These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

116 related articles for article (PubMed ID: 20094448)

  • 1. Method for determining the optical constants of semitransparent films.
    Webber SE; Scharber SR
    Appl Opt; 1971 Feb; 10(2):338-41. PubMed ID: 20094448
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Optical constants and Drude analysis of sputtered zirconium nitride films.
    Veszelei M; Andersson K; Ribbing CG; Järrendahl K; Arwin H
    Appl Opt; 1994 Apr; 33(10):1993-2001. PubMed ID: 20885535
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,R(m)) technique.
    Hjortsberg A
    Appl Opt; 1981 Apr; 20(7):1254-63. PubMed ID: 20309294
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Improved method for determining the optical constants of thin films and its application to molecular-beam-deposited polycrystalline layers.
    Meredith P; Buller GS; Walker AC
    Appl Opt; 1993 Oct; 32(28):5619-27. PubMed ID: 20856378
    [TBL] [Abstract][Full Text] [Related]  

  • 5. [A reflection interference method for determining optical constants and thickness of a thin solid film].
    Yang P; Xu Z; Xu L
    Guang Pu Xue Yu Guang Pu Fen Xi; 2000 Jun; 20(3):283-5. PubMed ID: 12958932
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Optical factors in the photoemission of thin films.
    Ramberg EG
    Appl Opt; 1967 Dec; 6(12):2163-70. PubMed ID: 20062380
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Optical constants for thin films of C, diamond, Al, Si, and CVD SIC from 24 A to 1216 A.
    Windt DL; Cash WC; Scott M; Arendt P; Newnam B; Fisher RF; Swartzlander AB; Takacs PZ; Pinneo JM
    Appl Opt; 1988 Jan; 27(2):279-95. PubMed ID: 20523588
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Measurement of the refractive index and thickness for infrared optical films deposited on rough substrates.
    Saito M; Nakamura S; Miyagi M
    Appl Opt; 1992 Oct; 31(28):6139-44. PubMed ID: 20733820
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Multiple angle ellipsometric analysis of surface layers and surface layer contaminants.
    Pedinoff ME; Stafsudd OM
    Appl Opt; 1982 Feb; 21(3):518-21. PubMed ID: 20372487
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Determining optical constants using an infrared ellipsometer.
    Zhang KQ; Yen YH
    Appl Opt; 1989 Jul; 28(14):2929-34. PubMed ID: 20555625
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Computational method for determining n and k for a thin film from the measured reflectance, transmittance, and film thickness.
    Bennett JM; Booty MJ
    Appl Opt; 1966 Jan; 5(1):41-3. PubMed ID: 20048783
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Optical analysis of absorbing thin films: application to ternary chalcopyrite semiconductors.
    Hernández-Rojas JL; Lucĺa ML; Mátil I; González-Díaz G; Santamaría J; Sánchez-Quesada F
    Appl Opt; 1992 Apr; 31(10):1606-11. PubMed ID: 20720795
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Nanoporous thermochromic VO(2) films with low optical constants, enhanced luminous transmittance and thermochromic properties.
    Kang L; Gao Y; Luo H; Chen Z; Du J; Zhang Z
    ACS Appl Mater Interfaces; 2011 Feb; 3(2):135-8. PubMed ID: 21268632
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Numerical inverse method of determining film parameters of uniaxial anisotropic film with an ellipsometer.
    Zhu R; Lin C; Wei Y
    Appl Opt; 1992 Aug; 31(22):4497-500. PubMed ID: 20725447
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Determination of thin film optical parameters from photometric measurements: an algebraic solution for the (T,R(f),R(b)) method.
    Panayotov V; Konstantinov I
    Appl Opt; 1991 Jul; 30(19):2795-800. PubMed ID: 20700277
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Raman scattering as a technique of measuring film thickness: interference effects in thin growing films.
    McCarty KF
    Appl Opt; 1987 Oct; 26(20):4482-6. PubMed ID: 20523388
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Reflection-transmission photoellipsometry: theory and experiments.
    Bader G; Ashrit PV; Girouard FE; Truong VV
    Appl Opt; 1995 Apr; 34(10):1684-91. PubMed ID: 21037712
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Direct determination of effective interfacial optical constants by nonlinear optical null ellipsometry of chiral films.
    Simpson GJ; Dailey CA; Plocinik RM; Moad AJ; Polizzi MA; Everly RM
    Anal Chem; 2005 Jan; 77(1):215-24. PubMed ID: 15623299
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Determination of optical constants from intensity measurements at normal incidence.
    Nilsson PO
    Appl Opt; 1968 Mar; 7(3):435-42. PubMed ID: 20068608
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry.
    Jellison GE; Boatner LA; Lowndes DH; McKee RA; Godbole M
    Appl Opt; 1994 Sep; 33(25):6053-8. PubMed ID: 20936019
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.