217 related articles for article (PubMed ID: 20856477)
21. Optical functions of (x)GeO2:(1-x)SiO2 films determined by multi-sample and multi-angle spectroscopic ellipsometry.
Ho C; Pita K; Ngo NQ; Kam CH
Opt Express; 2005 Feb; 13(3):1049-54. PubMed ID: 19494969
[TBL] [Abstract][Full Text] [Related]
22. Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements.
Peng C; Liang R; Erwin JK; Bletscher W; Nagata K; Mansuripur M
Appl Opt; 2001 Oct; 40(28):5088-99. PubMed ID: 18364789
[TBL] [Abstract][Full Text] [Related]
23. Roughness measurements of Si and Al by variable angle spectroscopic ellipsometry.
Blanco JR; McMarr PJ
Appl Opt; 1991 Aug; 30(22):3210-20. PubMed ID: 20706377
[TBL] [Abstract][Full Text] [Related]
24. Determination of Optical Constants of Solgel-Derived Inhomogeneous TiO(2) Thin Films by Spectroscopic Ellipsometry and Transmission Spectroscopy.
Mosaddeq-Ur-Rahman M; Yu G; Krishna KM; Soga T; Watanabe J; Jimbo T; Umeno M
Appl Opt; 1998 Feb; 37(4):691-7. PubMed ID: 18268642
[TBL] [Abstract][Full Text] [Related]
25. Variable-wavelength frequency-domain terahertz ellipsometry.
Hofmann T; Herzinger CM; Boosalis A; Tiwald TE; Woollam JA; Schubert M
Rev Sci Instrum; 2010 Feb; 81(2):023101. PubMed ID: 20192479
[TBL] [Abstract][Full Text] [Related]
26. Binary silica optical fibers: refractive index and profile dispersion measurements.
Presby HM; Kaminow IP
Appl Opt; 1976 Dec; 15(12):3029-36. PubMed ID: 20168386
[TBL] [Abstract][Full Text] [Related]
27. Refractive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/transmittance ratio.
Diao J; Hess DW
J Phys Chem B; 2005 Jul; 109(26):12800-18. PubMed ID: 16852588
[TBL] [Abstract][Full Text] [Related]
28. Optimizing precision of fixed-polarizer, rotating-polarizer, sample, and fixed-analyzer spectroscopic ellipsometry.
Huang Z; Chu J
Appl Opt; 2000 Dec; 39(34):6390-5. PubMed ID: 18354652
[TBL] [Abstract][Full Text] [Related]
29. Combined ellipsometry and refractometry technique for characterisation of liquid crystal based nanocomposites.
Warenghem M; Henninot JF; Blach JF; Buchnev O; Kaczmarek M; Stchakovsky M
Rev Sci Instrum; 2012 Mar; 83(3):035103. PubMed ID: 22462956
[TBL] [Abstract][Full Text] [Related]
30. Optical constants and Drude analysis of sputtered zirconium nitride films.
Veszelei M; Andersson K; Ribbing CG; Järrendahl K; Arwin H
Appl Opt; 1994 Apr; 33(10):1993-2001. PubMed ID: 20885535
[TBL] [Abstract][Full Text] [Related]
31. Optical models for the characterization of silica nanosphere monolayers prepared by the Langmuir-Blodgett method using ellipsometry in the quasistatic regime.
Kozma P; Fodor B; Deak A; Petrik P
Langmuir; 2010 Oct; 26(20):16122-8. PubMed ID: 20849140
[TBL] [Abstract][Full Text] [Related]
32. Optical and electronic properties of native zinc oxide films on polycrystalline Zn.
Zuo J; Erbe A
Phys Chem Chem Phys; 2010 Oct; 12(37):11467-76. PubMed ID: 20676459
[TBL] [Abstract][Full Text] [Related]
33. Determination of (n,k) for absorbing thin films using reflectance measurements.
Siqueiros JM; Regalado LE; Machorro R
Appl Opt; 1988 Oct; 27(20):4260-4. PubMed ID: 20539554
[TBL] [Abstract][Full Text] [Related]
34. Studies on the Biotin-Avidin Multilayer Adsorption by Spectroscopic Ellipsometry.
Spaeth K; Brecht A; Gauglitz G
J Colloid Interface Sci; 1997 Dec; 196(2):128-135. PubMed ID: 9792738
[TBL] [Abstract][Full Text] [Related]
35. Method for determination of the parameters of transparent ultrathin films deposited on transparent substrates under conditions of low optical contrast.
Kostruba A; Stetsyshyn Y; Vlokh R
Appl Opt; 2015 Jul; 54(20):6208-16. PubMed ID: 26193395
[TBL] [Abstract][Full Text] [Related]
36. Transmission ellipsometry on transparent unbacked or embedded thin films with application to soap films in air.
Azzam RM
Appl Opt; 1991 Jul; 30(19):2801-6. PubMed ID: 20700278
[TBL] [Abstract][Full Text] [Related]
37. Dual-comb spectroscopic ellipsometry.
Minamikawa T; Hsieh YD; Shibuya K; Hase E; Kaneoka Y; Okubo S; Inaba H; Mizutani Y; Yamamoto H; Iwata T; Yasui T
Nat Commun; 2017 Sep; 8(1):610. PubMed ID: 28931818
[TBL] [Abstract][Full Text] [Related]
38. Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry.
Kim SH; Lee SH; Lim JI; Kim KH
Appl Opt; 2010 Feb; 49(5):910-4. PubMed ID: 20154761
[TBL] [Abstract][Full Text] [Related]
39. Spectroscopic ellipsometry of anisotropic materials: application to the optical constants of HgI2.
En Naciri A; Johann L; Kleim R; Sieskind M; Amann M
Appl Opt; 1999 Feb; 38(4):647-54. PubMed ID: 18305658
[TBL] [Abstract][Full Text] [Related]
40. Spectroscopic generalized ellipsometry based on fourier analysis.
En Naciri A; Johann L; Kleim R
Appl Opt; 1999 Aug; 38(22):4802-11. PubMed ID: 18323969
[TBL] [Abstract][Full Text] [Related]
[Previous] [Next] [New Search]