340 related articles for article (PubMed ID: 20936019)
1. Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry.
Jellison GE; Boatner LA; Lowndes DH; McKee RA; Godbole M
Appl Opt; 1994 Sep; 33(25):6053-8. PubMed ID: 20936019
[TBL] [Abstract][Full Text] [Related]
2. Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry.
Gustin KM
Appl Opt; 1987 Sep; 26(18):3796-802. PubMed ID: 20490143
[TBL] [Abstract][Full Text] [Related]
3. Determination of the optical functions of transparent glasses by using spectroscopic ellipsometry.
Jellison GE; Sales BC
Appl Opt; 1991 Oct; 30(30):4310-5. PubMed ID: 20717201
[TBL] [Abstract][Full Text] [Related]
4. Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials.
Chindaudom P; Vedam K
Appl Opt; 1994 May; 33(13):2664-71. PubMed ID: 20885622
[TBL] [Abstract][Full Text] [Related]
5. Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements.
Cao J; Yanagihara M; Yamamoto M; Goto Y; Namioka T
Appl Opt; 1994 Apr; 33(10):2013-7. PubMed ID: 20885537
[TBL] [Abstract][Full Text] [Related]
6. Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films.
Lei DY; Kéna-Cohen S; Zou B; Petrov PK; Sonnefraud Y; Breeze J; Maier SA; Alford NM
Opt Express; 2012 Feb; 20(4):4419-27. PubMed ID: 22418201
[TBL] [Abstract][Full Text] [Related]
7. Optical properties of pentacene and perfluoropentacene thin films.
Hinderhofer A; Heinemeyer U; Gerlach A; Kowarik S; Jacobs RM; Sakamoto Y; Suzuki T; Schreiber F
J Chem Phys; 2007 Nov; 127(19):194705. PubMed ID: 18035896
[TBL] [Abstract][Full Text] [Related]
8. Growth evolution of laser-ablated Sr(2)FeMoO(6) nanostructured films: Effects of substrate-induced strain on the surface morphology and film quality.
Jalili H; Heinig NF; Leung KT
J Chem Phys; 2010 May; 132(20):204701. PubMed ID: 20515104
[TBL] [Abstract][Full Text] [Related]
9. Spectroscopic ellipsometry analysis of a thin film composite membrane consisting of polysulfone on a porous α-alumina support.
Ogieglo W; Wormeester H; Wessling M; Benes NE
ACS Appl Mater Interfaces; 2012 Feb; 4(2):935-43. PubMed ID: 22235899
[TBL] [Abstract][Full Text] [Related]
10. Dielectric polarization and refractive indices of ultrathin barium titanate films on strontium titanate single crystals.
Chaib H; Eng LM; Otto T
J Phys Condens Matter; 2005 Jan; 17(1):161-79. PubMed ID: 21690676
[TBL] [Abstract][Full Text] [Related]
11. Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.
Azzam RM; Elshazly-Zaghloul M; Bashara NM
Appl Opt; 1975 Jul; 14(7):1652-63. PubMed ID: 20154886
[TBL] [Abstract][Full Text] [Related]
12. Influence of the implantation profiles of Si(+) on the dielectric function and optical transitions in silicon nanocrystals.
En Naciri A; Mansour M; Johann L; Grob JJ; Rinnert H
J Chem Phys; 2008 Nov; 129(18):184701. PubMed ID: 19045417
[TBL] [Abstract][Full Text] [Related]
13. Determination of the optical constants of an inhomogeneous transparent LaF(3) thin film on a transparent substrate by spectroscopic ellipsometry.
Chindaudom P; Vedam K
Opt Lett; 1992 Apr; 17(7):538-40. PubMed ID: 19794551
[TBL] [Abstract][Full Text] [Related]
14. Optical constants of amorphous, transparent titanium-doped tungsten oxide thin films.
Ramana CV; Baghmar G; Rubio EJ; Hernandez MJ
ACS Appl Mater Interfaces; 2013 Jun; 5(11):4659-66. PubMed ID: 23682744
[TBL] [Abstract][Full Text] [Related]
15. Infrared interference coating by use of Si3N4 and SiO2 films with ion-assisted deposition.
Lee CC; Ku SL
Appl Opt; 2010 Jan; 49(3):437-41. PubMed ID: 20090808
[TBL] [Abstract][Full Text] [Related]
16. Microscopic thin film optical anisotropy imaging at the solid-liquid interface.
Miranda A; De Beule PA
Rev Sci Instrum; 2016 Apr; 87(4):043701. PubMed ID: 27131681
[TBL] [Abstract][Full Text] [Related]
17. Measurement of the refractive index and thickness for infrared optical films deposited on rough substrates.
Saito M; Nakamura S; Miyagi M
Appl Opt; 1992 Oct; 31(28):6139-44. PubMed ID: 20733820
[TBL] [Abstract][Full Text] [Related]
18. Thickness, surface morphology, and optical properties of porphyrin multilayer thin films assembled on Si(100) using copper(I)-catalyzed azide-alkyne cycloaddition.
Palomaki PK; Krawicz A; Dinolfo PH
Langmuir; 2011 Apr; 27(8):4613-22. PubMed ID: 21410232
[TBL] [Abstract][Full Text] [Related]
19. Ultrathin SrTiO(3) films: epitaxy and optical properties.
Tyunina M; Narkilahti J; Levoska J; Chvostova D; Dejneka A; Trepakov V; Zelezny V
J Phys Condens Matter; 2009 Jun; 21(23):232203. PubMed ID: 21825577
[TBL] [Abstract][Full Text] [Related]
20. Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffraction.
Gruenewald JH; Nichols J; Seo SS
Rev Sci Instrum; 2013 Apr; 84(4):043902. PubMed ID: 23635204
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]