164 related articles for article (PubMed ID: 21221159)
1. Spectroscopic null ellipsometer using a variable retarder.
Watkins LR; Shamailov SS
Appl Opt; 2011 Jan; 50(1):50-2. PubMed ID: 21221159
[TBL] [Abstract][Full Text] [Related]
2. Variable angle of incidence spectroscopic autocollimating ellipsometer.
Watkins LR; Shamailov SS
Appl Opt; 2010 Jun; 49(16):3231-4. PubMed ID: 20517395
[TBL] [Abstract][Full Text] [Related]
3. Spectroscopic ellipsometer based on direct measurement of polarization ellipticity.
Watkins LR
Appl Opt; 2011 Jun; 50(18):2973-8. PubMed ID: 21691363
[TBL] [Abstract][Full Text] [Related]
4. Automatic null ellipsometry with an interferometer.
Watkins LR
Appl Opt; 2009 Nov; 48(32):6277-80. PubMed ID: 19904328
[TBL] [Abstract][Full Text] [Related]
5. White-light ellipsometer with geometric phase shifter.
Watkins LR; Derbois M
Appl Opt; 2012 Jul; 51(21):5060-5. PubMed ID: 22858945
[TBL] [Abstract][Full Text] [Related]
6. Optimizing precision of rotating-analyzer and rotating-compensator ellipsometers.
Aspnes DE
J Opt Soc Am A Opt Image Sci Vis; 2004 Mar; 21(3):403-10. PubMed ID: 15005405
[TBL] [Abstract][Full Text] [Related]
7. Optimization of azimuth angle settings in polarizer-compensator-sample-analyzer off-null ellipsometry.
Wang G; Arwin H; Jansson R
Appl Opt; 2003 Jan; 42(1):38-44. PubMed ID: 12518821
[TBL] [Abstract][Full Text] [Related]
8. Calibration of the retardation inhomogeneity for the compensator-rotating imaging ellipsometer.
Jin L; Iizuka Y; Iwao T; Kondoh E; Uehara M; Gelloz B
Appl Opt; 2019 Nov; 58(33):9224-9229. PubMed ID: 31873601
[TBL] [Abstract][Full Text] [Related]
9. Real-time characterization of film growth on transparent substrates by rotating-compensator multichannel ellipsometry.
Lee J; Collins RW
Appl Opt; 1998 Jul; 37(19):4230-8. PubMed ID: 18285868
[TBL] [Abstract][Full Text] [Related]
10. Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer.
Chen LY; Feng XW; Su Y; Ma HZ; Qian YH
Appl Opt; 1994 Mar; 33(7):1299-305. PubMed ID: 20862155
[TBL] [Abstract][Full Text] [Related]
11. Real time in situ ellipsometric and gravimetric monitoring for electrochemistry experiments.
Broch L; Johann L; Stein N; Zimmer A; Beck R
Rev Sci Instrum; 2007 Jun; 78(6):064101. PubMed ID: 17614627
[TBL] [Abstract][Full Text] [Related]
12. Principal angle spectroscopic ellipsometry utilizing a rotating analyzer.
Chandler-Horowitz D; Candela GA
Appl Opt; 1982 Aug; 21(16):2972-7. PubMed ID: 20396159
[TBL] [Abstract][Full Text] [Related]
13. Ellipsometric measurement of the Kerr magnetooptic effect.
Minden HT
Appl Opt; 1979 Mar; 18(6):813-7. PubMed ID: 20208827
[TBL] [Abstract][Full Text] [Related]
14. Null ellipsometer with phase modulation.
Postava K; Maziewski A; Yamaguchi T; Ossikovski R; Visnovsky S; Pistora J
Opt Express; 2004 Nov; 12(24):6040-5. PubMed ID: 19488245
[TBL] [Abstract][Full Text] [Related]
15. Beam deviation errors in ellipsometric measurements; an analysis.
Zeidler JR; Kohles RB; Bashara NM
Appl Opt; 1974 Aug; 13(8):1938-45. PubMed ID: 20134599
[TBL] [Abstract][Full Text] [Related]
16. Ellipsometer nulling: convergence and speed.
Confer DL; Azzam RM; Bashara NM
Appl Opt; 1976 Oct; 15(10):2568-75. PubMed ID: 20165437
[TBL] [Abstract][Full Text] [Related]
17. Optimizing precision of fixed-polarizer, rotating-polarizer, sample, and fixed-analyzer spectroscopic ellipsometry.
Huang Z; Chu J
Appl Opt; 2000 Dec; 39(34):6390-5. PubMed ID: 18354652
[TBL] [Abstract][Full Text] [Related]
18. In process ellipsometer azimuth angle calibration.
Adams JR; Bashara NM
Appl Opt; 1976 Dec; 15(12):3179-84. PubMed ID: 20168410
[TBL] [Abstract][Full Text] [Related]
19. Transmittance ratio of a compensator.
Kothiyal MP
Appl Opt; 1975 Dec; 14(12):2935-9. PubMed ID: 20155135
[TBL] [Abstract][Full Text] [Related]
20. Spectroscopic generalized ellipsometry based on fourier analysis.
En Naciri A; Johann L; Kleim R
Appl Opt; 1999 Aug; 38(22):4802-11. PubMed ID: 18323969
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]