These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

80 related articles for article (PubMed ID: 20856560)

  • 21. High laser-resistant multilayer mirrors by nodular defect planarization [invited].
    Stolz CJ; Wolfe JE; Adams JJ; Menor MG; Teslich NE; Mirkarimi PB; Folta JA; Soufli R; Menoni CS; Patel D
    Appl Opt; 2014 Feb; 53(4):A291-6. PubMed ID: 24514230
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Stencil mask methodology for the parallelized production of microscale mechanical test samples.
    Shade PA; Kim SL; Wheeler R; Uchic MD
    Rev Sci Instrum; 2012 May; 83(5):053903. PubMed ID: 22667629
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Profile etching for prefiguring X-ray mirrors.
    Liu C; Qian J; Assoufid L
    J Synchrotron Radiat; 2015 Mar; 22(2):458-60. PubMed ID: 25723948
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Ion-assisted sputter deposition of molybdenum-silicon multilayers.
    Vernon SP; Stearns DG; Rosen RS
    Appl Opt; 1993 Dec; 32(34):6969-74. PubMed ID: 20856553
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Advances in Atom Probe Specimen Fabrication from Planar Multilayer Thin Film Structures.
    Larson DJ; Wissman BD; Martens RL; Viellieux RJ; Kelly TF; Gribb TT; Erskine HF; Tabat N
    Microsc Microanal; 2001 Jan; 7(1):24-31. PubMed ID: 11246400
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Multilayer x-ray mirror calibration by an energy dispersive method using an x-ray tube and a si(li) detector: absolute reflectivity, energy band pass, and overlapping order determination.
    Dhez P; Duval H; Malaurent JC
    J Xray Sci Technol; 1992 Jan; 3(3):176-93. PubMed ID: 21307559
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Enhanced broadband and omni-directional performance of polycrystalline Si solar cells by using discrete multilayer antireflection coatings.
    Oh SJ; Chhajed S; Poxson DJ; Cho J; Schubert EF; Tark SJ; Kim D; Kim JK
    Opt Express; 2013 Jan; 21 Suppl 1():A157-66. PubMed ID: 23389267
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Extreme Ultraviolet Multilayer Defect Compensation in Computational Lithography.
    Kim SK
    J Nanosci Nanotechnol; 2016 May; 16(5):5415-9. PubMed ID: 27483941
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Ga(+) beam lithography for nanoscale silicon reactive ion etching.
    Henry MD; Shearn MJ; Chhim B; Scherer A
    Nanotechnology; 2010 Jun; 21(24):245303. PubMed ID: 20484788
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Using colloid lithography to fabricate silicon nanopillar arrays on silicon substrates.
    Chen JK; Qui JQ; Fan SK; Kuo SW; Ko FH; Chu CW; Chang FC
    J Colloid Interface Sci; 2012 Feb; 367(1):40-8. PubMed ID: 22104277
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Colloidal lithography--the art of nanochemical patterning.
    Zhang G; Wang D
    Chem Asian J; 2009 Feb; 4(2):236-45. PubMed ID: 18988237
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Synchrotron radiation sources and condensers for projection x-ray lithography.
    Murphy JB; White DL; Macdowell AA; Wood Ii OR
    Appl Opt; 1993 Dec; 32(34):6920-9. PubMed ID: 20856546
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Patterned ion beam implantation of Co ions into a SiO2 thin film via ordered nanoporous alumina masks.
    Guan W; Ghatak J; Peng Y; Peng N; Jeynes C; Inkson B; Möbus G
    Nanotechnology; 2012 Feb; 23(4):045605. PubMed ID: 22222442
    [TBL] [Abstract][Full Text] [Related]  

  • 34. The role of the auxiliary atomic ion beam in C60(+)-Ar+ co-sputtering.
    Lin WC; Liu CP; Kuo CH; Chang HY; Chang CJ; Hsieh TH; Lee SH; You YW; Kao WL; Yen GJ; Huang CC; Shyue JJ
    Analyst; 2011 Mar; 136(5):941-6. PubMed ID: 21152650
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Design and fabrication of highly heat-resistant Mo/Si multilayer soft X-ray mirrors with interleaved barrier layers.
    Takenaka H; Ito H; Haga T; Kawamura T
    J Synchrotron Radiat; 1998 May; 5(Pt 3):708-10. PubMed ID: 15263627
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers.
    Pelizzo MG; Frassetto F; Nicolosi P; Giglia A; Mahne N; Nannarone S
    Appl Opt; 2006 Mar; 45(9):1985-92. PubMed ID: 16579569
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Low-radiation-damage multilayer coatings for the soft-x-ray region.
    Hunter WR; Seely JF
    Appl Opt; 1993 Sep; 32(25):4846-51. PubMed ID: 20830156
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Functional plasmonic antenna scanning probes fabricated by induced-deposition mask lithography.
    Weber-Bargioni A; Schwartzberg A; Schmidt M; Harteneck B; Ogletree DF; Schuck PJ; Cabrini S
    Nanotechnology; 2010 Feb; 21(6):065306. PubMed ID: 20061594
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Characterization of AZ PN114 resist for soft-x-ray projection lithography.
    Early K; Tennant DM; Jeon DY; Mulgrew PP; Macdowell AA; Wood Ii OR; Kubiak GD; Tichenor DA
    Appl Opt; 1993 Dec; 32(34):7044-9. PubMed ID: 20856565
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Monolithic formation of thin films on the vertical surface of a substrate by a dual-ion-beam sputtering technique.
    Uzawa Y; Niida S; Daibo M; Kokubun Y
    Appl Opt; 1996 Jul; 35(21):4128-32. PubMed ID: 21102819
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 4.