These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
153 related articles for article (PubMed ID: 20484750)
21. On the peculiarities of CBED pattern formation revealed by multislice simulation. Chuvilin A; Kaiser U Ultramicroscopy; 2005 Aug; 104(1):73-82. PubMed ID: 15935917 [TBL] [Abstract][Full Text] [Related]
22. HOLZ line analysis of lattice parameters in magnesium alloys. Rossouw CJ; Venkatesan K J Electron Microsc (Tokyo); 2001; 50(5):391-404. PubMed ID: 11794614 [TBL] [Abstract][Full Text] [Related]
23. Strain analysis of Si by FEM and energy-filtering CBED. Okuyama T; Nakayama M; Tomokiyo Y; Van Der Biest O Microsc Microanal; 2002 Feb; 8(1):11-5. PubMed ID: 12533199 [TBL] [Abstract][Full Text] [Related]
24. Determination of lattice parameters from multiple CBED patterns: a statistical approach. Brunetti G; Bouzy E; Fundenberger JJ; Morawiec A; Tidu A Ultramicroscopy; 2010 Mar; 110(4):269-77. PubMed ID: 20097477 [TBL] [Abstract][Full Text] [Related]
25. Accuracy assessment of elastic strain measurement by EBSD. Villert S; Maurice C; Wyon C; Fortunier R J Microsc; 2009 Feb; 233(2):290-301. PubMed ID: 19220695 [TBL] [Abstract][Full Text] [Related]
26. Sensitive detection of mirror symmetry by CBED applied to LaAlO3 and GdAlO3. Jones DM Acta Crystallogr B; 2007 Feb; 63(Pt 1):69-74. PubMed ID: 17235196 [TBL] [Abstract][Full Text] [Related]
27. Theory of zone axis electron diffraction. Bird DM J Electron Microsc Tech; 1989 Oct; 13(2):77-97. PubMed ID: 2681572 [TBL] [Abstract][Full Text] [Related]
28. Strain-induced symmetry breakdown in HOLZ lines from L1(2) titanium tri-aluminides. Rossouw CJ; Tsuda K; Forwood CT; Gibson MA; Tanaka M J Electron Microsc (Tokyo); 2000; 49(5):589-98. PubMed ID: 11110465 [TBL] [Abstract][Full Text] [Related]
29. Discrepancies in kinematic calculations of HOLZ lines. Eades JA; Moore S; Pfullmann T; Hangas J Microsc Res Tech; 1993 Apr; 24(6):509-13. PubMed ID: 8490236 [TBL] [Abstract][Full Text] [Related]
30. Using a <670> zone axis for convergent beam electron diffraction measurements of lattice strain in strained silicon. Diercks DR; Kaufman MJ; Irwin RB; Jain A; Robertson L; Weijtmans JW; Wise R J Microsc; 2010 Aug; 239(2):154-8. PubMed ID: 20629920 [TBL] [Abstract][Full Text] [Related]
31. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. Wilkinson AJ; Meaden G; Dingley DJ Ultramicroscopy; 2006 Mar; 106(4-5):307-13. PubMed ID: 16324788 [TBL] [Abstract][Full Text] [Related]
32. Dynamical effects in strain measurements by dark-field electron holography. Javon E; Lubk A; Cours R; Reboh S; Cherkashin N; Houdellier F; Gatel C; Hÿtch MJ Ultramicroscopy; 2014 Dec; 147():70-85. PubMed ID: 25062040 [TBL] [Abstract][Full Text] [Related]
33. Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction. Jackson BE; Christensen JJ; Singh S; De Graef M; Fullwood DT; Homer ER; Wagoner RH Microsc Microanal; 2016 Aug; 22(4):789-802. PubMed ID: 27509538 [TBL] [Abstract][Full Text] [Related]
34. Structural characterization of Ni2Si pseudoepitaxial transrotational structures on [001] Si. Alberti A; Bongiorno C; Alippi P; La Magna A; Spinella C; Rimini E Acta Crystallogr B; 2006 Oct; 62(Pt 5):729-36. PubMed ID: 16983153 [TBL] [Abstract][Full Text] [Related]
35. Effect of sample bending on diffracted intensities observed in CBED patterns of plan view strained samples. Houdellier F; Jacob D; Casanove MJ; Roucau C Ultramicroscopy; 2008 Mar; 108(4):295-301. PubMed ID: 17544215 [TBL] [Abstract][Full Text] [Related]
36. Analysis of local strain in aluminium interconnects by energy filtered CBED. Kramer S; Mayer J; Witt C; Weickenmeier A; Ruhle M Ultramicroscopy; 2000 Apr; 81(3-4):245-62. PubMed ID: 10782648 [TBL] [Abstract][Full Text] [Related]
37. Determination of Debye-Waller factor and structure factors for Si by quantitative convergent-beam electron diffraction using off-axis multi-beam orientations. Sang XH; Kulovits A; Wiezorek JM Acta Crystallogr A; 2010 Nov; 66(Pt 6):685-93. PubMed ID: 20962378 [TBL] [Abstract][Full Text] [Related]
38. Burgers Vector Analysis of Vertical Dislocations in Ge Crystals by Large-Angle Convergent Beam Electron Diffraction. Groiss H; Glaser M; Marzegalli A; Isa F; Isella G; Miglio L; Schäffler F Microsc Microanal; 2015 Jun; 21(3):637-45. PubMed ID: 25939606 [TBL] [Abstract][Full Text] [Related]
39. Mapping of Strain Fields in GaAs/GaAsP Core-Shell Nanowires with Nanometer Resolution. Jones EJ; Ermez S; Gradečak S Nano Lett; 2015 Dec; 15(12):7873-9. PubMed ID: 26517289 [TBL] [Abstract][Full Text] [Related]