These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
85 related articles for article (PubMed ID: 21730551)
1. Real-time detection of linear and angular displacements with a modified DVD optical head. Hwu ET; Hung SK; Yang CW; Huang KY; Hwang IS Nanotechnology; 2008 Mar; 19(11):115501. PubMed ID: 21730551 [TBL] [Abstract][Full Text] [Related]
2. Anti-drift and auto-alignment mechanism for an astigmatic atomic force microscope system based on a digital versatile disk optical head. Hwu ET; Illers H; Wang WM; Hwang IS; Jusko L; Danzebrink HU Rev Sci Instrum; 2012 Jan; 83(1):013703. PubMed ID: 22299958 [TBL] [Abstract][Full Text] [Related]
3. High-speed atomic force microscope based on an astigmatic detection system. Liao HS; Chen YH; Ding RF; Huang HF; Wang WM; Hwu ET; Huang KY; Chang CS; Hwang IS Rev Sci Instrum; 2014 Oct; 85(10):103710. PubMed ID: 25362406 [TBL] [Abstract][Full Text] [Related]
4. Operation of astigmatic-detection atomic force microscopy in liquid environments. Liao HS; Huang KY; Hwang IS; Chang TJ; Hsiao WW; Lin HH; Hwu ET; Chang CS Rev Sci Instrum; 2013 Oct; 84(10):103709. PubMed ID: 24182121 [TBL] [Abstract][Full Text] [Related]
5. Low-voltage and high-performance buzzer-scanner based streamlined atomic force microscope system. Wang WM; Huang KY; Huang HF; Hwang IS; Hwu ET Nanotechnology; 2013 Nov; 24(45):455503. PubMed ID: 24141269 [TBL] [Abstract][Full Text] [Related]
6. Potential of interferometric cantilever detection and its application for SFM/AFM in liquids. Hoogenboom BW; Frederix PL; Fotiadis D; Hug HJ; Engel A Nanotechnology; 2008 Sep; 19(38):384019. PubMed ID: 21832578 [TBL] [Abstract][Full Text] [Related]
7. Exploiting cantilever curvature for noise reduction in atomic force microscopy. Labuda A; Grütter PH Rev Sci Instrum; 2011 Jan; 82(1):013704. PubMed ID: 21280834 [TBL] [Abstract][Full Text] [Related]
8. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties. Boudaoud M; Haddab Y; Le Gorrec Y; Lutz P Rev Sci Instrum; 2012 Jan; 83(1):013704. PubMed ID: 22299959 [TBL] [Abstract][Full Text] [Related]
9. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers. Adams JD; Nievergelt A; Erickson BW; Yang C; Dukic M; Fantner GE Rev Sci Instrum; 2014 Sep; 85(9):093702. PubMed ID: 25273731 [TBL] [Abstract][Full Text] [Related]
10. A new detection system for extremely small vertically mounted cantilevers. Antognozzi M; Ulcinas A; Picco L; Simpson SH; Heard PJ; Szczelkun MD; Brenner B; Miles MJ Nanotechnology; 2008 Sep; 19(38):384002. PubMed ID: 21832562 [TBL] [Abstract][Full Text] [Related]
11. Measurement of probe displacement to the thermal resolution limit in photonic force microscopy using a miniature quadrant photodetector. Pal SB; Haldar A; Roy B; Banerjee A Rev Sci Instrum; 2012 Feb; 83(2):023108. PubMed ID: 22380080 [TBL] [Abstract][Full Text] [Related]
15. Expanded beam deflection method for simultaneous measurement of displacement and vibrations of multiple microcantilevers. Nieradka K; Małozięć G; Kopiec D; Grabiec P; Janus P; Sierakowski A; Gotszalk T Rev Sci Instrum; 2011 Oct; 82(10):105112. PubMed ID: 22047334 [TBL] [Abstract][Full Text] [Related]
16. Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI. Cumpson PJ; Hedley J Nanotechnology; 2003 Dec; 14(12):1279-88. PubMed ID: 21444981 [TBL] [Abstract][Full Text] [Related]
17. Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties. Liao HS; Juang BJ; Chang WC; Lai WC; Huang KY; Chang CS Rev Sci Instrum; 2011 Nov; 82(11):113710. PubMed ID: 22128987 [TBL] [Abstract][Full Text] [Related]
18. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging. Dukic M; Adams JD; Fantner GE Sci Rep; 2015 Nov; 5():16393. PubMed ID: 26574164 [TBL] [Abstract][Full Text] [Related]
19. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers. Yeh MK; Tai NH; Chen BY Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729 [TBL] [Abstract][Full Text] [Related]
20. A versatile atomic force microscope for three-dimensional nanomanipulation and nanoassembly. Xie H; Haliyo DS; Régnier S Nanotechnology; 2009 May; 20(21):215301. PubMed ID: 19423927 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]