These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

180 related articles for article (PubMed ID: 20234595)

  • 1. Refractive-index measurements of moderately reflecting substrates using a wedged film technique.
    Beauchamp WT; Rancourt JD
    Appl Opt; 1980 Sep; 19(18):3239-44. PubMed ID: 20234595
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Refractive index determination using reflectance extrema.
    Horwitz CM
    Appl Opt; 1978 Jun; 17(11):1771-5. PubMed ID: 20198067
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Antireflection of an absorbing substrate by an absorbing thin film at normal incidence.
    Azzam RM; Bu-Habib E; Casset J; Chassaing G; Gravier P
    Appl Opt; 1987 Feb; 26(4):719-22. PubMed ID: 20454204
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Determination of (n,k) for absorbing thin films using reflectance measurements.
    Siqueiros JM; Regalado LE; Machorro R
    Appl Opt; 1988 Oct; 27(20):4260-4. PubMed ID: 20539554
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Refractive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/transmittance ratio.
    Diao J; Hess DW
    J Phys Chem B; 2005 Jul; 109(26):12800-18. PubMed ID: 16852588
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Constraint on the optical constants of a transparent film on an absorbing substrate for inversion of the ratio of complex p and s reflection coefficients at a given angle of incidence.
    Azzam RM; Habli MA
    Appl Opt; 1987 Nov; 26(22):4717-21. PubMed ID: 20523434
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement.
    Lunácek J; Hlubina P; Lunácková M
    Appl Opt; 2009 Feb; 48(5):985-9. PubMed ID: 19209215
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Infrared optical constant determination of weakly absorbing dielectric thin films.
    Mouchart J; Begel J; Clément C
    Appl Opt; 1992 Mar; 31(7):885-97. PubMed ID: 20720697
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Derivation of optical constants of metals from thin-film measurements at oblique incidence.
    Nestell JE; Christy RW
    Appl Opt; 1972 Mar; 11(3):643-51. PubMed ID: 20111561
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Simultaneous determination of optical constants, thickness, and surface roughness of thin film from spectrophotometric measurements.
    Guo C; Kong M; Gao W; Li B
    Opt Lett; 2013 Jan; 38(1):40-2. PubMed ID: 23282831
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Determination of the refractive index and thickness of a thin film embedded in a given stratified medium.
    Chabrier G; Goudonnet JP; Vernier P
    Appl Opt; 1989 Jul; 28(14):2907-10. PubMed ID: 20555620
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Optical interference method for the approximate determination of refractive index and thickness of a transparent layer.
    Goodman AM
    Appl Opt; 1978 Sep; 17(17):2779-87. PubMed ID: 20203866
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Measuring the refractive index and thickness of thin transparent films: method.
    Daneu V; Sanchez A
    Appl Opt; 1974 Jan; 13(1):122-8. PubMed ID: 20125932
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Effect of substrate on radiative properties of thin films.
    Armaly BF; Look DC
    Appl Opt; 1973 Aug; 12(8):1904-8. PubMed ID: 20125629
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Achieving a given reflectance for unpolarized light by controlling the incidence angle and the thickness of a transparent thin film on an absorbing substrate: application to energy equipartition in the four-detector photopolarimeter.
    Azzam RM; Giardina KA
    Appl Opt; 1992 Mar; 31(7):935-42. PubMed ID: 20720703
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Implementation of a numerical needle method for thin-film design.
    Sullivan BT; Dobrowolski JA
    Appl Opt; 1996 Oct; 35(28):5484-92. PubMed ID: 21127547
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Calibration of instruments measuring reflectance and transmittance.
    Bennett JM; Ashley EJ
    Appl Opt; 1972 Aug; 11(8):1749-55. PubMed ID: 20119230
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Determination of refractive index and film thickness from interference fringes.
    Harrick NJ
    Appl Opt; 1971 Oct; 10(10):2344-9. PubMed ID: 20111327
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Refractive indices of reactive magnetooptical thin films.
    Challener WA; Grove SL
    Appl Opt; 1990 Jul; 29(20):3040-5. PubMed ID: 20567373
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Optical properties of solution-chemically derived thin film Ni-Al(2)O(3) composites and Si, Al and Si-Ti oxides.
    Boström TK; Wäckelgård E
    J Phys Condens Matter; 2006 Aug; 18(32):7737-50. PubMed ID: 21690884
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.