These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
5. Reflectance measurements and optical constants in the extreme ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg2Si, and InSb and of evaporated Cr. Larruquert JI; Keski-Kuha RA Appl Opt; 2000 Jun; 39(16):2772-81. PubMed ID: 18345201 [TBL] [Abstract][Full Text] [Related]
6. Performance, structure, and stability of SiC/Al multilayer films for extreme ultraviolet applications. Windt DL; Bellotti JA Appl Opt; 2009 Sep; 48(26):4932-41. PubMed ID: 19745857 [TBL] [Abstract][Full Text] [Related]
7. Grazing incidence reflectance of SiC films produced byplasma-assisted chemical vapor deposition. Keski-Kuha RA; Osantowski JF; Toft AR; Partlow WD Appl Opt; 1988 Apr; 27(8):1499-502. PubMed ID: 20531604 [TBL] [Abstract][Full Text] [Related]
8. Triple-wavelength, narrowband Mg/SiC multilayers with corrosion barriers and high peak reflectance in the 25-80 nm wavelength region. Fernández-Perea M; Soufli R; Robinson JC; Rodríguez-De Marcos L; Méndez JA; Larruquert JI; Gullikson EM Opt Express; 2012 Oct; 20(21):24018-29. PubMed ID: 23188369 [TBL] [Abstract][Full Text] [Related]
9. Electron-beam deposited boron coatings for the extreme ultraviolet. Vidal-Dasilva M; Fernández-Perea M; Méndez JA; Aznárez JA; Larruquert JI Appl Opt; 2008 Jun; 47(16):2926-30. PubMed ID: 18516108 [TBL] [Abstract][Full Text] [Related]
10. Self-consistent optical constants of SiC thin films. Larruquert JI; Pérez-Marín AP; García-Cortés S; Rodríguez-de Marcos L; Aznárez JA; Méndez JA J Opt Soc Am A Opt Image Sci Vis; 2011 Nov; 28(11):2340-5. PubMed ID: 22048302 [TBL] [Abstract][Full Text] [Related]
11. Effect of oxygen atom bombardment on the reflectance of silicon carbide mirrors in the extreme ultraviolet region. Seely JF; Holland GE; Hunter WR; McCoy RP; Dymond KF; Corson M Appl Opt; 1993 Apr; 32(10):1805-10. PubMed ID: 20820315 [TBL] [Abstract][Full Text] [Related]
12. Extreme-ultraviolet multilayer coatings with high spectral purity for solar imaging. Suman M; Pelizzo MG; Windt DL; Nicolosi P Appl Opt; 2009 Oct; 48(29):5432-7. PubMed ID: 19823222 [TBL] [Abstract][Full Text] [Related]
14. Effect of energetic electron and proton bombardment on the reflectance of silicon-carbide mirrors in the extreme-ultraviolet region. Holland GE; Seely JF; McCoy RP; Dymond KF; Rollins C; Corson M Appl Opt; 1994 Sep; 33(25):5902-5. PubMed ID: 20935995 [TBL] [Abstract][Full Text] [Related]
15. Multilayer coatings for narrow-band imaging in the extreme ultraviolet. Larruquert JI; Keski-Kuha RA Appl Opt; 2001 Mar; 40(7):1126-31. PubMed ID: 18357097 [TBL] [Abstract][Full Text] [Related]
16. Extreme ultraviolet polarizing optics using bare and aluminum-coated silicon carbide. Azzam RM; Kan'an AM Appl Opt; 1995 Oct; 34(28):6438-42. PubMed ID: 21060491 [TBL] [Abstract][Full Text] [Related]
17. In situ reflectance and optical constants of ion-beam-sputtered SiC films in the 58.4 to 149.2 nm region. Fernández-Perea M; Méndez JA; Aznárez JA; Larruquert JI Appl Opt; 2009 Aug; 48(24):4698-702. PubMed ID: 19696857 [TBL] [Abstract][Full Text] [Related]
18. Performance of high-density cast silicon carbide in the extreme ultraviolet. Keski-Kuha RA; Fleetwood CM; Robichaud J Appl Opt; 1997 Jul; 36(19):4409-10. PubMed ID: 18259229 [TBL] [Abstract][Full Text] [Related]
19. Mo/Si and Mo/Be multilayer thin films on Zerodur substrates for extreme-ultraviolet lithography. Mirkarimi PB; Bajt S; Wall MA Appl Opt; 2000 Apr; 39(10):1617-25. PubMed ID: 18345060 [TBL] [Abstract][Full Text] [Related]
20. Normal incidence reflectance of ion beam deposited SiC films in the EUV. Keski-Kuha RA; Osantowski JF; Herzig H; Gum JS; Toft AR Appl Opt; 1988 Jul; 27(14):2815-6. PubMed ID: 20531843 [No Abstract] [Full Text] [Related] [Next] [New Search]