These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

595 related articles for article (PubMed ID: 20154886)

  • 1. Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.
    Azzam RM; Elshazly-Zaghloul M; Bashara NM
    Appl Opt; 1975 Jul; 14(7):1652-63. PubMed ID: 20154886
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Transmission ellipsometry on transparent unbacked or embedded thin films with application to soap films in air.
    Azzam RM
    Appl Opt; 1991 Jul; 30(19):2801-6. PubMed ID: 20700278
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry.
    Ohlidal I; Schmidt E; Libezny M
    Appl Opt; 1990 Feb; 29(4):593-8. PubMed ID: 20556152
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Optical Properties of Thin Films on Transparent Surfaces by Ellipsometry; Internal Reflection for Film Covered Surfaces Near the Critical Angle.
    Passaglia E; Stromberg RR
    J Res Natl Bur Stand A Phys Chem; 1964; 68A(6):601-610. PubMed ID: 31834744
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Constant-psi constant-delta contour maps: applications to ellipsometry and to reflection-type optical devices.
    Zaghloul AR; Azzam RM
    Appl Opt; 1982 Feb; 21(4):739-43. PubMed ID: 20372528
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Bare and thin-film-coated substrates with null reflection for p- and s-polarized light at the same angle of incidence: reflectance and ellipsometric parameters as functions of substrate refractive index and film thickness.
    Azzam RM
    Appl Opt; 2016 Oct; 55(30):8464-8467. PubMed ID: 27828122
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film.
    Azzam RM; Sudradjat FF
    J Opt Soc Am A Opt Image Sci Vis; 2011 Jun; 28(6):1256-61. PubMed ID: 21643411
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Phase shifts in frustrated total internal reflection and optical tunneling by an embedded low-index thin film.
    Azzam RM
    J Opt Soc Am A Opt Image Sci Vis; 2006 Apr; 23(4):960-5. PubMed ID: 16604782
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Computer-based high resolution transmission ellipsometry.
    Holzapfel W; Riss U
    Appl Opt; 1987 Jan; 26(1):145-53. PubMed ID: 20454090
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Ellipsometric light scattering for the characterization of thin layers on dispersed colloidal particles.
    Erbe A; Tauer K; Sigel R
    Phys Rev E Stat Nonlin Soft Matter Phys; 2006 Mar; 73(3 Pt 1):031406. PubMed ID: 16605523
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Microscopic thin film optical anisotropy imaging at the solid-liquid interface.
    Miranda A; De Beule PA
    Rev Sci Instrum; 2016 Apr; 87(4):043701. PubMed ID: 27131681
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Application of thin-film interference coatings in infrared reflection spectroscopy of organic samples in contact with thin metal films.
    Reithmeier M; Erbe A
    Appl Opt; 2011 Mar; 50(9):C301-8. PubMed ID: 21460955
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Two-dimensional thickness measurements based on internal reflection ellipsometry.
    Otsuki S; Tamada K; Wakida S
    Appl Opt; 2005 Mar; 44(8):1410-5. PubMed ID: 15796239
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Spectroscopic ellipsometry analysis of a thin film composite membrane consisting of polysulfone on a porous α-alumina support.
    Ogieglo W; Wormeester H; Wessling M; Benes NE
    ACS Appl Mater Interfaces; 2012 Feb; 4(2):935-43. PubMed ID: 22235899
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry.
    Adamson P
    Appl Opt; 2009 Nov; 48(31):5906-16. PubMed ID: 19881659
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Formation of Ultrathin Films at the Solid-Liquid Interface Studied by In Situ Ellipsometry.
    Brunner H; Vallant T; Mayer U; Hoffmann H
    J Colloid Interface Sci; 1999 Apr; 212(2):545-552. PubMed ID: 10092386
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Thickness measurements on transparent substrates based on reflection ellipsometry. I. Optical effects of high-refractive-index additional layers.
    Otsuki S; Ohta K; Tamada K; Wakida S
    Appl Opt; 2005 Oct; 44(28):5910-8. PubMed ID: 16231798
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Interpretation of reflection and transmission spectra for thin films: transmission.
    Yamamoto K; Ishida H
    Appl Opt; 1995 Jul; 34(21):4177-85. PubMed ID: 21052243
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Variable angle of incidence spectroscopic autocollimating ellipsometer.
    Watkins LR; Shamailov SS
    Appl Opt; 2010 Jun; 49(16):3231-4. PubMed ID: 20517395
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Transmission and reflection ellipsometry of thin films and multilayer systems.
    Bader G; Ashrit PV; Truong VV
    Appl Opt; 1998 Mar; 37(7):1146-51. PubMed ID: 18268697
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 30.