89 related articles for article (PubMed ID: 20591817)
1. Dependence of beam broadening on detection angle in scanning transmission electron microtomography.
Motoki S; Kaneko T; Aoyama Y; Nishioka H; Okura Y; Kondo Y; Jinnai H
J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S45-53. PubMed ID: 20591817
[TBL] [Abstract][Full Text] [Related]
2. Three-dimensional microscopy for multi-scale imaging: from nano to macro.
Jinnai H
Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i3. PubMed ID: 25359830
[TBL] [Abstract][Full Text] [Related]
3. Determination of the linear attenuation range of electron transmission through film specimens.
Wang F; Zhang HB; Cao M; Nishi R; Takaoka A
Micron; 2010 Oct; 41(7):769-74. PubMed ID: 20558075
[TBL] [Abstract][Full Text] [Related]
4. STEM tomography for thick biological specimens.
Aoyama K; Takagi T; Hirase A; Miyazawa A
Ultramicroscopy; 2008 Dec; 109(1):70-80. PubMed ID: 18977089
[TBL] [Abstract][Full Text] [Related]
5. Low-energy STEM of multilayers and dopant profiles.
Merli PG; Morandi V
Microsc Microanal; 2005 Feb; 11(1):97-104. PubMed ID: 15683576
[TBL] [Abstract][Full Text] [Related]
6. Transmission electron microtomography without the "missing wedge" for quantitative structural analysis.
Kawase N; Kato M; Nishioka H; Jinnai H
Ultramicroscopy; 2007 Jan; 107(1):8-15. PubMed ID: 16730409
[TBL] [Abstract][Full Text] [Related]
7. Reduction of anisotropic image resolution in transmission electron microtomography by use of quadrangular prism-shaped section.
Kaneko T; Nishioka H; Nishi T; Jinnai H
J Electron Microsc (Tokyo); 2005 Oct; 54(5):437-44. PubMed ID: 16243850
[TBL] [Abstract][Full Text] [Related]
8. Electron beam broadening in electron-transparent samples at low electron energies.
Hugenschmidt M; Müller E; Gerthsen D
J Microsc; 2019 Jun; 274(3):150-157. PubMed ID: 31001840
[TBL] [Abstract][Full Text] [Related]
9. Maximum diameter of the rod-shaped specimen for transmission electron microtomography without the "missing wedge".
Kato M; Kawase N; Kaneko T; Toh S; Matsumura S; Jinnai H
Ultramicroscopy; 2008 Feb; 108(3):221-9. PubMed ID: 18036741
[TBL] [Abstract][Full Text] [Related]
10. Tomography experiment of an integrated circuit specimen using 3 MeV electrons in the transmission electron microscope.
Zhang HB; Zhang XL; Wang Y; Takaoka A
Rev Sci Instrum; 2007 Jan; 78(1):013701. PubMed ID: 17503922
[TBL] [Abstract][Full Text] [Related]
11. Ordering of lipid A-monophosphate clusters in aqueous solutions.
Faunce CA; Reichelt H; Quitschau P; Paradies HH
J Chem Phys; 2007 Sep; 127(11):115103. PubMed ID: 17887884
[TBL] [Abstract][Full Text] [Related]
12. Multiple scattering effects of MeV electrons in very thick amorphous specimens.
Wang F; Zhang HB; Cao M; Nishi R; Takaoka A
Ultramicroscopy; 2010 Feb; 110(3):259-68. PubMed ID: 20079570
[TBL] [Abstract][Full Text] [Related]
13. Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.
Rosenauer A; Gries K; Müller K; Pretorius A; Schowalter M; Avramescu A; Engl K; Lutgen S
Ultramicroscopy; 2009 Aug; 109(9):1171-82. PubMed ID: 19497670
[TBL] [Abstract][Full Text] [Related]
14. An inexpensive approach for bright-field and dark-field imaging by scanning transmission electron microscopy in scanning electron microscopy.
Patel B; Watanabe M
Microsc Microanal; 2014 Feb; 20(1):124-32. PubMed ID: 24423133
[TBL] [Abstract][Full Text] [Related]
15. Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope.
Zhang HB; Wang F; Takaoka A
J Electron Microsc (Tokyo); 2007 Apr; 56(2):51-5. PubMed ID: 17928321
[TBL] [Abstract][Full Text] [Related]
16. STEM tomography in cell biology.
Yakushevska AE; Lebbink MN; Geerts WJ; Spek L; van Donselaar EG; Jansen KA; Humbel BM; Post JA; Verkleij AJ; Koster AJ
J Struct Biol; 2007 Sep; 159(3):381-91. PubMed ID: 17600727
[TBL] [Abstract][Full Text] [Related]
17. Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications.
Kübel C; Voigt A; Schoenmakers R; Otten M; Su D; Lee TC; Carlsson A; Bradley J
Microsc Microanal; 2005 Oct; 11(5):378-400. PubMed ID: 17481320
[TBL] [Abstract][Full Text] [Related]
18. Backscattered electron imaging for high resolution surface scanning electron microscopy with a new type YAG-detector.
Walther P; Autrata R; Chen Y; Pawley JB
Scanning Microsc; 1991 Jun; 5(2):301-9; discussion 310. PubMed ID: 1947922
[TBL] [Abstract][Full Text] [Related]
19. A low error reconstruction method for confocal holography to determine 3-dimensional properties.
Jacquemin PB; Herring RA
Ultramicroscopy; 2012 Jun; 117():24-30. PubMed ID: 22634188
[TBL] [Abstract][Full Text] [Related]
20. A three-dimensional-weighted cone beam filtered backprojection (CB-FBP) algorithm for image reconstruction in volumetric CT-helical scanning.
Tang X; Hsieh J; Nilsen RA; Dutta S; Samsonov D; Hagiwara A
Phys Med Biol; 2006 Feb; 51(4):855-74. PubMed ID: 16467583
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]