These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

174 related articles for article (PubMed ID: 21673783)

  • 1. Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials.
    Adamson P
    Appl Opt; 2011 Jun; 50(17):2773-83. PubMed ID: 21673783
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry.
    Adamson P
    Appl Opt; 2009 Nov; 48(31):5906-16. PubMed ID: 19881659
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Analytic determination of n, k and d of two-dimensional materials by ellipsometry and reflectivity.
    Adamson P
    Appl Opt; 2014 Jul; 53(21):4804-10. PubMed ID: 25090221
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Reflectance calculations of anisotropic dielectric constants of graphene-like two-dimensional materials.
    Adamson P
    Appl Opt; 2017 Oct; 56(28):7832-7840. PubMed ID: 29047767
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Method for determination of the parameters of transparent ultrathin films deposited on transparent substrates under conditions of low optical contrast.
    Kostruba A; Stetsyshyn Y; Vlokh R
    Appl Opt; 2015 Jul; 54(20):6208-16. PubMed ID: 26193395
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,R(m)) technique.
    Hjortsberg A
    Appl Opt; 1981 Apr; 20(7):1254-63. PubMed ID: 20309294
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Shadow-angle method for anisotropic and weakly absorbing films.
    Surdutovich G; Vitlina R; Baranauskas V
    Appl Opt; 1999 Jul; 38(19):4164-71. PubMed ID: 18323897
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements.
    Cao J; Yanagihara M; Yamamoto M; Goto Y; Namioka T
    Appl Opt; 1994 Apr; 33(10):2013-7. PubMed ID: 20885537
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Determination of anisotropic optical constants and surface coverage of molecular films using polarized visible ATR spectroscopy. Application to adsorbed cytochrome c films.
    Runge AF; Rasmussen NC; Saavedra SS; Mendes SB
    J Phys Chem B; 2005 Jan; 109(1):424-31. PubMed ID: 16851032
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Refractive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/transmittance ratio.
    Diao J; Hess DW
    J Phys Chem B; 2005 Jul; 109(26):12800-18. PubMed ID: 16852588
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Constraint on the optical constants of a transparent film on an absorbing substrate for inversion of the ratio of complex p and s reflection coefficients at a given angle of incidence.
    Azzam RM; Habli MA
    Appl Opt; 1987 Nov; 26(22):4717-21. PubMed ID: 20523434
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Quasi-isotropic analysis of anisotropic thin films on optical waveguides.
    Horvath R; Ramsden JJ
    Langmuir; 2007 Aug; 23(18):9330-4. PubMed ID: 17683152
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Computational method for determining n and k for a thin film from the measured reflectance, transmittance, and film thickness.
    Bennett JM; Booty MJ
    Appl Opt; 1966 Jan; 5(1):41-3. PubMed ID: 20048783
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Determination of (n,k) for absorbing thin films using reflectance measurements.
    Siqueiros JM; Regalado LE; Machorro R
    Appl Opt; 1988 Oct; 27(20):4260-4. PubMed ID: 20539554
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Two-film reflection polarizers: theory and application.
    Ruiz-Urbieta M; Sparrow EM; Parikh PD
    Appl Opt; 1975 Feb; 14(2):486-92. PubMed ID: 20134910
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Transmission ellipsometry on transparent unbacked or embedded thin films with application to soap films in air.
    Azzam RM
    Appl Opt; 1991 Jul; 30(19):2801-6. PubMed ID: 20700278
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Numerical inverse method of determining film parameters of uniaxial anisotropic film with an ellipsometer.
    Zhu R; Lin C; Wei Y
    Appl Opt; 1992 Aug; 31(22):4497-500. PubMed ID: 20725447
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range.
    Diao J; Hess DW
    J Phys Chem B; 2005 Jul; 109(26):12819-25. PubMed ID: 16852589
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Anisotropic reflectance from turbid media. I. Theory.
    Neuman M; Edström P
    J Opt Soc Am A Opt Image Sci Vis; 2010 May; 27(5):1032-9. PubMed ID: 20448769
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Templating α-helical poly(L-lysine)/polyanion complexes by nanostructured uniaxially oriented ultrathin polyethylene films.
    Keller TF; Müller M; Ouyang W; Zhang JT; Jandt KD
    Langmuir; 2010 Dec; 26(24):18893-901. PubMed ID: 21090783
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.