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5. New focusing reflectometer for measuring optical constants of thin films. Burge RE; Davidson AT; Draper JC; Field GR; Murphy E Appl Opt; 1971 Feb; 10(2):342-5. PubMed ID: 20094449 [TBL] [Abstract][Full Text] [Related]
6. Improvement of absolute accuracy for a multiple bounce reflectometer through a detailed effort to reduce systematic errors. Wetzel MG; Saito TT; Patterson SR Appl Opt; 1973 Jul; 12(7):1558-63. PubMed ID: 20125563 [TBL] [Abstract][Full Text] [Related]
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10. Restrictions on the inversion of the fresnel reflectance equations. Armaly BF; Ochoa JG; Look DC Appl Opt; 1972 Dec; 11(12):2907-10. PubMed ID: 20119424 [TBL] [Abstract][Full Text] [Related]
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12. Reflectometer design using nonimaging optics. Snail KA Appl Opt; 1987 Dec; 26(24):5326-32. PubMed ID: 20523525 [TBL] [Abstract][Full Text] [Related]
13. Expression for the reflectance of randomly rough surfaces derived with the Fresnel approximation. Ohlidal I Appl Opt; 1980 Jun; 19(11):1804-11. PubMed ID: 20221128 [TBL] [Abstract][Full Text] [Related]
14. Cinematic reflectometry using QIKR, the quite intense kinetics reflectometer. Ankner JF; Ashkar R; Browning JF; Charlton TR; Doucet M; Halbert CE; Islam F; Karim A; Kharlampieva E; Kilbey SM; Lin JYY; Phan MD; Smith GS; Sukhishvili SA; Thermer R; Veith GM; Watkins EB; Wilson D Rev Sci Instrum; 2023 Jan; 94(1):013302. PubMed ID: 36725568 [TBL] [Abstract][Full Text] [Related]
15. Bidirectional Reflectometry. Part I.: A High Resolution Laser Bidirectional Reflectometer With Results on Several Optical Coatings. Hsia JJ; Richmond JC J Res Natl Bur Stand A Phys Chem; 1976; 80A(2):189-205. PubMed ID: 32196293 [TBL] [Abstract][Full Text] [Related]