196 related articles for article (PubMed ID: 20706377)
1. Roughness measurements of Si and Al by variable angle spectroscopic ellipsometry.
Blanco JR; McMarr PJ
Appl Opt; 1991 Aug; 30(22):3210-20. PubMed ID: 20706377
[TBL] [Abstract][Full Text] [Related]
2. Ellipsometry of rough surfaces.
Vorburger TV; Ludema KC
Appl Opt; 1980 Feb; 19(4):561-73. PubMed ID: 20216894
[TBL] [Abstract][Full Text] [Related]
3. Ellipsometric analysis for surface roughness and texture.
Nee SM
Appl Opt; 1988 Jul; 27(14):2819-31. PubMed ID: 20531846
[TBL] [Abstract][Full Text] [Related]
4. Variable-wavelength frequency-domain terahertz ellipsometry.
Hofmann T; Herzinger CM; Boosalis A; Tiwald TE; Woollam JA; Schubert M
Rev Sci Instrum; 2010 Feb; 81(2):023101. PubMed ID: 20192479
[TBL] [Abstract][Full Text] [Related]
5. Investigation of ellipsometric parameters of 2D microrough surfaces by FDTD.
Qiu J; Ran DF; Liu YB; Liu LH
Appl Opt; 2016 Jul; 55(20):5423-31. PubMed ID: 27409321
[TBL] [Abstract][Full Text] [Related]
6. Contact angle hysteresis: study by dynamic cycling contact angle measurements and variable angle spectroscopic ellipsometry on polyimide.
Hennig A; Eichhorn KJ; Staudinger U; Sahre K; Rogalli M; Stamm M; Neumann AW; Grundke K
Langmuir; 2004 Aug; 20(16):6685-91. PubMed ID: 15274573
[TBL] [Abstract][Full Text] [Related]
7. Principal angle spectroscopic ellipsometry utilizing a rotating analyzer.
Chandler-Horowitz D; Candela GA
Appl Opt; 1982 Aug; 21(16):2972-7. PubMed ID: 20396159
[TBL] [Abstract][Full Text] [Related]
8. Surface characterization of feldspathic ceramic using ATR FT-IR and ellipsometry after various silanization protocols.
Queiroz JR; Benetti P; Ozcan M; de Oliveira LF; Della Bona A; Takahashi FE; Bottino MA
Dent Mater; 2012 Feb; 28(2):189-96. PubMed ID: 22035984
[TBL] [Abstract][Full Text] [Related]
9. Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.
Azzam RM; Elshazly-Zaghloul M; Bashara NM
Appl Opt; 1975 Jul; 14(7):1652-63. PubMed ID: 20154886
[TBL] [Abstract][Full Text] [Related]
10. Light scattering from multilayer optics: comparison of theory and experiment.
Elson JM; Rahn JP; Bennett JM
Appl Opt; 1980 Mar; 19(5):669-79. PubMed ID: 20220916
[TBL] [Abstract][Full Text] [Related]
11. Ellipsometric view on reflection and scattering from optical blacks.
Nee SM
Appl Opt; 1992 Apr; 31(10):1549-56. PubMed ID: 20720789
[TBL] [Abstract][Full Text] [Related]
12. Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment.
Elson JM; Bennett JM; Stover JC
Appl Opt; 1993 Jul; 32(19):3362-76. PubMed ID: 20829955
[TBL] [Abstract][Full Text] [Related]
13. Applicability of the effective medium approximation in the ellipsometry of randomly micro-rough solid surfaces.
Liu Y; Qiu J; Liu L
Opt Express; 2018 Jun; 26(13):16560-16571. PubMed ID: 30119484
[TBL] [Abstract][Full Text] [Related]
14. Light scatter from polysilicon and aluminum surfaces and comparison with surface-roughness statistics by atomic force microscopy.
Bawolek EJ; Mohr JB; Hirleman ED; Majumdar A
Appl Opt; 1993 Jul; 32(19):3377-400. PubMed ID: 20829956
[TBL] [Abstract][Full Text] [Related]
15. Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching.
Mendoza-Galván A; Järrendahl K; Arwin H; Huang YF; Chen LC; Chen KH
Appl Opt; 2009 Sep; 48(26):4996-5004. PubMed ID: 19745863
[TBL] [Abstract][Full Text] [Related]
16. Detection of thin a-Si:H antireflective coatings on oxidized c-Si by resonant-detected spectroscopic ellipsometry.
Jans JC; Gemmink JW
Appl Opt; 1993 Jan; 32(1):84-90. PubMed ID: 20802665
[TBL] [Abstract][Full Text] [Related]
17. Polarization of specular reflection and near-specular scattering by a rough surface.
F Nee SM
Appl Opt; 1996 Jul; 35(19):3570. PubMed ID: 21102750
[TBL] [Abstract][Full Text] [Related]
18. Ordering of lipid A-monophosphate clusters in aqueous solutions.
Faunce CA; Reichelt H; Quitschau P; Paradies HH
J Chem Phys; 2007 Sep; 127(11):115103. PubMed ID: 17887884
[TBL] [Abstract][Full Text] [Related]
19. Soft x-ray scattering from rough surfaces: experimental and theoretical analysis.
Hogrefe H; Kunz C
Appl Opt; 1987 Jul; 26(14):2851-9. PubMed ID: 20489971
[TBL] [Abstract][Full Text] [Related]
20. Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer.
Chen LY; Feng XW; Su Y; Ma HZ; Qian YH
Appl Opt; 1994 Mar; 33(7):1299-305. PubMed ID: 20862155
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
