235 related articles for article (PubMed ID: 20829573)
1. Customizable in situ TEM devices fabricated in freestanding membranes by focused ion beam milling.
Lei A; Petersen DH; Booth TJ; Homann LV; Kallesoe C; Sukas OS; Gyrsting Y; Molhave K; Boggild P
Nanotechnology; 2010 Oct; 21(40):405304. PubMed ID: 20829573
[TBL] [Abstract][Full Text] [Related]
2. Effect of molecular adsorption on the electrical conductance of single au nanowires fabricated by electron-beam lithography and focused ion beam etching.
Shi P; Zhang J; Lin HY; Bohn PW
Small; 2010 Nov; 6(22):2598-603. PubMed ID: 20957763
[TBL] [Abstract][Full Text] [Related]
3. Fabrication of nanopore array electrodes by focused ion beam milling.
Lanyon YH; De Marzi G; Watson YE; Quinn AJ; Gleeson JP; Redmond G; Arrigan DW
Anal Chem; 2007 Apr; 79(8):3048-55. PubMed ID: 17370998
[TBL] [Abstract][Full Text] [Related]
4. Enabling electromechanical transduction in silicon nanowire mechanical resonators fabricated by focused ion beam implantation.
Llobet J; Sansa M; Gerbolés M; Mestres N; Arbiol J; Borrisé X; Pérez-Murano F
Nanotechnology; 2014 Apr; 25(13):135302. PubMed ID: 24595110
[TBL] [Abstract][Full Text] [Related]
5. Large-scale parallel arrays of silicon nanowires via block copolymer directed self-assembly.
Farrell RA; Kinahan NT; Hansel S; Stuen KO; Petkov N; Shaw MT; West LE; Djara V; Dunne RJ; Varona OG; Gleeson PG; Jung SJ; Kim HY; Koleśnik MM; Lutz T; Murray CP; Holmes JD; Nealey PF; Duesberg GS; Krstić V; Morris MA
Nanoscale; 2012 May; 4(10):3228-36. PubMed ID: 22481430
[TBL] [Abstract][Full Text] [Related]
6. Focused-ion-beam-inflicted surface amorphization and gallium implantation--new insights and removal by focused-electron-beam-induced etching.
Roediger P; Wanzenboeck HD; Waid S; Hochleitner G; Bertagnolli E
Nanotechnology; 2011 Jun; 22(23):235302. PubMed ID: 21474869
[TBL] [Abstract][Full Text] [Related]
7. Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled semiconductor devices.
Twitchett AC; Dunin-Borkowski RE; Hallifax RJ; Broom RF; Midgley PA
J Microsc; 2004 Jun; 214(Pt 3):287-96. PubMed ID: 15157196
[TBL] [Abstract][Full Text] [Related]
8. Structural and magnetic characterization of batch-fabricated nickel encapsulated multi-walled carbon nanotubes.
Zeeshan MA; Shou K; Pané S; Pellicer E; Sort J; Sivaraman KM; Baró MD; Nelson BJ
Nanotechnology; 2011 Jul; 22(27):275713. PubMed ID: 21606563
[TBL] [Abstract][Full Text] [Related]
9. In situ fabrication and graphitization of amorphous carbon nanowires and their electrical properties.
Jin CH; Wang JY; Chen Q; Peng LM
J Phys Chem B; 2006 Mar; 110(11):5423-8. PubMed ID: 16539478
[TBL] [Abstract][Full Text] [Related]
10. Helium ion beam milling to create a nano-structured domain wall magnetoresistance spin valve.
Wang Y; Boden SA; Bagnall DM; Rutt HN; de Groot CH
Nanotechnology; 2012 Oct; 23(39):395302. PubMed ID: 22972003
[TBL] [Abstract][Full Text] [Related]
11. Dopant mapping in thin FIB prepared silicon samples by Off-Axis Electron Holography.
Pantzer A; Vakahy A; Eliyahou Z; Levi G; Horvitz D; Kohn A
Ultramicroscopy; 2014 Mar; 138():36-45. PubMed ID: 24486529
[TBL] [Abstract][Full Text] [Related]
12. The focused ion beam fold-out: sample preparation method for transmission electron microscopy.
Floresca HC; Jeon J; Wang JG; Kim MJ
Microsc Microanal; 2009 Dec; 15(6):558-63. PubMed ID: 19804654
[TBL] [Abstract][Full Text] [Related]
13. The fabrication of silicon nanostructures by focused-ion-beam implantation and TMAH wet etching.
Sievilä P; Chekurov N; Tittonen I
Nanotechnology; 2010 Apr; 21(14):145301. PubMed ID: 20215652
[TBL] [Abstract][Full Text] [Related]
14. Real-time transmission electron microscope observation of gold nanoclusters diffusing into silicon at room temperature.
Ishida T; Nakajima Y; Endo J; Collard D; Fujita H
Nanotechnology; 2009 Feb; 20(6):065705. PubMed ID: 19417399
[TBL] [Abstract][Full Text] [Related]
15. Probing the local temperature by in situ electron microscopy on a heated Si(3)N(4) membrane.
Reguer A; Bedu F; Nitsche S; Chaudanson D; Detailleur B; Dallaporta H
Ultramicroscopy; 2009 Dec; 110(1):61-6. PubMed ID: 19828252
[TBL] [Abstract][Full Text] [Related]
16. Combining Ar ion milling with FIB lift-out techniques to prepare high quality site-specific TEM samples.
Huang Z
J Microsc; 2004 Sep; 215(Pt 3):219-23. PubMed ID: 15312185
[TBL] [Abstract][Full Text] [Related]
17. Fabrication of a TEM sample of ion-irradiated material using focused ion beam microprocessing and low-energy Ar ion milling.
Jin HH; Shin C; Kwon J
J Electron Microsc (Tokyo); 2010; 59(6):463-8. PubMed ID: 20484144
[TBL] [Abstract][Full Text] [Related]
18. FIB-SEM cathodoluminescence tomography: practical and theoretical considerations.
De Winter DA; Lebbink MN; Wiggers De Vries DF; Post JA; Drury MR
J Microsc; 2011 Sep; 243(3):315-26. PubMed ID: 21692799
[TBL] [Abstract][Full Text] [Related]
19. Three-terminal electric transport measurements on gold nano-particles combined with ex situ TEM inspection.
Gao B; Osorio EA; Babaei Gaven K; van der Zant HS
Nanotechnology; 2009 Oct; 20(41):415207. PubMed ID: 19762943
[TBL] [Abstract][Full Text] [Related]
20. Focussed ion beam machined cantilever aperture probes for near-field optical imaging.
Jin EX; Xu X
J Microsc; 2008 Mar; 229(Pt 3):503-11. PubMed ID: 18331502
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]