188 related articles for article (PubMed ID: 21730625)
1. Growth of one-dimensional Si/SiGe heterostructures by thermal CVD.
Mouchet C; Latu-Romain L; Cayron C; Rouviere E; Celle C; Simonato JP
Nanotechnology; 2008 Aug; 19(33):335603. PubMed ID: 21730625
[TBL] [Abstract][Full Text] [Related]
2. X-ray and electron microscopy of actinide materials.
Moore KT
Micron; 2010 Jun; 41(4):336-58. PubMed ID: 20071187
[TBL] [Abstract][Full Text] [Related]
3. A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy.
Walther T
J Microsc; 2006 Feb; 221(Pt 2):137-44. PubMed ID: 16499552
[TBL] [Abstract][Full Text] [Related]
4. Synthesis and microstructure of Cd4SiS6/Si composite nanowires.
Zhan J; Bando Y; Hu J; Golberg D
J Electron Microsc (Tokyo); 2005 Dec; 54(6):485-91. PubMed ID: 16556623
[TBL] [Abstract][Full Text] [Related]
5. Nanometer-scale, quantitative composition mappings of InGaN layers from a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy.
Pantzas K; Patriarche G; Troadec D; Gautier S; Moudakir T; Suresh S; Largeau L; Mauguin O; Voss PL; Ougazzaden A
Nanotechnology; 2012 Nov; 23(45):455707. PubMed ID: 23089619
[TBL] [Abstract][Full Text] [Related]
6. Characterization of highly luminescent LaPO4:Eu3+/LaPO4 one-dimensional core/shell heterostructures.
Bu W; Shi J
J Nanosci Nanotechnol; 2008 Mar; 8(3):1266-71. PubMed ID: 18468137
[TBL] [Abstract][Full Text] [Related]
7. High-angle annular dark-field imaging on a TEM/STEM system.
Otten MT
J Electron Microsc Tech; 1991 Feb; 17(2):221-30. PubMed ID: 2013823
[TBL] [Abstract][Full Text] [Related]
8. Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.
Watanabe K; Kikuchi Y; Yamazaki T; Asano E; Nakanishi N; Kotaka Y; Okunishi E; Hashimoto I
Acta Crystallogr A; 2004 Nov; 60(Pt 6):591-7. PubMed ID: 15507742
[TBL] [Abstract][Full Text] [Related]
9. Lateral Ge Diffusion During Oxidation of Si/SiGe Fins.
Brewer WM; Xin Y; Hatem C; Diercks D; Truong VQ; Jones KS
Nano Lett; 2017 Apr; 17(4):2159-2164. PubMed ID: 28249115
[TBL] [Abstract][Full Text] [Related]
10. Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications.
Kübel C; Voigt A; Schoenmakers R; Otten M; Su D; Lee TC; Carlsson A; Bradley J
Microsc Microanal; 2005 Oct; 11(5):378-400. PubMed ID: 17481320
[TBL] [Abstract][Full Text] [Related]
11. The impact of erbium incorporation on the structure and photophysics of silicon-germanium nanowires.
Wu J; Wieligor M; Zerda TW; Coffer JL
Nanoscale; 2010 Dec; 2(12):2657-67. PubMed ID: 20931125
[TBL] [Abstract][Full Text] [Related]
12. Rational design of Ag/TiO2 nanosystems by a combined RF-sputtering/sol-gel approach.
Armelao L; Barreca D; Bottaro G; Gasparotto A; Maccato C; Tondello E; Lebedev OI; Turner S; Van Tendeloo G; Sada C; Stangar UL
Chemphyschem; 2009 Dec; 10(18):3249-59. PubMed ID: 19882618
[TBL] [Abstract][Full Text] [Related]
13. Microscopic and spectroscopic characterization of Hg(II) immobilization by mackinawite (FeS).
Jeong HY; Sun K; Hayes KF
Environ Sci Technol; 2010 Oct; 44(19):7476-83. PubMed ID: 20825179
[TBL] [Abstract][Full Text] [Related]
14. Application of high-angle annular dark field scanning transmission electron microscopy, scanning transmission electron microscopy-energy dispersive X-ray spectrometry, and energy-filtered transmission electron microscopy to the characterization of nanoparticles in the environment.
Utsunomiya S; Ewing RC
Environ Sci Technol; 2003 Feb; 37(4):786-91. PubMed ID: 12636280
[TBL] [Abstract][Full Text] [Related]
15. Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale.
Gai PL; Yoshida K; Shute C; Jia X; Walsh M; Ward M; Dresselhaus MS; Weertman JR; Boyes ED
Microsc Res Tech; 2011 Jul; 74(7):664-70. PubMed ID: 20954265
[TBL] [Abstract][Full Text] [Related]
16. Stoichiometry of alloy nanoparticles from laser ablation of PtIr in acetone and their electrophoretic deposition on PtIr electrodes.
Jakobi J; Menéndez-Manjón A; Chakravadhanula VS; Kienle L; Wagener P; Barcikowski S
Nanotechnology; 2011 Apr; 22(14):145601. PubMed ID: 21346297
[TBL] [Abstract][Full Text] [Related]
17. Ge-rich SiGe-on-insulator for waveguide optical modulator application fabricated by Ge condensation and SiGe regrowth.
Kim Y; Yokoyama M; Taoka N; Takenaka M; Takagi S
Opt Express; 2013 Aug; 21(17):19615-23. PubMed ID: 24105508
[TBL] [Abstract][Full Text] [Related]
18. Structural and chemical characterization of Yb2O3-ZrO2 system by HAADF-STEM and HRTEM.
Angeles-Chavez C; Salas P; Díaz-Torres LA; de la Rosa E; Esparza R; Perez R
Microsc Microanal; 2009 Feb; 15(1):46-53. PubMed ID: 19144257
[TBL] [Abstract][Full Text] [Related]
19. Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination.
Pfaff M; Müller E; Klein MF; Colsmann A; Lemmer U; Krzyzanek V; Reichelt R; Gerthsen D
J Microsc; 2011 Jul; 243(1):31-9. PubMed ID: 21155995
[TBL] [Abstract][Full Text] [Related]
20. Preparation of novel saw-toothed and riblike alpha-Si3N4 whiskers.
Xu Y; Cao C; Chen Z; Li J; Wang F; Cai H
J Phys Chem B; 2006 Feb; 110(7):3088-92. PubMed ID: 16494313
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
