These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
130 related articles for article (PubMed ID: 21817578)
1. Shrunk lattice structure and interdiffusion characteristics of 5 nm thick Al(2)O(3) ultrathin films sputtered on silicon. Li JM Nanotechnology; 2008 Jan; 19(3):035604. PubMed ID: 21817578 [TBL] [Abstract][Full Text] [Related]
3. Determination of the absolute thickness of ultrathin Al2O3 overlayers on Si (100) substrate. Kim KJ; Jang JS; Lee JH; Jee YJ; Jun CS Anal Chem; 2009 Oct; 81(20):8519-22. PubMed ID: 19769374 [TBL] [Abstract][Full Text] [Related]
4. Nb Texture Evolution and Interdiffusion in Nb/Si-Layered Systems. Chandrasekaran A; van de Kruijs RWE; Sturm JM; Bijkerk F ACS Appl Mater Interfaces; 2021 Jul; 13(26):31260-31270. PubMed ID: 34165281 [TBL] [Abstract][Full Text] [Related]
5. Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates. Sriram S; Bhaskaran M; Mitchell DR; Short KT; Holland AS; Mitchell A Microsc Microanal; 2009 Feb; 15(1):30-5. PubMed ID: 19144255 [TBL] [Abstract][Full Text] [Related]
6. Atomic and electronic structure of ultrathin fluoride barrier layers at the oxide/Si interface. Pasquali L; Montecchi M; Nannarone S; Boscherini F J Phys Condens Matter; 2011 Sep; 23(35):355003. PubMed ID: 21785187 [TBL] [Abstract][Full Text] [Related]
7. Alucone interlayers to minimize stress caused by thermal expansion mismatch between Al₂O₃ films and Teflon substrates. Jen SH; George SM; McLean RS; Carcia PF ACS Appl Mater Interfaces; 2013 Feb; 5(3):1165-73. PubMed ID: 23272996 [TBL] [Abstract][Full Text] [Related]
8. Sr(5)Al(5+x)Si(21-x)N(35-x)O(2+x):Eu2+ (x approximately 0)--a novel green phosphor for white-light pcLEDs with disordered intergrowth structure. Oeckler O; Kechele JA; Koss H; Schmidt PJ; Schnick W Chemistry; 2009; 15(21):5311-9. PubMed ID: 19360826 [TBL] [Abstract][Full Text] [Related]
9. [Comparative study on photoluminescence from Ge/PS and Ge/SiO2 thin films]. Sun XJ; Ma SY; Wei JJ; Xu XL Guang Pu Xue Yu Guang Pu Fen Xi; 2008 Sep; 28(9):2033-7. PubMed ID: 19093555 [TBL] [Abstract][Full Text] [Related]
11. Microstructure and interfacial chemistry of pure and La-doped BiFeO₃ thin films. Basu J; Katoch R; Garg A; Barry Carter C Microsc Res Tech; 2013 Dec; 76(12):1304-9. PubMed ID: 24133020 [TBL] [Abstract][Full Text] [Related]
12. Microstructure of Mo/Si multilayers with B4C diffusion barrier layers. Nedelcu I; van de Kruijs RW; Yakshin AE; Bijkerk F Appl Opt; 2009 Jan; 48(2):155-60. PubMed ID: 19137023 [TBL] [Abstract][Full Text] [Related]
13. Surface characteristics and protein adsorption on combinatorial binary Ti-M (Cr, Al, Ni) and Al-M (Ta, Zr) library films. Bai Z; Filiaggi MJ; Sanderson RJ; Lohstreter LB; McArthur MA; Dahn JR J Biomed Mater Res A; 2010 Feb; 92(2):521-32. PubMed ID: 19235218 [TBL] [Abstract][Full Text] [Related]
14. Determination of the evolution of layer thickness errors and interfacial imperfections in ultrathin sputtered Cr/C multilayers using high-resolution transmission electron microscopy. Jiang H; Michette A; Pfauntsch S; Wang Z; Zhu J; Li D Opt Express; 2011 Jun; 19(12):11815-24. PubMed ID: 21716414 [TBL] [Abstract][Full Text] [Related]
15. Structural properties of lithium thio-germanate thin film electrolytes grown by radio frequency sputtering. Seo I; Martin SW Inorg Chem; 2011 Mar; 50(6):2143-50. PubMed ID: 21323361 [TBL] [Abstract][Full Text] [Related]
16. Control of moisture at buried polymer/alumina interfaces through substrate surface modification. Vogt BD; Prabhu VM; Soles CL; Satija SK; Lin EK; Wu WL Langmuir; 2005 Mar; 21(6):2460-4. PubMed ID: 15752040 [TBL] [Abstract][Full Text] [Related]
17. Thick BaTiO Posadas AB; Park H; Reynaud M; Cao W; Reynolds JD; Guo W; Jeyaselvan V; Beskin I; Mashanovich GZ; Warner JH; Demkov AA ACS Appl Mater Interfaces; 2021 Nov; 13(43):51230-51244. PubMed ID: 34669388 [TBL] [Abstract][Full Text] [Related]
18. Microstructural investigation of nickel silicide thin films and the silicide-silicon interface using transmission electron microscopy. Bhaskaran M; Sriram S; Mitchell DR; Short KT; Holland AS; Mitchell A Micron; 2009 Jan; 40(1):11-4. PubMed ID: 18337112 [TBL] [Abstract][Full Text] [Related]
19. Electron energy-loss spectroscopy study of thin film hafnium aluminates for novel gate dielectrics. Stemmer S; Chen ZQ; Zhu WJ; Ma TP J Microsc; 2003 Apr; 210(Pt 1):74-9. PubMed ID: 12694419 [TBL] [Abstract][Full Text] [Related]
20. Structural evolution of nanocrystalline silicon thin films synthesized in high-density, low-temperature reactive plasmas. Cheng Q; Xu S; Ostrikov KK Nanotechnology; 2009 May; 20(21):215606. PubMed ID: 19423937 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]