These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
307 related articles for article (PubMed ID: 20720703)
21. Determination of the refractive index and thickness of a thin film embedded in a given stratified medium. Chabrier G; Goudonnet JP; Vernier P Appl Opt; 1989 Jul; 28(14):2907-10. PubMed ID: 20555620 [TBL] [Abstract][Full Text] [Related]
22. Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film. Azzam RM; Sudradjat FF J Opt Soc Am A Opt Image Sci Vis; 2011 Jun; 28(6):1256-61. PubMed ID: 21643411 [TBL] [Abstract][Full Text] [Related]
23. Application of Fresnel diffraction from a phase step to the measurement of film thickness. Taghi Tavassoly M; Moaddel Haghighi I; Hassani K Appl Opt; 2009 Oct; 48(29):5497-501. PubMed ID: 19823232 [TBL] [Abstract][Full Text] [Related]
24. Refractive index determination using reflectance extrema. Horwitz CM Appl Opt; 1978 Jun; 17(11):1771-5. PubMed ID: 20198067 [TBL] [Abstract][Full Text] [Related]
25. Two-film reflection polarizers: theory and application. Ruiz-Urbieta M; Sparrow EM; Parikh PD Appl Opt; 1975 Feb; 14(2):486-92. PubMed ID: 20134910 [TBL] [Abstract][Full Text] [Related]
26. Bidirectional reflectance distribution function of Spectralon white reflectance standard illuminated by incoherent unpolarized and plane-polarized light. Bhandari A; Hamre B; Frette Ø; Zhao L; Stamnes JJ; Kildemo M Appl Opt; 2011 Jun; 50(16):2431-42. PubMed ID: 21629324 [TBL] [Abstract][Full Text] [Related]
27. Optical constants and Drude analysis of sputtered zirconium nitride films. Veszelei M; Andersson K; Ribbing CG; Järrendahl K; Arwin H Appl Opt; 1994 Apr; 33(10):1993-2001. PubMed ID: 20885535 [TBL] [Abstract][Full Text] [Related]
28. Geometrical optics in thin film light guides. Ulrich R; Martin RJ Appl Opt; 1971 Sep; 10(9):2077-85. PubMed ID: 20111273 [TBL] [Abstract][Full Text] [Related]
34. Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements. Peng C; Liang R; Erwin JK; Bletscher W; Nagata K; Mansuripur M Appl Opt; 2001 Oct; 40(28):5088-99. PubMed ID: 18364789 [TBL] [Abstract][Full Text] [Related]
35. Critical dimension measurement of transparent film layers by multispectral imaging. Kwon S; Kim N; Jo T; Pahk HJ Opt Express; 2014 Jul; 22(14):17370-81. PubMed ID: 25090550 [TBL] [Abstract][Full Text] [Related]
36. Optical properties of nanostructured TiO2 thin films and their application as antireflection coatings on infrared detectors. Jayasinghe RC; Perera AG; Zhu H; Zhao Y Opt Lett; 2012 Oct; 37(20):4302-4. PubMed ID: 23073444 [TBL] [Abstract][Full Text] [Related]
38. Refractive-index measurements of moderately reflecting substrates using a wedged film technique. Beauchamp WT; Rancourt JD Appl Opt; 1980 Sep; 19(18):3239-44. PubMed ID: 20234595 [TBL] [Abstract][Full Text] [Related]
39. Reflectance of an absorbing substrate for incident light of arbitrary polarization: appearance of a secondary maximum at oblique incidence. Azzam RM; El-Saba AM Appl Opt; 1988 Oct; 27(19):4034-7. PubMed ID: 20539511 [TBL] [Abstract][Full Text] [Related]
40. Broadband wide-angle antireflection enhancement in AZO/Si shell/core subwavelength grating structures with hydrophobic surface for Si-based solar cells. Leem JW; Song YM; Yu JS Opt Express; 2011 Sep; 19 Suppl 5():A1155-64. PubMed ID: 21935259 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]