147 related articles for article (PubMed ID: 20829956)
1. Light scatter from polysilicon and aluminum surfaces and comparison with surface-roughness statistics by atomic force microscopy.
Bawolek EJ; Mohr JB; Hirleman ED; Majumdar A
Appl Opt; 1993 Jul; 32(19):3377-400. PubMed ID: 20829956
[TBL] [Abstract][Full Text] [Related]
2. Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniques.
Jacobson RD; Wilson SR; Al-Jumaily GA; McNeil JR; Bennett JM; Mattsson L
Appl Opt; 1992 Apr; 31(10):1426-35. PubMed ID: 20720774
[TBL] [Abstract][Full Text] [Related]
3. Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometer.
Bennett JM
Appl Opt; 1976 Nov; 15(11):2705-21. PubMed ID: 20165479
[TBL] [Abstract][Full Text] [Related]
4. Light scattering from fused polycrystalline aluminum oxide surfaces.
Hensler DH
Appl Opt; 1972 Nov; 11(11):2522-8. PubMed ID: 20119367
[TBL] [Abstract][Full Text] [Related]
5. Residual surface roughness of diamond-turned optics.
Church EL; Zavada JM
Appl Opt; 1975 Aug; 14(8):1788-95. PubMed ID: 20154921
[TBL] [Abstract][Full Text] [Related]
6. Roughness measurements of Si and Al by variable angle spectroscopic ellipsometry.
Blanco JR; McMarr PJ
Appl Opt; 1991 Aug; 30(22):3210-20. PubMed ID: 20706377
[TBL] [Abstract][Full Text] [Related]
7. Far-ultraviolet reflectance measurements and optical constants of unoxidized aluminum films.
Larruquert JI; Méndez JA; Aznárez JA
Appl Opt; 1995 Aug; 34(22):4892-9. PubMed ID: 21052330
[TBL] [Abstract][Full Text] [Related]
8. Application of atomic force microscopy to the study of natural and model soil particles.
Cheng S; Bryant R; Doerr SH; Rhodri Williams P; Wright CJ
J Microsc; 2008 Sep; 231(3):384-94. PubMed ID: 18754993
[TBL] [Abstract][Full Text] [Related]
9. Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components.
Duparré A; Ferre-Borrull J; Gliech S; Notni G; Steinert J; Bennett JM
Appl Opt; 2002 Jan; 41(1):154-71. PubMed ID: 11900432
[TBL] [Abstract][Full Text] [Related]
10. Light scattering from glossy coatings on paper.
Lettieri TR; Marx E; Song JF; Vorburger TV
Appl Opt; 1991 Oct; 30(30):4439-47. PubMed ID: 20717222
[TBL] [Abstract][Full Text] [Related]
11. Light scattering signatures of individual spheres on optically smooth conducting surfaces.
Weber DC; Hirleman ED
Appl Opt; 1988 Oct; 27(19):4019-26. PubMed ID: 20539509
[TBL] [Abstract][Full Text] [Related]
12. Regimes of surface roughness measurable with light scattering.
Vorburger TV; Marx E; Lettieri TR
Appl Opt; 1993 Jul; 32(19):3401-8. PubMed ID: 20829957
[TBL] [Abstract][Full Text] [Related]
13. Scanning white-light interferometry as a novel technique to quantify the surface roughness of micron-sized particles for inhalation.
Adi S; Adi H; Chan HK; Young PM; Traini D; Yang R; Yu A
Langmuir; 2008 Oct; 24(19):11307-12. PubMed ID: 18759384
[TBL] [Abstract][Full Text] [Related]
14. Optical characteristics of atomic force microscopy tips for single-molecule fluorescence applications.
Gaiduk A; Kühnemuth R; Antonik M; Seidel CA
Chemphyschem; 2005 May; 6(5):976-83. PubMed ID: 15884085
[TBL] [Abstract][Full Text] [Related]
15. Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment.
Elson JM; Bennett JM; Stover JC
Appl Opt; 1993 Jul; 32(19):3362-76. PubMed ID: 20829955
[TBL] [Abstract][Full Text] [Related]
16. Optical constants of aluminum films in the extreme ultraviolet interval of 82-77 nm.
Larruquert JI; Méndez JA; Aznárez JA
Appl Opt; 1996 Oct; 35(28):5692-7. PubMed ID: 21127577
[TBL] [Abstract][Full Text] [Related]
17. Multiscale roughness in optical multilayers: atomic force microscopy and light scattering.
Deumié C; Richier R; Dumas P; Amra C
Appl Opt; 1996 Oct; 35(28):5583-94. PubMed ID: 21127561
[TBL] [Abstract][Full Text] [Related]
18. The role of few-asperity contacts in adhesion.
Thoreson EJ; Martin J; Burnham NA
J Colloid Interface Sci; 2006 Jun; 298(1):94-101. PubMed ID: 16376923
[TBL] [Abstract][Full Text] [Related]
19. Modeling of light scattering in different regimes of surface roughness.
Schröder S; Duparré A; Coriand L; Tünnermann A; Penalver DH; Harvey JE
Opt Express; 2011 May; 19(10):9820-35. PubMed ID: 21643239
[TBL] [Abstract][Full Text] [Related]
20. Angle-resolved scattering and reflectance of extreme-ultraviolet multilayer coatings: measurement and analysis.
Schröder S; Herffurth T; Trost M; Duparré A
Appl Opt; 2010 Mar; 49(9):1503-12. PubMed ID: 20300144
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]