These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
115 related articles for article (PubMed ID: 20208688)
1. Strain induced anisotropy in As(2)S(3), As(2)Se(3), and ZnSe films on KCI substrates via 10.6-microm and 0.6328-microm ellipsometer measurements and 0.6328-microm reflector measurements. Pedinoff ME; Stafsudd OM Appl Opt; 1979 Jan; 18(2):201-11. PubMed ID: 20208688 [TBL] [Abstract][Full Text] [Related]
2. Refractive indices of ir materials: 10.6-microm ellipsometer measurements. Pedinoff ME; Braunstein M; Stafsudd OM Appl Opt; 1977 Nov; 16(11):2849-57. PubMed ID: 20174255 [TBL] [Abstract][Full Text] [Related]
3. Microscopic thin film optical anisotropy imaging at the solid-liquid interface. Miranda A; De Beule PA Rev Sci Instrum; 2016 Apr; 87(4):043701. PubMed ID: 27131681 [TBL] [Abstract][Full Text] [Related]
4. Thin-film 2.8-microm and 3.8-microm absorption in single-layer films. Harrington JA; Rudisill JE; Braunstein M Appl Opt; 1978 Sep; 17(17):2798-801. PubMed ID: 20203869 [TBL] [Abstract][Full Text] [Related]
5. Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials. Chindaudom P; Vedam K Appl Opt; 1994 May; 33(13):2664-71. PubMed ID: 20885622 [TBL] [Abstract][Full Text] [Related]
6. Characterization of e-beam evaporated Ge, YbF Amotchkina T; Trubetskov M; Hahner D; Pervak V Appl Opt; 2020 Feb; 59(5):A40-A47. PubMed ID: 32225351 [TBL] [Abstract][Full Text] [Related]
7. Combined reflection and transmission thin-film ellipsometry: a unified linear analysis. Azzam RM; Elshazly-Zaghloul M; Bashara NM Appl Opt; 1975 Jul; 14(7):1652-63. PubMed ID: 20154886 [TBL] [Abstract][Full Text] [Related]
8. Infrared thermooptic coefficient measurement of polycrystalline ZnSe, ZnS, CdTe, CaF(2), and BaF(2), single crystal KCI, and TI-20 glass. Harris RJ; Johnston GT; Kepple GA; Krok PC; Mukai H Appl Opt; 1977 Feb; 16(2):436-8. PubMed ID: 20168506 [TBL] [Abstract][Full Text] [Related]
9. In situ monitoring of film deposition with an ellipsometer based on a four-detector photopolarimeter. Masetti E; Montecchi M; Larciprete R; Cozzi S Appl Opt; 1996 Oct; 35(28):5626-9. PubMed ID: 21127567 [TBL] [Abstract][Full Text] [Related]
10. Plasma silicon oxide films on garnet substrates: measurement of their thickness and refractive index by the prism coupling technique. Hou TW; Mogab CJ Appl Opt; 1981 Sep; 20(18):3184-8. PubMed ID: 20333119 [TBL] [Abstract][Full Text] [Related]
11. Optical constants and Drude analysis of sputtered zirconium nitride films. Veszelei M; Andersson K; Ribbing CG; Järrendahl K; Arwin H Appl Opt; 1994 Apr; 33(10):1993-2001. PubMed ID: 20885535 [TBL] [Abstract][Full Text] [Related]
13. Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometry. Larivière GP; Frigerio JM; Rivory J; Abelès F Appl Opt; 1992 Oct; 31(28):6056-61. PubMed ID: 20733808 [TBL] [Abstract][Full Text] [Related]
14. Measurement of the refractive index and thickness for infrared optical films deposited on rough substrates. Saito M; Nakamura S; Miyagi M Appl Opt; 1992 Oct; 31(28):6139-44. PubMed ID: 20733820 [TBL] [Abstract][Full Text] [Related]
15. Near-field nano-ellipsometer for ultrathin film characterization. Zhan Q; Leger JR J Microsc; 2003 Jun; 210(Pt 3):214-9. PubMed ID: 12787087 [TBL] [Abstract][Full Text] [Related]
16. Formation of Ultrathin Films at the Solid-Liquid Interface Studied by In Situ Ellipsometry. Brunner H; Vallant T; Mayer U; Hoffmann H J Colloid Interface Sci; 1999 Apr; 212(2):545-552. PubMed ID: 10092386 [TBL] [Abstract][Full Text] [Related]
19. Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry. McCrackin FL; Passaglia E; Stromberg RR; Steinberg HL J Res Natl Bur Stand A Phys Chem; 1963; 67A(4):363-377. PubMed ID: 31580576 [TBL] [Abstract][Full Text] [Related]