These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

198 related articles for article (PubMed ID: 20687735)

  • 1. An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact.
    Tourek CJ; Sundararajan S
    Rev Sci Instrum; 2010 Jul; 81(7):073711. PubMed ID: 20687735
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
    Slattery AD; Blanch AJ; Quinton JS; Gibson CT
    Ultramicroscopy; 2013 Aug; 131():46-55. PubMed ID: 23685172
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Direct measurement of cantilever spring constants and correction for cantilever irregularities using an instrumented indenter.
    Ying ZC; Reitsma MG; Gates RS
    Rev Sci Instrum; 2007 Jun; 78(6):063708. PubMed ID: 17614617
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometry.
    Gates RS; Pratt JR
    Nanotechnology; 2012 Sep; 23(37):375702. PubMed ID: 22922668
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Dynamic spring constants for higher flexural modes of cantilever plates with applications to atomic force microscopy.
    Hähner G
    Ultramicroscopy; 2010 Jun; 110(7):801-6. PubMed ID: 20188476
    [TBL] [Abstract][Full Text] [Related]  

  • 6. A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy.
    Das S; Sreeram PA; Raychaudhuri AK
    Nanotechnology; 2007 Jan; 18(3):035501. PubMed ID: 19636120
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope.
    Sader JE; Lu J; Mulvaney P
    Rev Sci Instrum; 2014 Nov; 85(11):113702. PubMed ID: 25430115
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers.
    Killgore JP; Tung RC; Hurley DC
    Nanotechnology; 2014 Aug; 25(34):345701. PubMed ID: 25098183
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Sensing cantilever beam bending by the optical lever technique and its application to surface stress.
    Evans DR; Craig VS
    J Phys Chem B; 2006 Mar; 110(11):5450-61. PubMed ID: 16539483
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy.
    Shegaonkar AC; Salapaka SM
    Rev Sci Instrum; 2007 Oct; 78(10):103706. PubMed ID: 17979427
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Prototype cantilevers for quantitative lateral force microscopy.
    Reitsma MG; Gates RS; Friedman LH; Cook RF
    Rev Sci Instrum; 2011 Sep; 82(9):093706. PubMed ID: 21974593
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Colloid probes with increased tip height for higher sensitivity in friction force microscopy and less cantilever damping in dynamic force microscopy.
    Schmutz JE; Schäfer MM; Hölscher H
    Rev Sci Instrum; 2008 Feb; 79(2 Pt 1):026103. PubMed ID: 18315335
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Optical lever calibration in atomic force microscope with a mechanical lever.
    Xie H; Vitard J; Haliyo S; Régnier S
    Rev Sci Instrum; 2008 Sep; 79(9):096101. PubMed ID: 19044455
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers.
    Slattery AD; Blanch AJ; Quinton JS; Gibson CT
    Nanotechnology; 2013 Jan; 24(1):015710. PubMed ID: 23220746
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Atomic force microscopy: loading position dependence of cantilever spring constants and detector sensitivity.
    Vakarelski IU; Edwards SA; Dagastine RR; Chan DY; Stevens GW; Grieser F
    Rev Sci Instrum; 2007 Nov; 78(11):116102. PubMed ID: 18052510
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Advanced tip design for liquid phase vibration mode atomic force microscopy.
    Muramatsu H; Yamamoto Y; Shigeno M; Shirakawabe Y; Inoue A; Kim WS; Kim SJ; Chang SM; Kim JM
    Anal Chim Acta; 2008 Mar; 611(2):233-8. PubMed ID: 18328326
    [TBL] [Abstract][Full Text] [Related]  

  • 17. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface.
    Naitoh Y; Kinoshita Y; Jun Li Y; Kageshima M; Sugawara Y
    Nanotechnology; 2009 Jul; 20(26):264011. PubMed ID: 19509444
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever.
    Yeh MK; Tai NH; Chen BY
    Rev Sci Instrum; 2009 Apr; 80(4):043705. PubMed ID: 19405664
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers.
    Chung KH; Reitsma MG
    Rev Sci Instrum; 2010 Feb; 81(2):026104. PubMed ID: 20192521
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition.
    Kinoshita Y; Naitoh Y; Li YJ; Sugawara Y
    Rev Sci Instrum; 2011 Nov; 82(11):113707. PubMed ID: 22128984
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 10.