193 related articles for article (PubMed ID: 20220916)
1. Light scattering from multilayer optics: comparison of theory and experiment.
Elson JM; Rahn JP; Bennett JM
Appl Opt; 1980 Mar; 19(5):669-79. PubMed ID: 20220916
[TBL] [Abstract][Full Text] [Related]
2. Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment.
Elson JM; Bennett JM; Stover JC
Appl Opt; 1993 Jul; 32(19):3362-76. PubMed ID: 20829955
[TBL] [Abstract][Full Text] [Related]
3. Role of interface correlation in light scattering by a multilayer.
Amra C; Apfel JH; Pelletier E
Appl Opt; 1992 Jun; 31(16):3134-51. PubMed ID: 20725259
[TBL] [Abstract][Full Text] [Related]
4. Application of first-order nonparaxial scalar theory to determine surface scattering intensity of multilayer optical coatings.
Zhang K; Huang W; Zhang B; Tian X; Zhang Y; Guan C
Opt Express; 2018 Dec; 26(26):34592-34608. PubMed ID: 30650881
[TBL] [Abstract][Full Text] [Related]
5. Infrared light scattering from surfaces covered with multiple dielectric overlayers.
Elson JM
Appl Opt; 1977 Nov; 16(11):2872-81. PubMed ID: 20174259
[TBL] [Abstract][Full Text] [Related]
6. Light scattering from the volume of optical thin films: theory and experiment.
Kassam S; Duparré A; Hehl K; Bussemer P; Neubert J
Appl Opt; 1992 Mar; 31(9):1304-13. PubMed ID: 20720759
[TBL] [Abstract][Full Text] [Related]
7. Residual surface roughness of diamond-turned optics.
Church EL; Zavada JM
Appl Opt; 1975 Aug; 14(8):1788-95. PubMed ID: 20154921
[TBL] [Abstract][Full Text] [Related]
8. Properties of broadband depth-graded multilayer mirrors for EUV optical systems.
Yakshin AE; Kozhevnikov IV; Zoethout E; Louis E; Bijkerk F
Opt Express; 2010 Mar; 18(7):6957-71. PubMed ID: 20389715
[TBL] [Abstract][Full Text] [Related]
9. Angular scattering from optical interference coatings: scalar scattering predictions and measurements.
Zavislan JM
Appl Opt; 1991 Jun; 30(16):2224-44. PubMed ID: 20700199
[TBL] [Abstract][Full Text] [Related]
10. Roughness measurements of Si and Al by variable angle spectroscopic ellipsometry.
Blanco JR; McMarr PJ
Appl Opt; 1991 Aug; 30(22):3210-20. PubMed ID: 20706377
[TBL] [Abstract][Full Text] [Related]
11. Reflectivity and scattering measurements of an Advanced X-ray Astrophysics Facility test coating sample.
Bixler JV; Mauche CW; Hailey CJ; Madison L
Appl Opt; 1995 Oct; 34(28):6542-51. PubMed ID: 21060508
[TBL] [Abstract][Full Text] [Related]
12. Prediction of the bidirectional reflectance-distribution function from atomic-force and scanning-tunneling microscope measurements of interfacial roughness.
Bruno WM; Roth JA; Burke PE; Hewitt WB; Holmbeck RE; Neal DG
Appl Opt; 1995 Mar; 34(7):1229-38. PubMed ID: 21037653
[TBL] [Abstract][Full Text] [Related]
13. Extreme UV and x-ray scattering measurements from a rough LiF crystal surface characterized by electron micrography.
Alehyane N; Arbaoui M; Barchewitz R; André JM; Christensen FE; Hornstrup A; Palmari J; Rasigni M; Rivoira R; Rasigni G
Appl Opt; 1989 May; 28(10):1763-72. PubMed ID: 20548740
[TBL] [Abstract][Full Text] [Related]
14. Modeling of light scattering in different regimes of surface roughness.
Schröder S; Duparré A; Coriand L; Tünnermann A; Penalver DH; Harvey JE
Opt Express; 2011 May; 19(10):9820-35. PubMed ID: 21643239
[TBL] [Abstract][Full Text] [Related]
15. Surface Roughness Studies with DALLAS-Detector Array for Laser Light Angular Scattering.
Vorburger TV; Teague EC; Scire FE; McLay MJ; Gilsinn DE
J Res Natl Bur Stand (1977); 1984; 89(1):3-16. PubMed ID: 34566115
[TBL] [Abstract][Full Text] [Related]
16. Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayers.
Trost M; Schröder S; Feigl T; Duparré A; Tünnermann A
Appl Opt; 2011 Mar; 50(9):C148-53. PubMed ID: 21460930
[TBL] [Abstract][Full Text] [Related]
17. Light scattering from fused polycrystalline aluminum oxide surfaces.
Hensler DH
Appl Opt; 1972 Nov; 11(11):2522-8. PubMed ID: 20119367
[TBL] [Abstract][Full Text] [Related]
18. Regimes of surface roughness measurable with light scattering.
Vorburger TV; Marx E; Lettieri TR
Appl Opt; 1993 Jul; 32(19):3401-8. PubMed ID: 20829957
[TBL] [Abstract][Full Text] [Related]
19. Measurement of roughness of two interfaces of a dielectric film by scattering ellipsometry.
Germer TA
Phys Rev Lett; 2000 Jul; 85(2):349-52. PubMed ID: 10991280
[TBL] [Abstract][Full Text] [Related]
20. Scattering loss of an optimum pair high reflectance dielectric mirror.
Chao S; Lin YF; Lin JF; Lee CC
Appl Opt; 1990 May; 29(13):1960-3. PubMed ID: 20563116
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
