondary ion yields of a model alkane molecule upon atomic and polyatomic projectiles in secondary ion mass spectrometry.
Wehbe N; Heile A; Arlinghaus HF; Bertrand P; Delcorte A
Anal Chem; 2008 Aug; 80(16):6235-44. PubMed ID: 18630928
[TBL] [Abstract][Full Text] [Related]
5. Carbon-13 labeled polymers: an alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry.
Harton SE; Stevie FA; Zhu Z; Ade H
Anal Chem; 2006 May; 78(10):3452-60. PubMed ID: 16689549
[TBL] [Abstract][Full Text] [Related]
6. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.
Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J
Rapid Commun Mass Spectrom; 2009 Jun; 23(11):1601-6. PubMed ID: 19399762
[TBL] [Abstract][Full Text] [Related]
7. Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.
Shard AG; Green FM; Brewer PJ; Seah MP; Gilmore IS
J Phys Chem B; 2008 Mar; 112(9):2596-605. PubMed ID: 18254619
[TBL] [Abstract][Full Text] [Related]
8. Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: quantitative evaluation, imaging secondary ion MS, and laser ablation.
Delcorte A; Bour J; Aubriet F; Muller JF; Bertrand P
Anal Chem; 2003 Dec; 75(24):6875-85. PubMed ID: 14670048
[TBL] [Abstract][Full Text] [Related]
9. Molecular depth profiling with cluster ion beams.
Cheng J; Wucher A; Winograd N
J Phys Chem B; 2006 Apr; 110(16):8329-36. PubMed ID: 16623517
[TBL] [Abstract][Full Text] [Related]
10. Depth profiling of peptide films with TOF-SIMS and a C60 probe.
Cheng J; Winograd N
Anal Chem; 2005 Jun; 77(11):3651-9. PubMed ID: 15924401
[TBL] [Abstract][Full Text] [Related]
11. Depth profiling of metal overlayers on organic substrates with cluster SIMS.
Shen K; Mao D; Garrison BJ; Wucher A; Winograd N
Anal Chem; 2013 Nov; 85(21):10565-72. PubMed ID: 24070427
[TBL] [Abstract][Full Text] [Related]
12. Cluster secondary ion mass spectrometry of polymers and related materials.
Mahoney CM
Mass Spectrom Rev; 2010; 29(2):247-93. PubMed ID: 19449334
[TBL] [Abstract][Full Text] [Related]
13. High-resolution secondary ion mass spectrometry depth profiling of nanolayers.
Baryshev SV; Zinovev AV; Tripa CE; Pellin MJ; Peng Q; Elam JW; Veryovkin IV
Rapid Commun Mass Spectrom; 2012 Oct; 26(19):2224-30. PubMed ID: 22956313
[TBL] [Abstract][Full Text] [Related]
14. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry.
Gillen G; Roberson S
Rapid Commun Mass Spectrom; 1998; 12(19):1303-12. PubMed ID: 9773521
[TBL] [Abstract][Full Text] [Related]
15. Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques.
Bhaskaran M; Sriram S; Holland AS; Evans PJ
Micron; 2009 Jan; 40(1):99-103. PubMed ID: 18276146
[TBL] [Abstract][Full Text] [Related]
16. Analysis of structural distribution of nitrogen-incorporated species at the interface of silicon oxide films on silicon using time-of-flight secondary ion mass spectrometry and poisson approximation.
Chiba K
Anal Chem; 2008 Aug; 80(16):6286-92. PubMed ID: 18642880
[TBL] [Abstract][Full Text] [Related]
17. Ambient low temperature plasma etching of polymer films for secondary ion mass spectrometry molecular depth profiling.
Muramoto S; Staymates ME; Brewer TM; Gillen G
Anal Chem; 2012 Dec; 84(24):10763-7. PubMed ID: 23137275
[TBL] [Abstract][Full Text] [Related]
18. 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.
Bailey J; Havelund R; Shard AG; Gilmore IS; Alexander MR; Sharp JS; Scurr DJ
ACS Appl Mater Interfaces; 2015 Feb; 7(4):2654-9. PubMed ID: 25562665
[TBL] [Abstract][Full Text] [Related]
19. Quantification of antimony depth profiles in Sb-doped tin dioxide thin films.
Lehto S; Lappalainen R; Viirola H; Niinistö L
Anal Bioanal Chem; 1996 May; 355(2):129-34. PubMed ID: 15045435
[TBL] [Abstract][Full Text] [Related]
20. Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profiling.
Green FM; Shard AG; Gilmore IS; Seah MP
Anal Chem; 2009 Jan; 81(1):75-9. PubMed ID: 19117445
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]