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22. Observation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffraction. Eastman DE; Stagarescu CB; Xu G; Mooney PM; Jordan-Sweet JL; Lai B; Cai Z Phys Rev Lett; 2002 Apr; 88(15):156101. PubMed ID: 11955207 [TBL] [Abstract][Full Text] [Related]
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