223 related articles for article (PubMed ID: 20700278)
1. Transmission ellipsometry on transparent unbacked or embedded thin films with application to soap films in air.
Azzam RM
Appl Opt; 1991 Jul; 30(19):2801-6. PubMed ID: 20700278
[TBL] [Abstract][Full Text] [Related]
2. Constraint on the optical constants of a transparent film on an absorbing substrate for inversion of the ratio of complex p and s reflection coefficients at a given angle of incidence.
Azzam RM; Habli MA
Appl Opt; 1987 Nov; 26(22):4717-21. PubMed ID: 20523434
[TBL] [Abstract][Full Text] [Related]
3. Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.
Azzam RM; Elshazly-Zaghloul M; Bashara NM
Appl Opt; 1975 Jul; 14(7):1652-63. PubMed ID: 20154886
[TBL] [Abstract][Full Text] [Related]
4. Contours of constant pseudo-Brewster angle in the complex ? plane and an analytical method for the determination of optical constants.
Azzam RM; Ugbo EE
Appl Opt; 1989 Dec; 28(24):5222-8. PubMed ID: 20556031
[TBL] [Abstract][Full Text] [Related]
5. Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film.
Azzam RM; Sudradjat FF
J Opt Soc Am A Opt Image Sci Vis; 2011 Jun; 28(6):1256-61. PubMed ID: 21643411
[TBL] [Abstract][Full Text] [Related]
6. Complex reflection coefficients of p- and s-polarized light at the pseudo-Brewster angle of a dielectric-conductor interface.
Azzam RM
J Opt Soc Am A Opt Image Sci Vis; 2013 Oct; 30(10):1975-9. PubMed ID: 24322852
[TBL] [Abstract][Full Text] [Related]
7. Method for determination of the parameters of transparent ultrathin films deposited on transparent substrates under conditions of low optical contrast.
Kostruba A; Stetsyshyn Y; Vlokh R
Appl Opt; 2015 Jul; 54(20):6208-16. PubMed ID: 26193395
[TBL] [Abstract][Full Text] [Related]
8. Phase shifts that accompany total internal reflection at a dielectric-dielectric interface.
Azzam RM
J Opt Soc Am A Opt Image Sci Vis; 2004 Aug; 21(8):1559-63. PubMed ID: 15330484
[TBL] [Abstract][Full Text] [Related]
9. Limitations to the determination of the optical properties of a thin film by combined ellipsometric and surface plasmon resonance measurements.
Schildkraut JS
Appl Opt; 1988 Aug; 27(16):3329-33. PubMed ID: 20539374
[TBL] [Abstract][Full Text] [Related]
10. Phase shifts in frustrated total internal reflection and optical tunneling by an embedded low-index thin film.
Azzam RM
J Opt Soc Am A Opt Image Sci Vis; 2006 Apr; 23(4):960-5. PubMed ID: 16604782
[TBL] [Abstract][Full Text] [Related]
11. Inversion of transmission ellipsometric data for transparent films.
Lekner J
Appl Opt; 1994 Aug; 33(22):5108-10. PubMed ID: 20935893
[TBL] [Abstract][Full Text] [Related]
12. Difference between the second-Brewster and pseudo-Brewster angles when polarized light is reflected at a dielectric-conductor interface.
Alsamman A; Azzam RM
J Opt Soc Am A Opt Image Sci Vis; 2010 May; 27(5):1156-61. PubMed ID: 20448783
[TBL] [Abstract][Full Text] [Related]
13. Embedded centrosymmetric multilayer stacks as complete-transmission quarter-wave and half-wave retarders under conditions of frustrated total internal reflection.
Perla SR; Azzam RM
J Opt Soc Am A Opt Image Sci Vis; 2007 Oct; 24(10):3255-60. PubMed ID: 17912318
[TBL] [Abstract][Full Text] [Related]
14. Complex reflection coefficients for the parallel and perpendicular polarizations of a film-substate system.
Azzam RM; Khan ME
Appl Opt; 1983 Jan; 22(2):253-64. PubMed ID: 18195777
[TBL] [Abstract][Full Text] [Related]
15. Derivation of optical constants of metals from thin-film measurements at oblique incidence.
Nestell JE; Christy RW
Appl Opt; 1972 Mar; 11(3):643-51. PubMed ID: 20111561
[TBL] [Abstract][Full Text] [Related]
16. In-line broadband 270 degrees (3lambda/4) chevron four-reflection wave retarders.
Azzam RM; Khanfar HK
Appl Opt; 2008 Sep; 47(27):4878-83. PubMed ID: 18806846
[TBL] [Abstract][Full Text] [Related]
17. Determination of (n,k) for absorbing thin films using reflectance measurements.
Siqueiros JM; Regalado LE; Machorro R
Appl Opt; 1988 Oct; 27(20):4260-4. PubMed ID: 20539554
[TBL] [Abstract][Full Text] [Related]
18. Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry.
Adamson P
Appl Opt; 2009 Nov; 48(31):5906-16. PubMed ID: 19881659
[TBL] [Abstract][Full Text] [Related]
19. Electron holography of thin amorphous carbon films: measurement of the mean inner potential and a thickness-independent phase shift.
Wanner M; Bach D; Gerthsen D; Werner R; Tesche B
Ultramicroscopy; 2006 Mar; 106(4-5):341-5. PubMed ID: 16343774
[TBL] [Abstract][Full Text] [Related]
20. Refractive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/transmittance ratio.
Diao J; Hess DW
J Phys Chem B; 2005 Jul; 109(26):12800-18. PubMed ID: 16852588
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
