These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

166 related articles for article (PubMed ID: 20601352)

  • 1. Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems.
    Lu K; Sourty E; Loos J
    J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S39-44. PubMed ID: 20601352
    [TBL] [Abstract][Full Text] [Related]  

  • 2. High-angle annular dark field scanning transmission electron microscopy on carbon-based functional polymer systems.
    Sourty E; van Bavel S; Lu K; Guerra R; Bar G; Loos J
    Microsc Microanal; 2009 Jun; 15(3):251-8. PubMed ID: 19460182
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Comparison of intensity distributions in tomograms from BF TEM, ADF STEM, HAADF STEM, and calculated tilt series.
    Friedrich H; McCartney MR; Buseck PR
    Ultramicroscopy; 2005 Dec; 106(1):18-27. PubMed ID: 16081215
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM.
    Xin HL; Muller DA
    J Electron Microsc (Tokyo); 2009 Jun; 58(3):157-65. PubMed ID: 19164489
    [TBL] [Abstract][Full Text] [Related]  

  • 5. STEM tomography in cell biology.
    Yakushevska AE; Lebbink MN; Geerts WJ; Spek L; van Donselaar EG; Jansen KA; Humbel BM; Post JA; Verkleij AJ; Koster AJ
    J Struct Biol; 2007 Sep; 159(3):381-91. PubMed ID: 17600727
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Three-dimensional imaging in aberration-corrected electron microscopes.
    Xin HL; Muller DA
    Microsc Microanal; 2010 Aug; 16(4):445-55. PubMed ID: 20566002
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy.
    Mitsuishi K; Hashimoto A; Takeguchi M; Shimojo M; Ishizuka K
    Ultramicroscopy; 2010 Dec; 111(1):20-6. PubMed ID: 21111263
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Artifacts in aberration-corrected ADF-STEM imaging.
    Yu Z; Batson PE; Silcox J
    Ultramicroscopy; 2003 Sep; 96(3-4):275-84. PubMed ID: 12871794
    [TBL] [Abstract][Full Text] [Related]  

  • 9. STEM tomography for thick biological specimens.
    Aoyama K; Takagi T; Hirase A; Miyazawa A
    Ultramicroscopy; 2008 Dec; 109(1):70-80. PubMed ID: 18977089
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy.
    Kimoto K; Asaka T; Yu X; Nagai T; Matsui Y; Ishizuka K
    Ultramicroscopy; 2010 Jun; 110(7):778-82. PubMed ID: 20199847
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Comparison of phase contrast transmission electron microscopy with optimized scanning transmission annular dark field imaging for protein imaging.
    Rez P
    Ultramicroscopy; 2003 Jul; 96(1):117-24. PubMed ID: 12623176
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Identifying hexagonal boron nitride monolayers by transmission electron microscopy.
    Odlyzko ML; Mkhoyan KA
    Microsc Microanal; 2012 Jun; 18(3):558-67. PubMed ID: 22640966
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Characterization of Si nanocrystals by different TEM-based techniques.
    Nikolova L; Saint-Jacques RG; Ross GG
    Ultramicroscopy; 2010 Jan; 110(2):144-50. PubMed ID: 19944535
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Effect of specimen misalignment on local structure analysis using annular dark-field imaging.
    So YG; Kimoto K
    J Electron Microsc (Tokyo); 2012 Aug; 61(4):207-15. PubMed ID: 22561921
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Imaging individual atoms inside crystals with ADF-STEM.
    Voyles PM; Grazul JL; Muller DA
    Ultramicroscopy; 2003 Sep; 96(3-4):251-73. PubMed ID: 12871793
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Three-dimensional optical sectioning by scanning confocal electron microscopy with a stage-scanning system.
    Hashimoto A; Shimojo M; Mitsuishi K; Takeguchi M
    Microsc Microanal; 2010 Jun; 16(3):233-8. PubMed ID: 20350339
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Atomic resolution ADF-STEM imaging of organic molecular crystal of halogenated copper phthalocyanine.
    Haruta M; Yoshida K; Kurata H; Isoda S
    Ultramicroscopy; 2008 May; 108(6):545-51. PubMed ID: 17933464
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM.
    Inada H; Wu L; Wall J; Su D; Zhu Y
    J Electron Microsc (Tokyo); 2009 Jun; 58(3):111-22. PubMed ID: 19254916
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. point spread function analysis.
    Mitsuishi K; Hashimoto A; Takeguchi M; Shimojo M; Ishizuka K
    Ultramicroscopy; 2012 Jan; 112(1):53-60. PubMed ID: 22088508
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.
    Watanabe K; Kikuchi Y; Yamazaki T; Asano E; Nakanishi N; Kotaka Y; Okunishi E; Hashimoto I
    Acta Crystallogr A; 2004 Nov; 60(Pt 6):591-7. PubMed ID: 15507742
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.