These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

133 related articles for article (PubMed ID: 21694344)

  • 1. Characterization of oxide films by MeV ion beam techniques.
    Döbeli M
    J Phys Condens Matter; 2008 Jul; 20(26):264010. PubMed ID: 21694344
    [TBL] [Abstract][Full Text] [Related]  

  • 2. High resolution depth profile analysis by elastic recoil detection with heavy ions.
    Dollinger G; Bergmaier A; Faestermann T; Frey CM
    Anal Bioanal Chem; 1995 Oct; 353(3-4):311-5. PubMed ID: 15048488
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry.
    Jeynes C; Barradas NP; Szilágyi E
    Anal Chem; 2012 Jul; 84(14):6061-9. PubMed ID: 22681761
    [TBL] [Abstract][Full Text] [Related]  

  • 4. 4He+ ion beam irradiation induced modification of poly(dimethylsiloxane). Characterization by infrared spectroscopy and ion beam analytical techniques.
    Huszank R; Szikra D; Simon A; Szilasi SZ; Nagy IP
    Langmuir; 2011 Apr; 27(7):3842-8. PubMed ID: 21401060
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques.
    Bhaskaran M; Sriram S; Holland AS; Evans PJ
    Micron; 2009 Jan; 40(1):99-103. PubMed ID: 18276146
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Thin film depth profiling by ion beam analysis.
    Jeynes C; Colaux JL
    Analyst; 2016 Oct; 141(21):5944-5985. PubMed ID: 27747322
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Graphene oxide layers modified by light energetic ions.
    Malinský P; Macková A; Mikšová R; Kováčiková H; Cutroneo M; Luxa J; Bouša D; Štrochová B; Sofer Z
    Phys Chem Chem Phys; 2017 Apr; 19(16):10282-10291. PubMed ID: 28379227
    [TBL] [Abstract][Full Text] [Related]  

  • 8. The application of ion beam analysis to calcium phosphate-based biomaterials.
    Russell SW; Alford TL; Luptak KA; Pizziconi VB; Mayer JW
    J Biomed Mater Res; 1996 Feb; 30(2):165-74. PubMed ID: 9019480
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Non-destructive 3D-characterization of Zn 2-2x Cu x In x S 2-thin films with ion beam analysis.
    Spemann D; Vogt J; Butz T; Oppermann D; Bente K
    Anal Bioanal Chem; 2002 Oct; 374(4):626-30. PubMed ID: 12397481
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Ion-assisted deposition of lanthanum fluoride thin films.
    Targove JD; Lehan JP; Lingg LJ; Macleod HA; Leavitt JA; McIntyre LC
    Appl Opt; 1987 Sep; 26(17):3733-7. PubMed ID: 20490131
    [TBL] [Abstract][Full Text] [Related]  

  • 11. New beam line for time-of-flight medium energy ion scattering with large area position sensitive detector.
    Linnarsson MK; Hallén A; Åström J; Primetzhofer D; Legendre S; Possnert G
    Rev Sci Instrum; 2012 Sep; 83(9):095107. PubMed ID: 23020419
    [TBL] [Abstract][Full Text] [Related]  

  • 12. An experiment on the dynamics of ion implantation and sputtering of surfaces.
    Wright GM; Barnard HA; Kesler LA; Peterson EE; Stahle PW; Sullivan RM; Whyte DG; Woller KB
    Rev Sci Instrum; 2014 Feb; 85(2):023503. PubMed ID: 24593357
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films.
    Abou-Ras D; Caballero R; Fischer CH; Kaufmann CA; Lauermann I; Mainz R; Mönig H; Schöpke A; Stephan C; Streeck C; Schorr S; Eicke A; Döbeli M; Gade B; Hinrichs J; Nunney T; Dijkstra H; Hoffmann V; Klemm D; Efimova V; Bergmaier A; Dollinger G; Wirth T; Unger W; Rockett AA; Perez-Rodriguez A; Alvarez-Garcia J; Izquierdo-Roca V; Schmid T; Choi PP; Müller M; Bertram F; Christen J; Khatri H; Collins RW; Marsillac S; Kötschau I
    Microsc Microanal; 2011 Oct; 17(5):728-51. PubMed ID: 21906418
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Elastic Recoil Detection Analysis of FeN thin films.
    Dhunna R; Jain IP; Sahajwalla V
    Appl Radiat Isot; 2012 Oct; 70(10):2416-20. PubMed ID: 22871447
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.
    Shard AG; Green FM; Brewer PJ; Seah MP; Gilmore IS
    J Phys Chem B; 2008 Mar; 112(9):2596-605. PubMed ID: 18254619
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Analysis of structural distribution of nitrogen-incorporated species at the interface of silicon oxide films on silicon using time-of-flight secondary ion mass spectrometry and poisson approximation.
    Chiba K
    Anal Chem; 2008 Aug; 80(16):6286-92. PubMed ID: 18642880
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry.
    Wagner MS
    Anal Chem; 2005 Feb; 77(3):911-22. PubMed ID: 15679361
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Nuclear microprobe: a microanalytical technique in biology.
    Moretto P
    Cell Mol Biol (Noisy-le-grand); 1996 Feb; 42(1):1-16. PubMed ID: 8833662
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Compositional and Structural Modifications by Ion Beam in Graphene Oxide for Radiation Detection Studies.
    Cutroneo M; Torrisi L; Silipigni L; Michalcova A; Havranek V; Mackova A; Malinsky P; Lavrentiev V; Noga P; Dobrovodsky J; Slepicka P; Fajstavr D; Andò L; Holy V
    Int J Mol Sci; 2022 Oct; 23(20):. PubMed ID: 36293417
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Determining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopy.
    Ridings C; Andersson GG
    Rev Sci Instrum; 2010 Nov; 81(11):113907. PubMed ID: 21133486
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.