These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
124 related articles for article (PubMed ID: 20577377)
1. Measurements of absorption losses in TiO(2) films by a collinear photothermal deflection technique. Commandré M; Pelletier E Appl Opt; 1990 Oct; 29(28):4276-83. PubMed ID: 20577377 [TBL] [Abstract][Full Text] [Related]
2. Absorption and thermal conductivity of oxide thin films measured by photothermal displacement and reflectance methods. Wu ZL; Reichling M; Hu XQ; Balasubramanian K; Guenther KH Appl Opt; 1993 Oct; 32(28):5660-5. PubMed ID: 20856383 [TBL] [Abstract][Full Text] [Related]
3. Infrared optical absorption loss of antireflection coatings on germanium and potassium chloride substrates at the 10-µm wavelength by the photothermal deflection technique. Liu X; Atanassov G; Gu PF; Sao Q; Tang JF Appl Opt; 1993 Oct; 32(28):5645-8. PubMed ID: 20856381 [TBL] [Abstract][Full Text] [Related]
4. Study on the absorption uniformity of optical thin films based on the photothermal detuning technique. Hao H; Zhou A; Rao M Appl Opt; 2012 Oct; 51(28):6844-7. PubMed ID: 23033101 [TBL] [Abstract][Full Text] [Related]
5. Optical waveguide characterization of dielectric films deposited by reactive low-voltage ion plating. Kimble TC; Himel MD; Guenther KH Appl Opt; 1993 Oct; 32(28):5640-4. PubMed ID: 20856380 [TBL] [Abstract][Full Text] [Related]
6. Comparative photothermal study of reactive low-voltage ion-plated andelectron-beam-evaporated TiO(2) thin films. Wu ZL; Bange K Appl Opt; 1994 Dec; 33(34):7901-7. PubMed ID: 20963004 [TBL] [Abstract][Full Text] [Related]
7. Temperature field analysis of single-layer TiO2 films. Li SH; He HB; Ling XL; Tao CX; Zhao YA; Fan ZX Appl Opt; 2009 Oct; 48(28):5380-5. PubMed ID: 19798378 [TBL] [Abstract][Full Text] [Related]
8. Refractive indices of TiO(2) films produced by reactive evaporation of various titanium-oxygen phases. Pulker HK; Paesold G; Ritter E Appl Opt; 1976 Dec; 15(12):2986-91. PubMed ID: 20168379 [TBL] [Abstract][Full Text] [Related]
9. Optical properties of sol-gel spin-coated TiO(2) films and comparison of the properties with ion-beam-sputtered films. Ozer N; Demiryont H; Simmons JH Appl Opt; 1991 Sep; 30(25):3661-6. PubMed ID: 20706442 [TBL] [Abstract][Full Text] [Related]
10. Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating. Balasubramanian K; Han XF; Guenther KH Appl Opt; 1993 Oct; 32(28):5594-600. PubMed ID: 20856374 [TBL] [Abstract][Full Text] [Related]
11. Time-dependent absorption of TiO2 optical thin films under pulsed and continuous wave 790 nm laser irradiation. Zhang X; Emmert LA; Rudolph W Appl Opt; 2013 Dec; 52(34):8245-51. PubMed ID: 24513825 [TBL] [Abstract][Full Text] [Related]
12. Laser damage resistance of hafnia thin films deposited by electron beam deposition, reactive low voltage ion plating, and dual ion beam sputtering. Gallais L; Capoulade J; Natoli JY; Commandré M; Cathelinaud M; Koc C; Lequime M Appl Opt; 2008 May; 47(13):C107-13. PubMed ID: 18449230 [TBL] [Abstract][Full Text] [Related]
13. Influence of ion assistance on LaF3 films deposited by molybdenum boat evaporation. Liu MC; Lee CC; Kaneko M; Nakahira K; Takano Y Appl Opt; 2012 May; 51(15):2865-9. PubMed ID: 22614587 [TBL] [Abstract][Full Text] [Related]
14. Correlation between properties of HfO2 films and preparing parameters by ion beam sputtering deposition. Liu H; Jiang Y; Wang L; Leng J; Sun P; Zhuang K; Ji Y; Cheng X; Jiao H; Wang Z; Wu B Appl Opt; 2014 Feb; 53(4):A405-11. PubMed ID: 24514245 [TBL] [Abstract][Full Text] [Related]
15. Nonlinear absorption in single LaF(3) and MgF(2) layers at 193 nm measured by surface sensitive laser induced deflection technique. Mühlig C; Bublitz S; Kufert S Appl Opt; 2009 Dec; 48(35):6781-7. PubMed ID: 20011019 [TBL] [Abstract][Full Text] [Related]
16. Photothermal deflection spectroscopy and detection. Jackson WB; Amer NM; Boccara AC; Fournier D Appl Opt; 1981 Apr; 20(8):1333-44. PubMed ID: 20309309 [TBL] [Abstract][Full Text] [Related]