These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

176 related articles for article (PubMed ID: 21247698)

  • 1. Shaping the lens of the atom probe: fabrication of site specific, oriented specimens and application to grain boundary analysis.
    Felfer P; Ringer SP; Cairney JM
    Ultramicroscopy; 2011 May; 111(6):435-9. PubMed ID: 21247698
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary.
    Pérez-Willard F; Wolde-Giorgis D; Al-Kassab T; López GA; Mittemeijer EJ; Kirchheim R; Gerthsen D
    Micron; 2008; 39(1):45-52. PubMed ID: 17331735
    [TBL] [Abstract][Full Text] [Related]  

  • 3. A reproducible method for damage-free site-specific preparation of atom probe tips from interfaces.
    Felfer PJ; Alam T; Ringer SP; Cairney JM
    Microsc Res Tech; 2012 Apr; 75(4):484-91. PubMed ID: 21956865
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Grain boundary study of technically pure molybdenum by combining APT and TKD.
    Babinsky K; Knabl W; Lorich A; De Kloe R; Clemens H; Primig S
    Ultramicroscopy; 2015 Dec; 159 Pt 2():445-51. PubMed ID: 26025208
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Site-specific atomic scale analysis of solute segregation to a coincidence site lattice grain boundary.
    Taheri ML; Sebastian JT; Reed BW; Seidman DN; Rollett AD
    Ultramicroscopy; 2010 Mar; 110(4):278-84. PubMed ID: 20097006
    [TBL] [Abstract][Full Text] [Related]  

  • 6. A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.
    Babinsky K; De Kloe R; Clemens H; Primig S
    Ultramicroscopy; 2014 Sep; 144():9-18. PubMed ID: 24815026
    [TBL] [Abstract][Full Text] [Related]  

  • 7. In situ site-specific specimen preparation for atom probe tomography.
    Thompson K; Lawrence D; Larson DJ; Olson JD; Kelly TF; Gorman B
    Ultramicroscopy; 2007; 107(2-3):131-9. PubMed ID: 16938398
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Development of atom probe specimen preparation techniques for specific regions in steel materials.
    Takahashi J; Kawakami K; Yamaguchi Y; Sugiyama M
    Ultramicroscopy; 2007 Sep; 107(9):744-9. PubMed ID: 17391850
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Multi-scale characterization by FIB-SEM/TEM/3DAP.
    Ohkubo T; Sepehri-Amin H; Sasaki TT; Hono K
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i6-i7. PubMed ID: 25359845
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features.
    Hartshorne MI; Isheim D; Seidman DN; Taheri ML
    Ultramicroscopy; 2014 Dec; 147():25-32. PubMed ID: 24976357
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Broadening the applications of the atom probe technique by ultraviolet femtosecond laser.
    Hono K; Ohkubo T; Chen YM; Kodzuka M; Oh-ishi K; Sepehri-Amin H; Li F; Kinno T; Tomiya S; Kanitani Y
    Ultramicroscopy; 2011 May; 111(6):576-83. PubMed ID: 21177036
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Atom probe specimen preparation with a dual beam SEM/FIB miller.
    Miller MK; Russell KF
    Ultramicroscopy; 2007 Sep; 107(9):761-6. PubMed ID: 17403581
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique.
    Choi PP; Kwon YS; Kim JS; Al-Kassab T
    J Electron Microsc (Tokyo); 2007 Apr; 56(2):43-9. PubMed ID: 17928320
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Effect of gallium focused ion beam milling on preparation of aluminium thin foils.
    Unocic KA; Mills MJ; Daehn GS
    J Microsc; 2010 Dec; 240(3):227-38. PubMed ID: 21077883
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Fabrication and characterization of APT specimens from high dose heavy ion irradiated materials.
    Miller MK; Zhang Y
    Ultramicroscopy; 2011 May; 111(6):672-5. PubMed ID: 21277681
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Strategies for fabricating atom probe specimens with a dual beam FIB.
    Miller MK; Russell KF; Thompson GB
    Ultramicroscopy; 2005 Mar; 102(4):287-98. PubMed ID: 15694675
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Advances in Atom Probe Specimen Fabrication from Planar Multilayer Thin Film Structures.
    Larson DJ; Wissman BD; Martens RL; Viellieux RJ; Kelly TF; Gribb TT; Erskine HF; Tabat N
    Microsc Microanal; 2001 Jan; 7(1):24-31. PubMed ID: 11246400
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders.
    Choi PP; Al-Kassab T; Kwon YS; Kim JS; Kirchheim R
    Microsc Microanal; 2007 Oct; 13(5):347-53. PubMed ID: 17900385
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Sample preparation for atomic-resolution STEM at low voltages by FIB.
    Schaffer M; Schaffer B; Ramasse Q
    Ultramicroscopy; 2012 Mar; 114():62-71. PubMed ID: 22356790
    [TBL] [Abstract][Full Text] [Related]  

  • 20. New approach for FIB-preparation of atom probe specimens for aluminum alloys.
    Lilensten L; Gault B
    PLoS One; 2020; 15(4):e0231179. PubMed ID: 32240256
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.