These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
136 related articles for article (PubMed ID: 20309069)
1. Versatile computer program for absorbing optical thin film systems. Dobrowolski JA Appl Opt; 1981 Jan; 20(1):74-81. PubMed ID: 20309069 [TBL] [Abstract][Full Text] [Related]
2. Implementation of a numerical needle method for thin-film design. Sullivan BT; Dobrowolski JA Appl Opt; 1996 Oct; 35(28):5484-92. PubMed ID: 21127547 [TBL] [Abstract][Full Text] [Related]
3. Optical thin film production with continuous reoptimization of layer thicknesses. Holm C Appl Opt; 1979 Jun; 18(12):1978-82. PubMed ID: 20212589 [TBL] [Abstract][Full Text] [Related]
4. Computational method for determining n and k for a thin film from the measured reflectance, transmittance, and film thickness. Bennett JM; Booty MJ Appl Opt; 1966 Jan; 5(1):41-3. PubMed ID: 20048783 [TBL] [Abstract][Full Text] [Related]
6. Optical method for heterogeneity analysis in thin absorbing films. Dolizy P; Groliere F Appl Opt; 1987 Jun; 26(12):2401-6. PubMed ID: 20489882 [TBL] [Abstract][Full Text] [Related]
7. Deposition error compensation for optical multilayer coatings. I. Theoretical description. Sullivan BT; Dobrowolski JA Appl Opt; 1992 Jul; 31(19):3821-35. PubMed ID: 20725359 [TBL] [Abstract][Full Text] [Related]
8. Optical thin film synthesis program based on the use of Fourier transforms. Dobrowolski JA; Lowe D Appl Opt; 1978 Oct; 17(19):3039-50. PubMed ID: 20203923 [TBL] [Abstract][Full Text] [Related]
9. Derivation of optical constants of metals from thin-film measurements at oblique incidence. Nestell JE; Christy RW Appl Opt; 1972 Mar; 11(3):643-51. PubMed ID: 20111561 [TBL] [Abstract][Full Text] [Related]
11. On the design of fabry-perot reflectors for the vacuum ultraviolet. Thetford A; Bates B; Macdonald J Appl Opt; 1970 Jan; 9(1):35-9. PubMed ID: 20076132 [TBL] [Abstract][Full Text] [Related]
12. Flip-flop thin-film design program with enhanced capabilities. Dobrowolski JA; Kemp RA Appl Opt; 1992 Jul; 31(19):3807-12. PubMed ID: 20725357 [TBL] [Abstract][Full Text] [Related]
13. Achieving a given reflectance for unpolarized light by controlling the incidence angle and the thickness of a transparent thin film on an absorbing substrate: application to energy equipartition in the four-detector photopolarimeter. Azzam RM; Giardina KA Appl Opt; 1992 Mar; 31(7):935-42. PubMed ID: 20720703 [TBL] [Abstract][Full Text] [Related]
14. Refractive index as a variable in the numerical design of optical thin film systems. Dobrowolski JA; Piotrowski SH Appl Opt; 1982 Apr; 21(8):1502-11. PubMed ID: 20389882 [TBL] [Abstract][Full Text] [Related]
15. Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement. Lunácek J; Hlubina P; Lunácková M Appl Opt; 2009 Feb; 48(5):985-9. PubMed ID: 19209215 [TBL] [Abstract][Full Text] [Related]