These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
4. Aspect ratio of elongated polychromatic far-field speckles of continuous and discrete spectral distribution with respect to surface roughness characterization. Lehmann P Appl Opt; 2002 Apr; 41(10):2008-14. PubMed ID: 11936804 [TBL] [Abstract][Full Text] [Related]
5. Surface roughness measurement by means of polychromatic speckle elongation. Lehmann P; Patzelt S; Schöne A Appl Opt; 1997 Apr; 36(10):2188-97. PubMed ID: 18253191 [TBL] [Abstract][Full Text] [Related]
7. Speckle patterns produced by an optical vortex and its application to surface roughness measurements. Passos MH; Lemos MR; Almeida SR; Balthazar WF; da Silva L; Huguenin JA Appl Opt; 2017 Jan; 56(2):330-335. PubMed ID: 28085872 [TBL] [Abstract][Full Text] [Related]
10. Analysis and design of an anamorphic optical processor for speckle metrology and velocimetry. Collicott SH; Hesselink L Appl Opt; 1992 Apr; 31(10):1646-59. PubMed ID: 20720801 [TBL] [Abstract][Full Text] [Related]
11. Measurements of surface roughness: use of a CCD camera to correlate doubly scattered speckle patterns. Basano L; Leporatti S; Ottonello P; Palestini V; Rolandi R Appl Opt; 1995 Nov; 34(31):7286-90. PubMed ID: 21060597 [TBL] [Abstract][Full Text] [Related]
12. Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing. Lu M; Wang S; Aulbach L; Koch AW Appl Opt; 2016 Aug; 55(22):5868-75. PubMed ID: 27505365 [TBL] [Abstract][Full Text] [Related]
13. Surface roughness measurement using white light speckle. Sprague RA Appl Opt; 1972 Dec; 11(12):2811-6. PubMed ID: 20119412 [TBL] [Abstract][Full Text] [Related]
14. Simultaneous measurement of translation and tilt using digital speckle photography. Bhaduri B; Quan C; Tay CJ; Sjödahl M Appl Opt; 2010 Jun; 49(18):3573-9. PubMed ID: 20563211 [TBL] [Abstract][Full Text] [Related]
15. Determination of the SiO(2)/Si interface roughness by diffuse reflectance measurements. Roos A; Bergkvist M; Ribbing CG Appl Opt; 1988 Oct; 27(20):4314-7. PubMed ID: 20539560 [TBL] [Abstract][Full Text] [Related]
16. Determination of the SiO(2)/Si interface roughness by diffuse reflectance measurements. Roos A; Bergkvist M; Ribbing CG Appl Opt; 1988 Nov; 27(22):4660-3. PubMed ID: 20539631 [TBL] [Abstract][Full Text] [Related]
17. Simple model for image-plane polychromatic speckle contrast. Huntley JM Appl Opt; 1999 Apr; 38(11):2212-5. PubMed ID: 18319783 [TBL] [Abstract][Full Text] [Related]
18. Surface-roughness measurement using Fourier transformation of doubly scattered speckle pattern. Nakagawa K; Yoshimura T; Minemoto T Appl Opt; 1993 Sep; 32(25):4898-903. PubMed ID: 20830165 [TBL] [Abstract][Full Text] [Related]
19. A simple optical fourier transform system for the analysis of high frequency speckle patterns. Wang H; Stavroudis ON Appl Opt; 1996 Dec; 35(34):6816-7. PubMed ID: 21151268 [TBL] [Abstract][Full Text] [Related]
20. Digital speckle-displacement measurement using a complex spectrum method. Chen DJ; Chiang FP; Tan YS; Don HS Appl Opt; 1993 Apr; 32(11):1839-49. PubMed ID: 20820317 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]