These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

100 related articles for article (PubMed ID: 20554754)

  • 1. Modelling and observations of electron beam charging of an insulator/metal bilayer and its impact on secondary electron images in defect inspection equipment.
    Ohya K; Inai K; Kawasaki R; Saito M; Hayashi T; Jau J; Kanai K
    J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S189-93. PubMed ID: 20554754
    [TBL] [Abstract][Full Text] [Related]  

  • 2. The imaging mechanism of single-walled carbon nanotubes on Si/SiO₂ wafer in scanning electron microscopy.
    Zhang L; Gao F; Huang S
    J Microsc; 2011 Feb; 241(2):188-94. PubMed ID: 21118217
    [TBL] [Abstract][Full Text] [Related]  

  • 3. The use of surface charging in the SEM for lithium niobate domain structure investigation.
    Kokhanchik LS
    Micron; 2009 Jan; 40(1):41-5. PubMed ID: 18448344
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Thickness measurement of a thin oxide layer by secondary electron emission.
    Okamoto K
    Rev Sci Instrum; 1980 Mar; 51(3):302. PubMed ID: 18647054
    [TBL] [Abstract][Full Text] [Related]  

  • 5. On some contrast reversals in SEM: application to metal/insulator systems.
    Cazaux J
    Ultramicroscopy; 2008 Nov; 108(12):1645-52. PubMed ID: 18692317
    [TBL] [Abstract][Full Text] [Related]  

  • 6. The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics.
    Stevens-Kalceff MA; Levick KJ
    Microsc Res Tech; 2007 Mar; 70(3):195-204. PubMed ID: 17279517
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Conditions required for high quality high magnification images in secondary electron-I scanning electron microscopy.
    Peters KR
    Scan Electron Microsc; 1982; (Pt 4):1359-72. PubMed ID: 7184136
    [TBL] [Abstract][Full Text] [Related]  

  • 8. [Obtaining distinct images of biological forms with the raster electron microscope].
    Krymskiĭ LD; Arshinova MN
    Biull Eksp Biol Med; 1975 Jan; 79(1):90-3. PubMed ID: 1111654
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Energy-filtered imaging in a scanning electron microscope for dopant contrast in InP.
    Tsurumi D; Hamada K; Kawasaki Y
    J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S183-7. PubMed ID: 20601354
    [TBL] [Abstract][Full Text] [Related]  

  • 10. The surface potential of insulating thin films negatively charged by a low-energy focused electron beam.
    Li WQ; Zhang HB
    Micron; 2010 Jul; 41(5):416-22. PubMed ID: 20299230
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Material contrast in SEM: Fermi energy and work function effects.
    Cazaux J
    Ultramicroscopy; 2010 Feb; 110(3):242-53. PubMed ID: 20061085
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Space charge characteristics of an insulating thin film negatively charged by a low-energy electron beam.
    Zhang HB; Li WQ; Cao M
    J Electron Microsc (Tokyo); 2012 Apr; 61(2):85-97. PubMed ID: 22215798
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Extended soft X-ray emission spectroscopy: quantitative assessment of emission intensities.
    Pistor P; Kötschau I; Grimm A; Jung C; Lauermann I; Lux-Steiner MCh; Fischer CH
    J Synchrotron Radiat; 2010 Nov; 17(6):791-8. PubMed ID: 20975226
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Transient of scanning electron microscopic images for a buried microstructure in insulators.
    Zhang HB; Li DY; Li WQ
    Rev Sci Instrum; 2007 Dec; 78(12):126105. PubMed ID: 18163754
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Monte Carlo feasibility study of orthogonal bremsstrahlung beams for improved radiation therapy imaging.
    Jabbari K; Sarfehnia A; Podgorsak EB; Seuntjens JP
    Phys Med Biol; 2007 Feb; 52(4):1171-84. PubMed ID: 17264378
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Characterization of charging in semiconductor device materials by electron holography.
    McCartney MR
    J Electron Microsc (Tokyo); 2005 Jun; 54(3):239-42. PubMed ID: 16275780
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Backscattered electron imaging for reduced charging of moisturized corn starch granules: implications for versatile imagery of hygroscopic powder specimens.
    Kim KW; Choi SJ; Moon TW
    Micron; 2008 Dec; 39(8):1160-5. PubMed ID: 18586501
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Visibility of Si nanoparticles embedded in an amorphous SiO2 matrix.
    Mitome M
    J Electron Microsc (Tokyo); 2006 Aug; 55(4):201-7. PubMed ID: 17079276
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Electron and ion imaging of gland cells using the FIB/SEM system.
    Drobne D; Milani M; Zrimec A; Leser V; Berden Zrimec M
    J Microsc; 2005 Jul; 219(Pt 1):29-35. PubMed ID: 15998363
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Progress in scanning electron microscopy of frozen-hydrated biological specimens.
    Hermann R; Müller M
    Scanning Microsc; 1993 Mar; 7(1):343-9; discussion 349-50. PubMed ID: 8316804
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 5.