401 related articles for article (PubMed ID: 21052243)
21. Application of thin-film interference coatings in infrared reflection spectroscopy of organic samples in contact with thin metal films.
Reithmeier M; Erbe A
Appl Opt; 2011 Mar; 50(9):C301-8. PubMed ID: 21460955
[TBL] [Abstract][Full Text] [Related]
22. [Determination of optical parameters in thin films by transmittance spectra].
Wang K; Jia HZ; Xia GZ
Guang Pu Xue Yu Guang Pu Fen Xi; 2008 Nov; 28(11):2713-6. PubMed ID: 19271525
[TBL] [Abstract][Full Text] [Related]
23. Simulated vibrational sum frequency generation from a multilayer thin film system with two active interfaces.
O'Brien DB; Massari AM
J Chem Phys; 2013 Apr; 138(15):154708. PubMed ID: 23614437
[TBL] [Abstract][Full Text] [Related]
24. Fabrication and optical properties of Pb(Mg(1/3)Nb(2/3))O(3)-PbTiO(3) thin films on Si substrates using the PLD method.
Shinozaki K; Hayashi S; Wakiya N; Kiguchi T; Tanaka J; Ishizawa N; Sato K; Kondo M; Kurihara K
IEEE Trans Ultrason Ferroelectr Freq Control; 2008 May; 55(5):1023-8. PubMed ID: 18519205
[TBL] [Abstract][Full Text] [Related]
25. Simulation and interpretation of 2D diffraction patterns from self-assembled nanostructured films at arbitrary angles of incidence: from grazing incidence (above the critical angle) to transmission perpendicular to the substrate.
Tate MP; Urade VN; Kowalski JD; Wei TC; Hamilton BD; Eggiman BW; Hillhouse HW
J Phys Chem B; 2006 May; 110(20):9882-92. PubMed ID: 16706443
[TBL] [Abstract][Full Text] [Related]
26. Dielectric interlayers for increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy.
Reithmeier M; Erbe A
Phys Chem Chem Phys; 2010 Nov; 12(44):14798-803. PubMed ID: 20941445
[TBL] [Abstract][Full Text] [Related]
27. Optical Properties of β-RDX Thin Films Deposited on Gold and Stainless Steel Substrates Calculated from Reflection-Absorption Infrared Spectra.
Ruiz-Caballero JL; Aparicio-Bolaño JA; Figueroa-Navedo AM; Pacheco-Londoño LC; Hernandez-Rivera SP
Appl Spectrosc; 2017 Aug; 71(8):1990-2000. PubMed ID: 28537428
[TBL] [Abstract][Full Text] [Related]
28. Measurement of the refractive index dispersion of As2Se3 bulk glass and thin films prior to and after laser irradiation and annealing using prism coupling in the near- and mid-infrared spectral range.
Carlie N; Anheier NC; Qiao HA; Bernacki B; Phillips MC; Petit L; Musgraves JD; Richardson K
Rev Sci Instrum; 2011 May; 82(5):053103. PubMed ID: 21639488
[TBL] [Abstract][Full Text] [Related]
29. Determination of refractive index and film thickness from interference fringes.
Harrick NJ
Appl Opt; 1971 Oct; 10(10):2344-9. PubMed ID: 20111327
[TBL] [Abstract][Full Text] [Related]
30. Thermally stable antireflective coatings based on nanoporous organosilicate thin films.
Kim S; Cho J; Char K
Langmuir; 2007 Jun; 23(12):6737-43. PubMed ID: 17477553
[TBL] [Abstract][Full Text] [Related]
31. Infrared reflection spectroscopy of thin films on highly oriented pyrolytic graphite.
Leitner T; Kattner J; Hoffmann H
Appl Spectrosc; 2003 Dec; 57(12):1502-9. PubMed ID: 14686772
[TBL] [Abstract][Full Text] [Related]
32. Constraint on the optical constants of a transparent film on an absorbing substrate for inversion of the ratio of complex p and s reflection coefficients at a given angle of incidence.
Azzam RM; Habli MA
Appl Opt; 1987 Nov; 26(22):4717-21. PubMed ID: 20523434
[TBL] [Abstract][Full Text] [Related]
33. Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,R(m)) technique.
Hjortsberg A
Appl Opt; 1981 Apr; 20(7):1254-63. PubMed ID: 20309294
[TBL] [Abstract][Full Text] [Related]
34. Derivation of optical constants of metals from thin-film measurements at oblique incidence.
Nestell JE; Christy RW
Appl Opt; 1972 Mar; 11(3):643-51. PubMed ID: 20111561
[TBL] [Abstract][Full Text] [Related]
35. [Stimulated emission characteristics of ZnO thin films deposited by magnetron sputtering on SiO2 substrates].
Jing W; Xi-qing Z; Xiao-ying T; De-ping X; Peng L; Li W; Shi-hua H
Guang Pu Xue Yu Guang Pu Fen Xi; 2004 Jul; 24(7):775-8. PubMed ID: 15766068
[TBL] [Abstract][Full Text] [Related]
36. Ferroelectric behavior in bismuth ferrite thin films of different thickness.
Wu J; Wang J; Xiao D; Zhu J
ACS Appl Mater Interfaces; 2011 Sep; 3(9):3261-3. PubMed ID: 21861505
[TBL] [Abstract][Full Text] [Related]
37. Errors in film refractive-index determinations from interference fringes.
Moore WJ
Appl Opt; 1994 Jul; 33(19):4164-6. PubMed ID: 20935768
[TBL] [Abstract][Full Text] [Related]
38. Phase transformation and disorder effect on optical and electrical properties of Zn3P2 thin films.
El Zawawi IK; Abdel Moez A; Hammad TR; Ibrahim RS
Spectrochim Acta A Mol Biomol Spectrosc; 2012 Aug; 94():378-83. PubMed ID: 22595250
[TBL] [Abstract][Full Text] [Related]
39. Determination of thickness and optical constants of solgel derived polyvinylpyrrolidone/ZrO2 films from transmission spectra using different dispersion models.
Jia H; Sun J; Xu Y; Wu D
Appl Opt; 2012 Oct; 51(29):6937-44. PubMed ID: 23052070
[TBL] [Abstract][Full Text] [Related]
40. Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only.
Corrales C; Ramírez-Malo JB; Fernández-Peña J; Villares P; Swanepoel R; Márquez E
Appl Opt; 1995 Dec; 34(34):7907-13. PubMed ID: 21068885
[TBL] [Abstract][Full Text] [Related]
[Previous] [Next] [New Search]
